Journal of Microscopy

Cover image for Vol. 250 Issue 3

Edited By: Tony Wilson

Impact Factor: 1.631

ISI Journal Citation Reports © Ranking: 2011: 5/10 (Microscopy)

Online ISSN: 1365-2818

Featured

  • SEM Image

    SEM Image

    SEM image of the FIB-SEM setup.

  • Shine through artefact in side view

    Shine through artefact in side view

    Shine through artefact in side view, showing raw data on the left and the matrix (red) and artefact (blue) marked on the right.

  • Flowchart

    Flowchart

    Flowchart of the segmentation workflow.

  • Simulated data set

    Simulated data set

    Simulated data set after preprocessing: slice view (left) and cross-section view (right).

  • Segmentation procedure

    Segmentation procedure

    Feature images of the segmentation procedure as overlays on the original data set: (a) FGV; (b) FArt; (c) thresholding of the morphological gradient FGrad; (d) Fmin(2); (e) Fseg; (f) FLabel, with void markers FVoid in blue and matrix markers FMatrix in red; (g) segmentation result and (h) ground truth of the simulation.

  • Misclassification rate of segmentation parameters

    Misclassification rate of segmentation parameters

    Misclassification rate with respect to variation of the segmentation parameters from the chosen values.

  • Error analysis of segmentation result

    Error analysis of segmentation result

    Error analysis as overlay on the simulated data: (a) segmentation result; (b) total misclassified pixels; (c) false positives (red) and false negatives (blue) and (d) ground truth.

  • Porosity of the segmentation

    Porosity of the segmentation

    Porosity of the segmentation with variation of the segmentation parameters.

  • SEM Image
  • Shine through artefact in side view
  • Flowchart
  • Simulated data set
  • Segmentation procedure
  • Misclassification rate of segmentation parameters
  • Error analysis of segmentation result
  • Porosity of the segmentation

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    Article first published online: 23 MAY 2013 | DOI: 10.1111/jmi.12054

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    Article first published online: 20 MAY 2013 | DOI: 10.1111/jmi.12051

  5. Very low energy electron microscopy of graphene flakes

    E. MIKMEKOVÁ, H. BOUYANFIF, M. LEJEUNE, I. MÜLLEROVÁ, M. HOVORKA, M. UNČOVSKÝ and L. FRANK

    Article first published online: 20 MAY 2013 | DOI: 10.1111/jmi.12049

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Fully digitized backfile 1841-1995 now available!

Together with this historic archive, you can now access online all content published within the Journal of Microscopy since its 1841 launch - 170 years of quality research information from the Royal Microscopical Society, a society at the forefront of microscopy and imaging.

Recommend to your librarian or contact the Wiley Online sales team for details of the archive.

Highly Cited Papers

Journal of Microscopy

Read JMI's recent highly cited papers:

Transmission electron microscopy with a liquid flow cell  

K.L. Klein, I.M. Anderson and N. De Jonge

Evolution of tip shape during field evaporation of complex multilayer structures 

E. A. Marquis, B. P. Geiser, T. J. Prosa and D. J.Larso

Optimizing multiphoton fluorescence microscopy light collection from living tissue by noncontact total emission detection (epiTED) 

C.A. Combs, A. Smirnov, D. Chess, D.B. Mcgavern, J.L. Schroeder, J. Riley, S.S. Kang, M. Lugar-Hammer, A. Gandjbakhche, J.R. Knutson, and R.S. Balaban

For more click here....

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Read the Latest Invited Review Papers

Journal of Microscopy

Cryo-EM, the first thirty years

Thirty years ago, in December 1981, the Journal of Microscopy published a very short paper entitled ‘Vitrification of pure water for electron microscopy’.

It turned out to be important for the development of cryo-electron microscopy and it contributed to reverse, from foe to friend, the status of water in electron microscopists’ minds. This change has brought obvious gains. The future will tell how many more are still to come…

Resolution and optical sectioning in the confocal microscope

Wilson, T.

A simple introduction to multiphoton microscopy

Ustione, A. Piston, D.W

All of the Invited Reviews from 2011 can be accessed here or by clicking on the VIrtual Issue: Invited Reviews 2011 tab on the left of this page.

Hot topic - Fast track short communications - 2012 articles published

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