© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Peter Gregory, Deputy Editors: Mary De Vita, Duoduo Liang, Lorna Stimson
Online ISSN: 1521-4095
Associated Title(s): Advanced Electronic Materials, Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Materials Technologies, Advanced Optical Materials, Advanced Science, Laser & Photonics Reviews, Particle & Particle Systems Characterization, Small
Nanomaterials in Focus: (Adv. Mater. 22–23/2011)
The FEI Titan3 80–300, a world-class transmission electron microscope (TEM) purchased by the Cluster of Excellence “Engineering of Advanced Materials” (EAM) at the University of Erlangen-Nuremberg, offers significant advantages for the analysis of materials at the atomic scale. The inside cover shows a high-resolution TEM image of a tin-doped indium oxide nanoparticle, a fundamental building block of transparent electrodes in printable electronic devices being developed at EAM. Due to its aberration-corrected electron optics and suite of analytical tools the Titan3 microscope can reveal, in unprecedented clarity, the internal atomic structure of such nanoparticles, as well as structural and compositional details of particle surfaces, coatings and contact points, key issues in several EAM projects. Image: Erdmann Spiecker/Gerd Beck.