Journal of Microscopy

Special Issue: EM 2008 - XIII International Conference on Electron Microscopy, Vol 237 Issue 3.

Featuring this key paper with free access:

Advantages of aberration correction for HRTEM investigation of complex layer compounds. by E.Spiecker

Don't miss these leading Invited Review Papers, with FREE ACCESS!

Resolution and optical sectioning in the confocul microscope

A simple introduction to multiphoton microscopy

Quantitative micro_CT

Highlights of the optical highlighter fluorescent proteins

Cryo-electron tomography: methodology, developments and biological applications

Together with this historic archive, you can now access online all content published within the Journal of Microscopy since its 1841 launch - 170 years of quality research information from the Royal Microscopical Society, a society at the forefront of microscopy and imaging.

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Read JMI's recent highly cited papers:

Real-time computation of subdiffraction-resolution fluorescence images

A review of high-pressure freezing preparation techniques for correlative light and electron microscopy of the same cells and tissues

Tomography of insulating biological and geological materials using focused ion beam (FIB) sectionning and low-kV BSE imaging

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