22_26-27b/20103D Atomic Force Microscopy: Three-Dimensional Atomic Force Microscopy – Taking Surface Imaging to the Next Level (Adv. Mater. 26–27/2010)

Recent progress in scanning probe technology, which has led to the establishment of threedimensional atomic force microscopy, is reported on p. 2838 by Mehmet Baykara and co-workers. From the quantitative data on surface force and energy fields the method delivers, lateral force maps with picometer resolution can be generated. All cover and frontispiece artwork by Wendolyn Hill.

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