Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Peter Gregory, Deputy Editors: Martin Ottmar, Carolina Novo da Silva, Lorna Stimson
Online ISSN: 1521-4095
Associated Title(s): Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Optical Materials, Particle & Particle Systems Characterization, Small
3D Atomic Force Microscopy: Three-Dimensional Atomic Force Microscopy – Taking Surface Imaging to the Next Level (Adv. Mater. 26–27/2010)
Recent progress in scanning probe technology, which has led to the establishment of threedimensional atomic force microscopy, is reported on p. 2838 by Mehmet Baykara and co-workers. From the quantitative data on surface force and energy fields the method delivers, lateral force maps with picometer resolution can be generated. All cover and frontispiece artwork by Wendolyn Hill.