Advanced Functional Materials
Copyright © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Joern Ritterbusch, Deputy Editors: Mary Farrell, Yan Li
Online ISSN: 1616-3028
Associated Title(s): Advanced Energy Materials, Advanced Engineering Materials, Advanced Healthcare Materials, Advanced Materials, Advanced Materials Interfaces, Advanced Optical Materials, Particle & Particle Systems Characterization, Small
Noninvasive Semiconductor Field Imaging: Imaging the Electric-Field Distribution in Organic Devices by Confocal Electroreflectance Microscopy (Adv. Funct. Mater. 8/2009)
Noninvasive methods for diagnosis of organic devices are based on optical probes. At Politecnico di Milano, M. Celebrano et al. have developed a new method to optically map the electric field inside organic planar devices, as described on page 1180. Their technique involves the combination of electroreflectance spectroscopy with confocal microscopy to achieve high spatial resolution. The cover image shows an artistic impression of the optical probing of a CuPcF16-based device.