Advanced Engineering Materials
© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Issue 5/2004 Cover
The cover shows three secondary electron scanning electron microscope (SE-SEM) images of a HfB2-SiC composite for ultra high temperature applications. More about the microstructure and properties of this new material can be found in the article by F. Monteverde and A. Bellosi on page 331.