© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Peter Gregory, Deputy Editors: Mary Farrell, Duoduo Liang, Lorna Stimson
Online ISSN: 1521-4095
Associated Title(s): Advanced Electronic Materials, Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Optical Materials, Advanced Science, Particle & Particle Systems Characterization, Small
Writing Nanostructures: Scanning Probe Direct-Write of Germanium Nanostructures (Adv. Mater. 41/2010)
The cover image depicts the direct writing of a germanium nanostructure with the tip of an atomic force microscope (AFM). Germanium writing occurs when the AFM tip traces the desired shape along a biased silicon sample while immersed in an organometallic precursor (diphenylgermane). The high-electric field and the electrons emitted from the tip cause the precursor to locally react and yield germanium nanostructures. This innovative AFM strategy creates sub-30 nm carbon-free germanium nanostructures with desired geometries and placement, as reported on p. 4639 by Marco Rolandi and co-workers.