Copyright © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor: Michael Rowan; Editorial Board Chairs: Uwe Bornscheuer, Luis A. Oro, Bert Weckhuysen
Impact Factor: 5.044
ISI Journal Citation Reports © Ranking: 2013: 26/136 (Chemistry Physical)
Online ISSN: 1867-3899
Cover Picture: Optimum Energy-Dispersive X-Ray Spectroscopy Elemental Mapping for Advanced Catalytic Materials (ChemCatChem 9/2013)
Cartography for the catalysis researcher The cover picture shows that the observation of individual elements in advanced catalytic materials can be achieved by determining optimum conditions for obtaining an accurate STEM-EDX elemental map. In their Communication on p. 2586 ff., D. S. Su et al. reveal that a suitable combination of dwell time and beam intensity is crucial in pinpointing elemental distribution by using STEM-EDX mapping. Importantly, trace amounts of catalytic species can be observed towards the analytical limit to determine information, such as elemental composition, size, and morphology, as well as, in particular, the possible dynamic changes in nanoparticles after catalytic reactions.