Advanced Functional Materials

Cover image for Vol. 24 Issue 44

22_21i/2012Surface Characterization: Non-Invasive High-Throughput Metrology of Functionalized Graphene Sheets (Adv. Funct. Mater. 21/2012)

On page 4519, Mihrimah Ozkan, Cengiz S. Ozkan, and co-workers report a new fluorescence quenching microscopy metrology technique that allows the identification of graphene layers and doped/undoped regions across a large graphene landscape by utilizing the fact that undoped regions of graphene quench fluorescence more than the doped regions through resonant energy transfer. Contrast differences in fluorescence across the graphene sheet reveal the complex ring-patterned doping. This metrology technique is well-suited for industrial, large-scale, pristine, and modified graphene sheet surface characterization.

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