physica status solidi (a)
© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor: Stefan Hildebrandt (Editor-in-Chief), Sabine Bahrs (Deputy Editor)
Online ISSN: 1862-6319
In-situ optical characterisation of porous alumina
In Ref.  the authors present a new method to characterize in-situ the optical thickness of porous alumina films by the use of photoluminescence(PL)-induced Fabry–Pérot interferences.
The cover picture is a scanning electron microscopy image of perpendicular pores in alumina after anodization with sulfuric acid, superimposed by a schematic PL with the interference pattern to be analyzed.