Complementary High Spatial Resolution Methods in Materials Science and Engineering
Oskar Paris, David Lang, Jiehua Li, Peter Schumacher, Marco Deluca, Rostislav Daniel, Michael Tkadletz, Nina Schalk, Christian Mitterer, Juraj Todt, Jozef Keckes, Zaoli Zhang, Gerhard Fritz-Popovski, Christian Ganser, Christian Teichert and Helmut Clemens
Version of Record online: 31 JAN 2017 | DOI: 10.1002/adem.201600671
The potential of modern high spatial resolution methods in materials science and engineering is demonstrated. Scientific examples include characterization of precipitates in multiphase alloys, as well as determination of stresses in coatings and mesoporous thin films, underlining the importance of modern electron microscopy techniques and of scattering/diffraction at large scale facilities. Moreover, atom probe tomography, Raman scattering and atomic force microscopy are also highlighted.