© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor: Michael Rowan; Editorial Board Chairs: Uwe Bornscheuer, Luis A. Oro, Bert Weckhuysen
Impact Factor: 4.556
ISI Journal Citation Reports © Ranking: 2014: 31/139 (Chemistry Physical)
Online ISSN: 1867-3899
Inside Cover: Exploitation of Surface-Sensitive Electrons in Scanning Electron Microscopy Reveals the Formation Mechanism of New Cubic and Truncated Octahedral CeO2 Nanoparticles (ChemCatChem 6/2011)
The inside cover picture shows a range of scanning electron microscopy (SEM) images of CeO2 nanoparticles. In their Full Paper on p. 1038 ff., S. Takami et al. describe how the development of new analytical tools for nanostructures, directly contributes to the study of catalysts. By using SEM with a newly designed signal enhancer, they studied cubic and truncated octahedral cerium oxide (CeO2) nanoparticles and go on to discuss the formation mechanism of the nanoparticles.