Advanced Functional Materials
© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Joern Ritterbusch, Deputy Editors: Mary De Vita, Yan Li
Online ISSN: 1616-3028
Associated Title(s): Advanced Electronic Materials, Advanced Energy Materials, Advanced Engineering Materials, Advanced Healthcare Materials, Advanced Materials, Advanced Materials Interfaces, Advanced Materials Technologies, Advanced Optical Materials, Advanced Science, Particle & Particle Systems Characterization, Small
Surface Characterization: Non-Invasive High-Throughput Metrology of Functionalized Graphene Sheets (Adv. Funct. Mater. 21/2012)
On page 4519, Mihrimah Ozkan, Cengiz S. Ozkan, and co-workers report a new fluorescence quenching microscopy metrology technique that allows the identification of graphene layers and doped/undoped regions across a large graphene landscape by utilizing the fact that undoped regions of graphene quench fluorescence more than the doped regions through resonant energy transfer. Contrast differences in fluorescence across the graphene sheet reveal the complex ring-patterned doping. This metrology technique is well-suited for industrial, large-scale, pristine, and modified graphene sheet surface characterization.