Advanced Materials

Cover image for Vol. 28 Issue 32

21_29/2009Silicon Pillars: Ultrahigh-Crystalline-Quality Silicon Pillars Formed by Millimeter-Wave Annealing of Amorphous Silicon on Glass (Adv. Mater. 29/2009)

Unique, three-dimensional structures—silicon pillars—are formed by millisecond long, single-pulse annealing of 110-GHz millimeter-wave radiation incident upon intrinsic amorphous silicon (a-Si) thin films deposited on glass by hot-wire chemical vapor deposition (HWCVD), as demonstrated by Fude Liu and co-workers on p. 3002. The cover shows a field-emission secondary-electron microscopy (FE-SEM) image of silicon pillars taken at a sample tilt angle of 52°.

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