Journal of Applied Crystallography

Cover image for Vol. 48 Issue 1

Edited By: Please see editorial board information

Impact Factor: 3.95

ISI Journal Citation Reports © Ranking: 2013: 3/23 (Crystallography)

Online ISSN: 1600-5767

Most Cited


WinGX and ORTEP for Windows: an update
Farrugia, Louis J., August 2012

New developments in the ATSAS program package for small-angle scattering data analysis
Petoukhov, Maxim V.; Franke, Daniel; Shkumatov, Alexander V.; et al., April 2012

SIR2011: a new package for crystal structure determination and refinement
Burla, Maria Cristina; Caliandro, Rocco; Camalli, Mercedes; et al., April 2012

Nika: software for two-dimensional data reduction
Ilavsky, Jan, April 2012

CrystFEL: a software suite for snapshot serial crystallography
White, Thomas A.; Kirian, Richard A.; Martin, Andrew V.; et al., April 2012

Instrumental setup for high-throughput small- and wide-angle solution scattering at the X33 beamline of EMBL Hamburg
Blanchet, Clement E.; Zozulya, Alexey V.; Kikhney, Alexey G.; et al., June 2012

PDFgetX3: a rapid and highly automatable program for processing powder diffraction data into total scattering pair distribution functions
Juhas, P.; Davis, T.; Farrow, C. L.; et al., April 2013

PASCal: a principal axis strain calculator for thermal expansion and compressibility determination
Cliffe, Matthew J.; Goodwin, Andrew L., December 2012

XDSAPP: a graphical user interface for the convenient processing of diffraction data using XDS
Krug, Michael; Weiss, Manfred S.; Heinemann, Udo; et al., June 2012

MossA: a program for analyzing energy-domain Mossbauer spectra from conventional and synchrotron sources
Prescher, Clemens; McCammon, Catherine; Dubrovinsky, Leonid, April 2012

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