physica status solidi (c)
Copyright © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor: Stefan Hildebrandt (Editor-in-Chief)
Online ISSN: 1610-1642
Proceedings of the 5th International Conference on Optics of Surfaces and Interfaces (OSI-V)
The 5th International Conference on Optics of Surfaces and Interfaces (OSI-V), held in León, Mexico, 26–30 May 2003, brought together researchers and students from universities and institutes who work in different fields of optical spectroscopy. Its goal was the understanding of the potential of the different optical techniques with respect to interface analysis, their present status and their possible limits. Interfaces formed by well understood semiconductors and metals on one side were in the focus of the meeting. Thin layers, rough surfaces, low dimensional structures formed by self-organization through interaction with the substrate, as well as organic and ferromagnetic layers and others structures were of interest as the other interface partner. The scope of the meeting was to bridge the gap between basic and applied science. Apart from recent advances in theoretical modeling and experimental research, special attention was also paid to novel techniques of optical spectroscopy at interfaces.