Advanced Materials

Cover image for Vol. 26 Issue 36

Editor-in-Chief: Peter Gregory, Deputy Editors: Martin Ottmar, Carolina Novo da Silva, Lorna Stimson

Online ISSN: 1521-4095

Associated Title(s): Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Optical Materials, Particle & Particle Systems Characterization, Small

July 25, 2002

Self-assembled copper nanowire networks...

on layered-crystal surfaces are reported. Obtained from a simple thermal evaporation process in ultra high vacuum, they possess high mechanical strength and a significant elevation over a usually step-edge free surface. These features render Cu-induced nanowire networks particularly accessible to various techniques of microcharacterization such as AFM. (R. Adelung et al., August 5, Adv. Mater. 2002, 14, 1056-1061)

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