Advanced Materials

Cover image for Vol. 26 Issue 36

Editor-in-Chief: Peter Gregory, Deputy Editors: Martin Ottmar, Carolina Novo da Silva, Lorna Stimson

Online ISSN: 1521-4095

Associated Title(s): Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Optical Materials, Particle & Particle Systems Characterization, Small

January 20, 2002

More Anisotropy of LED thin films.....

Structural information about the degree of chain alignment in thin polymer films can be obtained by ellipsometry. A combination of reflection and transmission ellipsometry has been employed to determine the ordinary and extraordinary optical constants in conjugated polymer films in both the absorbing and transparent regions. Optical constants obtained by this technique will allow accurate modeling of the optical structure of polymer light-emitting diodes (LEDs) and photodiodes (see: N.C. Greenham et al., Adv. Mater. 2002, 14, 212 - 215, in the Feb. 5 issue).

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