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Editor-in-Chief: Peter Gregory, Deputy Editors: Mary De Vita, Duoduo Liang, Lorna Stimson
Online ISSN: 1521-4095
Associated Title(s): Advanced Electronic Materials, Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Materials Technologies, Advanced Optical Materials, Advanced Science, Laser & Photonics Reviews, Particle & Particle Systems Characterization, Small
Organic Semiconductors: Dry Lithography of Large-Area, Thin-Film Organic Semiconductors Using Frozen CO2 Resists (Adv. Mater. 46/2012)
Frozen carbon dioxide can be used as a phase-change resist to perform dry lithography of organic thin films, as shown by Matthias E. Bahlke and co-workers on page 6136. The resist sublimes closest to the surface, separating the still-solid resist that in turn lifts off undesired organic material. This new technique will help address the incompatibility of organic semiconductors with traditional photolithography.