physica status solidi (c)

Cover image for Vol. 14 Issue 12

Editor: Stefan Hildebrandt (Editor-in-Chief)

Online ISSN: 1610-1642

Associated Title(s): physica status solidi (a), physica status solidi (b), physica status solidi (RRL) - Rapid Research Letters

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  • Current Issue:December 2017

    Volume 14, Issue 12

    Special Issue: E-MRS 2017 Spring Meeting – Symposi...

  • November 2017

    Volume 14, Issue 11

  • October 2017

    Volume 14, Issue 10

    Special Issue: E-MRS 2017 Spring Meeting – Symposi...

  • September 2017

    Volume 14, Issue 9

  • August 2017

    Volume 14, Issue 8

    Special Issue: 9th International Workshop on Nitri...

Editorial Notice

physica status solidi (c) – current topics in solid state physics has ceased publication at the end of 2017.
New manuscript submissions should be made to pss (a), pss (b) or pss (RRL).
Conference/symposium organizers, coordinators of research consortia or interested guest editors are invited to contact for possible special issue collaboration.

Recently Published Articles

  1. Revisiting Stabilities of Cubic Zincblende IV-IV Materials From Density Functional Theory

    N. Hammou, A. Zaoui and M. Ferhat

    Version of Record online: 28 DEC 2017 | DOI: 10.1002/pssc.201700226

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    The electronic structure of cubic zincblende (ZB) IV-IV compounds are treated traditionally through first-principles models neglecting relativistic effects, regardless the presence of heavier atoms like Ge, Sn, or Pb. Applying relativistic first-principles plane wave pseudopotential methods, we revisit here the thermodynamic and dynamical stability of ZB-IV-IV materials: SiC, GeC, SnC, PbC, SiGe, SiSn, SiPb, GeSn, PbGe, and PbSn. Our results evince that except 3C-SiC, all other IV-IV compounds in the ZB phase exhibit positive formation enthalpy, thus manifesting thermodynamic instability. PbC, and SnC divulge huge thermodynamic instability, due to the high value of their elastic strain formation energy; whereas SiGe, GeSn, and PbSn show weak thermodynamic instability due to their insufficient chemical formation energy. Furthermore, except 3C-SiC, we found that all other ZB-IV-IV compounds are dynamically unstable.

  2. Tuning the Work Function of Si(100) Surface by Halogen Absorption: A DFT Study

    Matteo Bertocchi, Michele Amato, Ivan Marri and Stefano Ossicini

    Version of Record online: 12 DEC 2017 | DOI: 10.1002/pssc.201700193

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    A Si(100) surface supercell passivated by H and F atoms. Light blue spheres represent Si atoms, grey spheres H atoms and green spheres F atoms.

  3. Ellipsometric and X-Ray Spectrometric Investigation of Fibrinogen Protein Layers

    Benjamin Kalas, Beatrix Pollakowski, Andreas Nutsch, Cornelia Streeck, Judit Nador, Miklós Fried, Burkhard Beckhoff and Péter Petrik

    Version of Record online: 6 DEC 2017 | DOI: 10.1002/pssc.201700210

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    Spectroscopic ellipsometry (SE) and X-ray fluorescence (XRF) are used to measure protein monolayers on gold and amorphous carbon substrates. The amount of protein on the surface is quantified in terms of mass per unit area using de Feijter's method and a reference-free approach for SE and XRF, respectively. A good agreement is found, pointing out the importance of the lateral homogeneity and temporal stability.

  4. The Nitrogen Acceptor in 2H-Polytype Synthetic MoS2: Frequency and Temperature Dependent ESR Analysis

    Ben Schoenaers, Andre Stesmans and Valery V. Afanas'ev

    Version of Record online: 1 DEC 2017 | DOI: 10.1002/pssc.201700211

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    In extending on the recent electron spin resonance identification of the N acceptor in synthetic 2H-MoS2 (N substituting for S), the N signal has been extensively examined in terms of its frequency, temperature, and field angular dependent spectral characteristics. A detailed study of the N acceptor signal intensity versus temperature reveals an activation energy Ea ≈ 50 meV, exposing N as an appropriate p-type dopant for MoS2.

  5. Use of Rayleigh-Rice Theory for Analysis of Ellipsometry Data on Rough CIGS Films

    Søren A. Jensen, Dana Maria Rosu, Andreas Hertwig and Poul-Erik Hansen

    Version of Record online: 24 NOV 2017 | DOI: 10.1002/pssc.201700217

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    Ellipsometric measurements of photovoltaic CIGS thin films with significant surface roughness are interpreted using the analytical Rayleigh-Rice model. Roughness parameters are extracted and compared to reference measurements performed with confocal microscopy and AFM. This presents an alternative to commonly used effective-medium calculations for the analysis of ellipsometry data from rough surfaces.