Scanning

Copyright © 2012 Wiley Periodicals, Inc.

Cover image for Vol. 33 Issue 6

Editor-in-Chief: Professor Brandon L. Weeks

Online ISSN: 1932-8745

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Meeting of Interest

Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

23-27 April 2012
Baltimore Convention Center
Baltimore, Maryland, United States

The SPIE/SCANNING 2012 meeting brings microscopists from all aspects of scanning microscopies (from scanned optics and probes to scanned particle beams) together in a single forum to discuss current research and new advancements in the field. Previous SCANNING meetings have had a large forensics following which is strongly supportive of both defense and homeland security. Scanned microscopies are also key investigative and research tools in micro and nanotechnology.

Click here for more information on this meeting.

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