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KGaA, Weinheim</dc:rights><prism:issn xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">1862-6351</prism:issn><prism:eIssn xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">1610-1642</prism:eIssn><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-01T00:00:00-05:00</dc:date><prism:coverDisplayDate xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">May 2013</prism:coverDisplayDate><prism:volume xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10</prism:volume><prism:number xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">5</prism:number><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">713</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">888</prism:endingPage><image rdf:resource="http://onlinelibrary.wiley.com/store/10.1002/pssc.v10.5/asset/cover.gif?v=1&amp;s=722bdcd5b3df7b1a7847718c489e70d053b6f053"/><items><rdf:Seq><rdf:li 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rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200748"/></rdf:Seq></items></channel><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200766" xmlns="http://purl.org/rss/1.0/"><title>Cu(In,Ga)Se2 thin film solar cells prepared by selenization with van Doorn apparatus</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200766</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Cu(In,Ga)Se2 thin film solar cells prepared by selenization with van Doorn apparatus</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">S. Nakamura, T. Isihara, S. Takakura, Y. Oka, K. Kawamoto, N. Tanaka, T. Yamaguchi, S. Kunitsugu</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-22T03:11:15.371845-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200766</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200766</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200766</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu(In,Ga)Se<sub>2</sub> (CIGS) thin films were prepared by selenization of metal precursors using van Doorn apparatus. The apparatus provides advantages such as superior Se pressure controllability and simplicity. XRD measurements revealed that the selenized films had a chalcopyrite structure. EDX measurements revealed that the Ga ratios decreased with increasing selenization temperature, while Se ratio increased. SEM measurements revealed that the films had relatively large grains and roughness. <em>V<sub>oc</sub>=</em> 495 V, <em>I<sub>sc</sub>=</em> 2.9 mA/cm<sup>2</sup> and F.F.=0.24 were obtained. EQE spectrum indicated a small diffusion length of minority carriers for longer wavelength region. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu(In,Ga)Se2 (CIGS) thin films were prepared by selenization of metal precursors using van Doorn apparatus. The apparatus provides advantages such as superior Se pressure controllability and simplicity. XRD measurements revealed that the selenized films had a chalcopyrite structure. EDX measurements revealed that the Ga ratios decreased with increasing selenization temperature, while Se ratio increased. SEM measurements revealed that the films had relatively large grains and roughness. Voc= 495 V, Isc= 2.9 mA/cm2 and F.F.=0.24 were obtained. EQE spectrum indicated a small diffusion length of minority carriers for longer wavelength region. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200793" xmlns="http://purl.org/rss/1.0/"><title>Sintering without grain growth for Mg2Si thermoelectric devices</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200793</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Sintering without grain growth for Mg2Si thermoelectric devices</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Shigeyuki Nakamura, Yoshihisa Mori, Ken'ichi Takarabe</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-22T03:11:13.819103-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200793</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200793</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200793</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Mg<sub>2</sub>Si is expected as a candidate for environmental-friendly material of a thermoelectric device. Nano-crystallization is considered to be one of the most effective approaches to improve thermoelectric property. If grain grows up during sintering, we are afraid not to obtain nano-effect. We have, therefore, investigated grain growth during sintering. We have found that grain growth is not observed if particle size distribution of starting powder is relatively uniform. On the contrary, grain growth is observed if it is relatively not uniform. We have concluded this may be due to un-uniformly distributed current during sintering. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Mg2Si is expected as a candidate for environmental-friendly material of a thermoelectric device. Nano-crystallization is considered to be one of the most effective approaches to improve thermoelectric property. If grain grows up during sintering, we are afraid not to obtain nano-effect. We have, therefore, investigated grain growth during sintering. We have found that grain growth is not observed if particle size distribution of starting powder is relatively uniform. On the contrary, grain growth is observed if it is relatively not uniform. We have concluded this may be due to un-uniformly distributed current during sintering. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200802" xmlns="http://purl.org/rss/1.0/"><title>Buffer-less Cu(In,Ga)Se2 solar cells with Zn(O,S):Al transparent conductive oxide film</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200802</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Buffer-less Cu(In,Ga)Se2 solar cells with Zn(O,S):Al transparent conductive oxide film</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Jasmeen Julayhi, Takashi Minemoto</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-22T03:11:12.333489-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200802</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200802</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200802</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Transparent conductive oxide Zn(O,S):Al (AZOS) films with S/(S+O) 0.00 to 0.25 were fabricated by co-sputtering of ZnO:Al and ZnS targets. All films showed high transparency of over 80% with edge shift at short wavelength which showed band gap changed as S/(S+O) increased. However, sheet resistance increased with increased S/(S+O), with over 10<sup>4</sup> Ω/sq at S/(S+O) of 0.25. These films were used in the fabrication of buffer-less Cu(In,Ga)Se<sub>2</sub> solar cells with cell structure of Al/NiCr/AZOS/CIGS/Mo/SLG. The cell performance increased with S/(S+O), with highest efficiency of 9.05% at S/(S+O) 0.09. However, at higher S/(S+O) cell performance dropped and at 0.25 no cell performance was recorded which was due to the high sheet resistance. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Transparent conductive oxide Zn(O,S):Al (AZOS) films with S/(S+O) 0.00 to 0.25 were fabricated by co-sputtering of ZnO:Al and ZnS targets. All films showed high transparency of over 80% with edge shift at short wavelength which showed band gap changed as S/(S+O) increased. However, sheet resistance increased with increased S/(S+O), with over 104 Ω/sq at S/(S+O) of 0.25. These films were used in the fabrication of buffer-less Cu(In,Ga)Se2 solar cells with cell structure of Al/NiCr/AZOS/CIGS/Mo/SLG. The cell performance increased with S/(S+O), with highest efficiency of 9.05% at S/(S+O) 0.09. However, at higher S/(S+O) cell performance dropped and at 0.25 no cell performance was recorded which was due to the high sheet resistance. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200825" xmlns="http://purl.org/rss/1.0/"><title>Comparative study of Auger-free luminescence of Rb2ZnCl4 crystals between experiment and calculation</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200825</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Comparative study of Auger-free luminescence of Rb2ZnCl4 crystals between experiment and calculation</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Mamoru Kitaura, Shinta Watanabe, Kazuyoshi Ogasarawa, Akimasa Ohnishi, Minoru Sasaki</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-22T03:11:10.867752-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200825</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200825</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200825</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>In this paper, we report a new type Auger-free luminescence (AFL) of Rb<sub>2</sub>ZnCl<sub>4</sub> crystals. Until now AFL has been reported in alkali and alkali-earth halides. This luminescence originates from electon transitions from the valence band of halogen p orbitals to the top of outermost core levels of alkali or alkali-earth p orbitals (p-p transitions). On the other hand, the AFL of Rb<sub>2</sub>ZnCl<sub>4</sub> is expected to be of p-d type, in which the electronic transitions from Cl 3p orbitals are terminated by outermost Zn 3d core levels. The electronic states concerning are apparently different from those of alkali and alkali-earth halides. The finding of such a peculiar AFL is achieved by comparison between results of spectroscopy experiment and cluster calculation. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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In this paper, we report a new type Auger-free luminescence (AFL) of Rb2ZnCl4 crystals. Until now AFL has been reported in alkali and alkali-earth halides. This luminescence originates from electon transitions from the valence band of halogen p orbitals to the top of outermost core levels of alkali or alkali-earth p orbitals (p-p transitions). On the other hand, the AFL of Rb2ZnCl4 is expected to be of p-d type, in which the electronic transitions from Cl 3p orbitals are terminated by outermost Zn 3d core levels. The electronic states concerning are apparently different from those of alkali and alkali-earth halides. The finding of such a peculiar AFL is achieved by comparison between results of spectroscopy experiment and cluster calculation. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300018" xmlns="http://purl.org/rss/1.0/"><title>Thermo-optical constants of sesquioxide laser ceramics Yb3+:Ln2O3 (Ln=Y,Lu,Sc)</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300018</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Thermo-optical constants of sesquioxide laser ceramics Yb3+:Ln2O3 (Ln=Y,Lu,Sc)</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">I. L. Snetkov, D. E. Silin, O. V. Palashov, E. A. Khazanov, H. Yagi, T. Yanagitani, H. Yoneda, A. Shirakawa, K. Ueda, A. A. Kaminskii</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-22T03:11:09.341994-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300018</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300018</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300018</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Parasitic thermal effects (thermal depolarization and thermal lens) of three Konoshima Chemical Co. laser-ceramics samples Yb<sup>3+</sup>:Lu<sub>2</sub>O<sub>3</sub>(C<sub>Yb</sub>≈1.8%), Yb<sup>3+</sup>:Y<sub>2</sub>O<sub>3</sub>(C<sub>Yb</sub>≈1.8%), and Yb<sup>3+</sup>:Sc<sub>2</sub>O<sub>3</sub>(C<sub>Yb</sub>≈2.5%) were measured in experiment at different pump power. The obtained results were used to calculate a number of thermo-optical constants, which showed that sesquioxide ceramics are significantly superior to the widely used yttrium aluminum garnet Yb<sup>3+</sup>: Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>(C<sub>Yb</sub>≈10%). (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Parasitic thermal effects (thermal depolarization and thermal lens) of three Konoshima Chemical Co. laser-ceramics samples Yb3+:Lu2O3(CYb≈1.8%), Yb3+:Y2O3(CYb≈1.8%), and Yb3+:Sc2O3(CYb≈2.5%) were measured in experiment at different pump power. The obtained results were used to calculate a number of thermo-optical constants, which showed that sesquioxide ceramics are significantly superior to the widely used yttrium aluminum garnet Yb3+: Y3Al5O12(CYb≈10%). (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200694" xmlns="http://purl.org/rss/1.0/"><title>Investigation of ZnO:Al window layer of Cu2ZnSnS4 thin film solar cells prepared by non-vacuum processing</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200694</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Investigation of ZnO:Al window layer of Cu2ZnSnS4 thin film solar cells prepared by non-vacuum processing</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Takumi Aizawa, Kunihiko Tanaka, Kota Tagami, Hisao Uchiki</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-22T02:40:14.72648-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200694</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200694</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200694</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) thin film solar cells have been fabricated using sol-gel sulfurizing method under non-vacuum processing. The solar cells structure is Al/ZnO:Al/CdS/ CZTS/Mo/Soda Lime Glass(SLG) substrate. In our previous reports, the surface of CZTS got rougher as the particle diameter increased. In addition, there were many spots where CZTS layer was not coated enough by ZnO:Al window layer. In this report, in order to improve conversion efficiency of the CZTS solar cells, we focus on the ZnO:Al layer and the effect of an increase in the number of ZnO:Al coating repetition and the dependence on drying time and temperature for ZnO:Al were investigated. Optimized conversion efficiency of 3.61% was achieved with 15 coating repetition of ZnO:Al layer coated at 350 °C and dried for 3 min. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu2ZnSnS4 (CZTS) thin film solar cells have been fabricated using sol-gel sulfurizing method under non-vacuum processing. The solar cells structure is Al/ZnO:Al/CdS/ CZTS/Mo/Soda Lime Glass(SLG) substrate. In our previous reports, the surface of CZTS got rougher as the particle diameter increased. In addition, there were many spots where CZTS layer was not coated enough by ZnO:Al window layer. In this report, in order to improve conversion efficiency of the CZTS solar cells, we focus on the ZnO:Al layer and the effect of an increase in the number of ZnO:Al coating repetition and the dependence on drying time and temperature for ZnO:Al were investigated. Optimized conversion efficiency of 3.61% was achieved with 15 coating repetition of ZnO:Al layer coated at 350 °C and dried for 3 min. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200879" xmlns="http://purl.org/rss/1.0/"><title>Excitonic emissions of AgInS2 crystals with chalcopyrite and orthorhombic structure</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200879</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Excitonic emissions of AgInS2 crystals with chalcopyrite and orthorhombic structure</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Kazuki Wakita, Umihito Miyamoto, Raul Paucar, Kazuhiro Honjo, YongGu Shim, Takahiro Tokuda, Kenji Yoshino</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-13T01:30:41.497563-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200879</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200879</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200879</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Micro-structure of AgInS<sub>2</sub> grown by the hot-press method has been examined by the properties of free-exciton emission using a scanning confocal-microscopy system. The crystal structures are distinguished by a two-dimensional image of free-exciton emission at RT. The excitonic emissions with the orthorhombic structure were also analyzed and a bound exciton emission was observed in addition to a free exciton emission. Furthermore, it is indicated that the two-dimensional image of decay-time constant is more insusceptible to resolve the structures than that of emission intensity. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Micro-structure of AgInS2 grown by the hot-press method has been examined by the properties of free-exciton emission using a scanning confocal-microscopy system. The crystal structures are distinguished by a two-dimensional image of free-exciton emission at RT. The excitonic emissions with the orthorhombic structure were also analyzed and a bound exciton emission was observed in addition to a free exciton emission. Furthermore, it is indicated that the two-dimensional image of decay-time constant is more insusceptible to resolve the structures than that of emission intensity. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200863" xmlns="http://purl.org/rss/1.0/"><title>Electronic structures of ternary-layered semiconductor TlGaSe2 investigated by photoemission spectroscopy</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200863</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Electronic structures of ternary-layered semiconductor TlGaSe2 investigated by photoemission spectroscopy</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Satoru Motonami, Kojiro Mimura, YongGu Shim, Kazuki Wakita, Hitoshi Sato, Yuki Utsumi, Shigenori Ueda, Masashi Nakatake, Kenya Shimada, Yukihiro Taguchi, Keisuke Kobayashi, Hirofumi Namatame, Masaki Taniguchi, Guseyn Orudzhev, Nazim Mamedov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-13T01:30:40.601457-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200863</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200863</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200863</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Electronic structures of the ternary-layered semiconductor TlGaSe<sub>2</sub> have been investigated by hard and soft X-ray photoemission spectroscopies (HAXPES and SXPES). The spectral shape of all core levels obtained from HAXPES and SXPES can be represented by a symmetric Lorentzian, reflecting the semiconducting nature of TlGaSe<sub>2</sub>. Peak positions of the same bulk components, obtained from HAXPES and SXPES, are almost the same. This suggests that the recoil effect is ignorable for TlGaSe<sub>2</sub> and that the HAXPES spectra of this material provide us the information on the intrinsic bulk electronic structures. The valence-band HAXPES spectrum is composed of two main features and is well reproduced by the theoretical calculation. The estimated value of 2.0 eV for the energy gap is consistent with the results from the optical measurements. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Electronic structures of the ternary-layered semiconductor TlGaSe2 have been investigated by hard and soft X-ray photoemission spectroscopies (HAXPES and SXPES). The spectral shape of all core levels obtained from HAXPES and SXPES can be represented by a symmetric Lorentzian, reflecting the semiconducting nature of TlGaSe2. Peak positions of the same bulk components, obtained from HAXPES and SXPES, are almost the same. This suggests that the recoil effect is ignorable for TlGaSe2 and that the HAXPES spectra of this material provide us the information on the intrinsic bulk electronic structures. The valence-band HAXPES spectrum is composed of two main features and is well reproduced by the theoretical calculation. The estimated value of 2.0 eV for the energy gap is consistent with the results from the optical measurements. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200866" xmlns="http://purl.org/rss/1.0/"><title>Fabrication of Cu2SnS3 thin films by sulfurization of evaporated Cu-Sn precursors for solar cells</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200866</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Fabrication of Cu2SnS3 thin films by sulfurization of evaporated Cu-Sn precursors for solar cells</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Naoya Aihara, Hideaki Araki, Akiko Takeuchi, Kazuo Jimbo, Hironori Katagiri</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-13T01:30:39.33474-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200866</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200866</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200866</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The ternary compound semiconductor Cu<sub>2</sub>SnS<sub>3</sub> (CTS) is formed from non-toxic materials that are abundant in Earth's crust and other low-cost elements. CTS has also been reported to a band gap energy range of 0.93–1.77 eV and an absorption coefficient of 1.0×10<sup>4</sup> cm<sup>–1</sup>. Consequently, CTS is a potential material for the p-type absorber layer of thin film solar cells. In this study, we examined the dependence of the optical, electrical and photovoltaic properties of CTS thin films on the Cu/Sn composition ratio. CTS thin films were fabricated by sulfurizing evaporated Cu-Sn precursors with different Cu/Sn composition ratios at 560 °C for 2 h in a N<sup>2</sup> atmosphere and sulfur vapor. The Cu/Sn composition ratios of the sulfurized films were determined to be 1.6–2.5 by X-ray fluorescence. The solar cell comprising a CTS thin film with a Cu/Sn composition ratio of 1.77 exhibited the best performance among the cells examined, an open-circuit voltage of 242 mV, a short-circuit current density of 28.9 mA/cm<sup>2</sup>, a fill factor of 41.7% and a conversion efficiency of 2.92% were obtained. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The ternary compound semiconductor Cu2SnS3 (CTS) is formed from non-toxic materials that are abundant in Earth's crust and other low-cost elements. CTS has also been reported to a band gap energy range of 0.93–1.77 eV and an absorption coefficient of 1.0×104 cm–1. Consequently, CTS is a potential material for the p-type absorber layer of thin film solar cells. In this study, we examined the dependence of the optical, electrical and photovoltaic properties of CTS thin films on the Cu/Sn composition ratio. CTS thin films were fabricated by sulfurizing evaporated Cu-Sn precursors with different Cu/Sn composition ratios at 560 °C for 2 h in a N2 atmosphere and sulfur vapor. The Cu/Sn composition ratios of the sulfurized films were determined to be 1.6–2.5 by X-ray fluorescence. The solar cell comprising a CTS thin film with a Cu/Sn composition ratio of 1.77 exhibited the best performance among the cells examined, an open-circuit voltage of 242 mV, a short-circuit current density of 28.9 mA/cm2, a fill factor of 41.7% and a conversion efficiency of 2.92% were obtained. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200867" xmlns="http://purl.org/rss/1.0/"><title>Crystal structures and band-gap energies of Cu2Sn(S,Se)3 (0≤ x ≤1.0) solid solution</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200867</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Crystal structures and band-gap energies of Cu2Sn(S,Se)3 (0≤ x ≤1.0) solid solution</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Takeshi Nomura, Tsuyoshi Maeda, Kouji Takei, Masaru Morihama, Takahiro Wada</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-13T01:30:38.106338-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200867</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200867</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200867</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu<sub>2</sub>Sn(S<sub>1–x</sub>Se<sub>x</sub>)<sub>3</sub> (CTSSe) solid solutions with 0 ≤ x ≤ 1.0 were synthesized by mixing the elemental powders and post-annealing at 600 °C. The crystal structure of Cu<sub>2</sub>SnS<sub>3</sub> (CTS), Cu<sub>2</sub>SnSe<sub>3</sub> (CTSe), and their solid solution were determined by Rietveld refinement of the powder X-ray diffraction data. CTSSe solid solution had a monoclinic crystal system [space group: Cc (No. 9)]. The refined lattice parameters of CTS were <em>a</em> =6.654(8) Å, <em>b</em> =11.534(2) Å, <em>c</em> =6.659(4) Å, and <em>β</em> =109.40(5)° and those of CTSe were <em>a</em> =6.964(6) Å, <em>b</em> =12.056(6) Å, <em>c</em> =6.972(4) Å, and <em>β</em> =109.49(1)°. The lattice parameters, <em>a</em>, <em>b</em>, and <em>c</em> of CTSSe solid solution monotonically increased with increasing Se content. The band gap of the CTSSe solid solution linearly decreased from 0.87 eV (x=0.0) to 0.67 eV (x=0.60) with increasing Se content. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu2Sn(S1–xSex)3 (CTSSe) solid solutions with 0 ≤ x ≤ 1.0 were synthesized by mixing the elemental powders and post-annealing at 600 °C. The crystal structure of Cu2SnS3 (CTS), Cu2SnSe3 (CTSe), and their solid solution were determined by Rietveld refinement of the powder X-ray diffraction data. CTSSe solid solution had a monoclinic crystal system [space group: Cc (No. 9)]. The refined lattice parameters of CTS were a =6.654(8) Å, b =11.534(2) Å, c =6.659(4) Å, and β =109.40(5)° and those of CTSe were a =6.964(6) Å, b =12.056(6) Å, c =6.972(4) Å, and β =109.49(1)°. The lattice parameters, a, b, and c of CTSSe solid solution monotonically increased with increasing Se content. The band gap of the CTSSe solid solution linearly decreased from 0.87 eV (x=0.0) to 0.67 eV (x=0.60) with increasing Se content. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200868" xmlns="http://purl.org/rss/1.0/"><title>Phase transition and Raman-active modes in TlInS2</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200868</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Phase transition and Raman-active modes in TlInS2</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Raul Paucar, Kazuki Harada, Ryoya Matsumoto, Kazuki Wakita, YongGu Shim, Oktay Alekperov, Nazim Mamedov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-13T01:30:37.059057-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200868</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200868</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200868</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Raman spectra of layered ternary thallium chalcogenide TlInS<sub>2</sub>were studied with the aid of 3D confocal Raman system over the temperature range 77–300K in the frequency region of 120–400 cm<sup>–1</sup>. The observed lines in the obtained Raman spectra were denconvoluted into Lorentzian peaks and temperature dependence of each peak's parameters (peak position and half width at half maximum) were obtained. An irregular behaviour of the temperature dependence of Loretzian parameters is reported. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Raman spectra of layered ternary thallium chalcogenide TlInS2were studied with the aid of 3D confocal Raman system over the temperature range 77–300K in the frequency region of 120–400 cm–1. The observed lines in the obtained Raman spectra were denconvoluted into Lorentzian peaks and temperature dependence of each peak's parameters (peak position and half width at half maximum) were obtained. An irregular behaviour of the temperature dependence of Loretzian parameters is reported. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200870" xmlns="http://purl.org/rss/1.0/"><title>Optical second harmonic generation in TlMeX2 (Me=In,Ga,X=S,Se,Te)</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200870</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Optical second harmonic generation in TlMeX2 (Me=In,Ga,X=S,Se,Te)</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yoshito Araki, Ryo Asaba, Kazuki Wakita, YongGu Shim, Kojiro Mimura, Nazim Mamedov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-13T01:30:35.981564-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200870</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200870</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200870</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Optical second harmonic generation (SHG) has been studied in TlMeX<sub>2</sub> (Me=In,Ga, X=S,Se,Te) compounds with layered and chain crystalline structures. For layered TlInS<sub>2</sub> and TlGaSe<sub>2</sub>, SHG signal has been observed in a range of temperatures below the point of phase transition into ferroelectric phase for which asymmetry is prominent. On the other hand, the chain TlInSe<sub>2</sub> and TlGaTe<sub>2</sub> have shown SHG signal at a temperature above 270 and 293K, respectively. Both the TlInSe<sub>2</sub> and TlGaTe<sub>2</sub> have symmetry centre at room temperature and second order optical non-linearity is an artefact incompatible with their bulk structure. Surface structure is speculated to be responsible for SHG signal observed in these materials for the first time to our knowledge. The details of temperature behaviour of SHG in TlInSe<sub>2</sub> and TlGaTe<sub>2</sub>lead to a phase-transition based model for explanation of the observed phenomenon. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Optical second harmonic generation (SHG) has been studied in TlMeX2 (Me=In,Ga, X=S,Se,Te) compounds with layered and chain crystalline structures. For layered TlInS2 and TlGaSe2, SHG signal has been observed in a range of temperatures below the point of phase transition into ferroelectric phase for which asymmetry is prominent. On the other hand, the chain TlInSe2 and TlGaTe2 have shown SHG signal at a temperature above 270 and 293K, respectively. Both the TlInSe2 and TlGaTe2 have symmetry centre at room temperature and second order optical non-linearity is an artefact incompatible with their bulk structure. Surface structure is speculated to be responsible for SHG signal observed in these materials for the first time to our knowledge. The details of temperature behaviour of SHG in TlInSe2 and TlGaTe2lead to a phase-transition based model for explanation of the observed phenomenon. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200878" xmlns="http://purl.org/rss/1.0/"><title>Preparation of CuInS2 thin films from materials grown by mechanochemical method</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200878</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Preparation of CuInS2 thin films from materials grown by mechanochemical method</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Kanta Sugimoto, Yoji Akaki, Shigeyuki Nakamura, Kenji Yoshino</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-13T01:30:34.818599-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200878</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200878</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200878</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Optical second harmonic generation (SHG) has been studied in TlMeX<sub>2</sub> (Me=In,Ga, X=S,Se,Te) compounds with layered and chain crystalline structures. For layered TlInS<sub>2</sub> and TlGaSe<sub>2</sub>, SHG signal has been observed in a range of temperatures below the point of phase transition into ferroelectric phase for which asymmetry is prominent. On the other hand, the chain TlInSe<sub>2</sub> and TlGaTe<sub>2</sub> have shown SHG signal at a temperature above 270 and 293K, respectively. Both the TlInSe<sub>2</sub> and TlGaTe<sub>2</sub> have symmetry centre at room temperature and second order optical non-linearity is an artefact incompatible with their bulk structure. Surface structure is speculated to be responsible for SHG signal observed in these materials for the first time to our knowledge. The details of temperature behaviour of SHG in TlInSe<sub>2</sub> and TlGaTe<sub>2</sub> lead to a phase-transition based model for explanation of the observed phenomenon. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Optical second harmonic generation (SHG) has been studied in TlMeX2 (Me=In,Ga, X=S,Se,Te) compounds with layered and chain crystalline structures. For layered TlInS2 and TlGaSe2, SHG signal has been observed in a range of temperatures below the point of phase transition into ferroelectric phase for which asymmetry is prominent. On the other hand, the chain TlInSe2 and TlGaTe2 have shown SHG signal at a temperature above 270 and 293K, respectively. Both the TlInSe2 and TlGaTe2 have symmetry centre at room temperature and second order optical non-linearity is an artefact incompatible with their bulk structure. Surface structure is speculated to be responsible for SHG signal observed in these materials for the first time to our knowledge. The details of temperature behaviour of SHG in TlInSe2 and TlGaTe2 lead to a phase-transition based model for explanation of the observed phenomenon. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200840" xmlns="http://purl.org/rss/1.0/"><title>In situ ellipsometric study of the three-stage process in CuInSe2 film deposition</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200840</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">In situ ellipsometric study of the three-stage process in CuInSe2 film deposition</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Sho Shirakata, Toshihiro Takahashi, Hiroaki Matsunaga</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:57.214069-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200840</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200840</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200840</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>In Situ ellipsometric study has been carried out during the deposition of the CuInSe<sub>2</sub> thin film by means of the three-stage process. A rotator analyzing ellipsomerter using a 632.8 nm He-Ne laser was used. Ellipsometric parameters (Ψ and Δ) and reflectivity R was obtained during the entire deposition stages, in which a complex reflection coefficient is ρ=tanΨ exp(iΔ). Cu, In and Se were deposited on the Mo-coated SLG substrate. At the first-stage (In-Se deposition), the In-Se film deposition rate and its reflactive index has been obtained on the basis of the light interference. At the second-stage, changes in both Ψ and Δ are observed. Based on the X-ray diffraction measurement, these changes are related to the stoichiometric composition of the film from In-rich to Cu-rich. This signal was utilized as a process switch from the second-stage to the third-stage. At the third stage, the weak change in Ψ has been observed showing the change of the stoichiometric composition from the Cu- rich to the In-rich. By means of the in situ ellipsometry-controlled three-stage process, the CuInSe<sub>2</sub> layer with single phase chalcopyrite structure has successfully been prepared, which exhibits an intense near-band-edge photoluminescence at 0.998 eV at room temperature. The preliminary fabricated ZnO/CdS/CuInSe<sub>2</sub> solar cell exhibited a conversion efficiency of 5.6%. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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In Situ ellipsometric study has been carried out during the deposition of the CuInSe2 thin film by means of the three-stage process. A rotator analyzing ellipsomerter using a 632.8 nm He-Ne laser was used. Ellipsometric parameters (Ψ and Δ) and reflectivity R was obtained during the entire deposition stages, in which a complex reflection coefficient is ρ=tanΨ exp(iΔ). Cu, In and Se were deposited on the Mo-coated SLG substrate. At the first-stage (In-Se deposition), the In-Se film deposition rate and its reflactive index has been obtained on the basis of the light interference. At the second-stage, changes in both Ψ and Δ are observed. Based on the X-ray diffraction measurement, these changes are related to the stoichiometric composition of the film from In-rich to Cu-rich. This signal was utilized as a process switch from the second-stage to the third-stage. At the third stage, the weak change in Ψ has been observed showing the change of the stoichiometric composition from the Cu- rich to the In-rich. By means of the in situ ellipsometry-controlled three-stage process, the CuInSe2 layer with single phase chalcopyrite structure has successfully been prepared, which exhibits an intense near-band-edge photoluminescence at 0.998 eV at room temperature. The preliminary fabricated ZnO/CdS/CuInSe2 solar cell exhibited a conversion efficiency of 5.6%. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200839" xmlns="http://purl.org/rss/1.0/"><title>Trap levels in CaGa2S4 co-doped with Eu and rare earth elements</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200839</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Trap levels in CaGa2S4 co-doped with Eu and rare earth elements</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Chiharu Hidaka, Takeo Takizawa</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:56.415507-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200839</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200839</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200839</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Long afterglows are observed in the case of co-doping CaGa<sub>2</sub>S<sub>4</sub> with Eu and one of the other rare earth elements (REEs). Thermoluminescence spectra of these compounds have been measured in order to determine their trap depths. Photoluminescence spectra and decay curves have been also observed. The emission intensities, decay times and trap depths are shown as a function of the f-electron number of REEs, and the correlation between these properties and the 4f and 5d levels of divalent and trivalent REEs in the band structure of CaGa<sub>2</sub>S<sub>4</sub> is discussed. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Long afterglows are observed in the case of co-doping CaGa2S4 with Eu and one of the other rare earth elements (REEs). Thermoluminescence spectra of these compounds have been measured in order to determine their trap depths. Photoluminescence spectra and decay curves have been also observed. The emission intensities, decay times and trap depths are shown as a function of the f-electron number of REEs, and the correlation between these properties and the 4f and 5d levels of divalent and trivalent REEs in the band structure of CaGa2S4 is discussed. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200835" xmlns="http://purl.org/rss/1.0/"><title>Super high sensitive low-dimensional IR-detector</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200835</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Super high sensitive low-dimensional IR-detector</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Huseynov Emil, Ismayilov Namiq</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:55.372128-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200835</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200835</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200835</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The original design of the infrared detector providing ultrahigh parameters of responsivity is proposed. The idea lies in separation of the areas between charge carrier optical generation and formation of electrical signal. The calculations performed for Cd<sub>x</sub>Hg<sub>1–x</sub>Te photodetectors with <em>x</em> ∼ 0.21 and <em>x</em> ∼ 0.28 at electric bias 200 mV yield values such as <em>S<sub>u</sub></em> = 10<sup>8</sup>–10<sup>10</sup> V/W for voltage response. That is several orders of magnitude more than experimentally reached values for Cd<sub>x</sub>Hg<sub>1–x</sub>Te-based IR-detectors (<em>S<sub>u</sub></em> =10<sup>6</sup>V/W for <sub><em>λ</em>c</sub> = 11 µm, <em>T</em> = 77 K [Singh and Mittal, Def. Sci. J. <b>53</b>(31), 281 (2003)]). Offered detector is different with very large resistance and small power consumption and dimensions of active area. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The original design of the infrared detector providing ultrahigh parameters of responsivity is proposed. The idea lies in separation of the areas between charge carrier optical generation and formation of electrical signal. The calculations performed for CdxHg1–xTe photodetectors with x ∼ 0.21 and x ∼ 0.28 at electric bias 200 mV yield values such as Su = 108–1010 V/W for voltage response. That is several orders of magnitude more than experimentally reached values for CdxHg1–xTe-based IR-detectors (Su =106V/W for λc = 11 µm, T = 77 K [Singh and Mittal, Def. Sci. J. 53(31), 281 (2003)]). Offered detector is different with very large resistance and small power consumption and dimensions of active area. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200834" xmlns="http://purl.org/rss/1.0/"><title>Optical characterization of non-annealed CdS:O films for window layers in solar cells</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200834</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Optical characterization of non-annealed CdS:O films for window layers in solar cells</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Atsushi Kitano, YongGu Shim, Kazuki Wakita, Khuraman Khalilova, Nazim Mamedov, Ayaz Bayramov, Emil Huseynov, Ilham Hasanov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:54.294847-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200834</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200834</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200834</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Optical constants of CdS:O window layers for solar cells were studied as a function of the oxygen content. The CdS:O thin films were deposited on glass substrates in the presence of oxygen at 0, 2, 3 and 5% values of O/Ar ratio by rf magnetron sputtering. Ellipsometric measurements on CdS:O thin films were carried out over 0.75–6.0 eV photon energies at room temperature. Optical constants were determined by using a the best-fit dispersion model. Broadening of spectral features of the obtained optical constants is found to increase with increasing O/Ar ratio. Besides, the CdS:O films grown at 100 °C as compared to those grown at 200 °C exhibit increased spectral broadening. In fact, almost complete smearing of band gap spectral feature is observed for CdS:O films deposited at 5% value of O/Ar ratio, resulting in appreciable transparency of the films in a spectral range above the energy gap of CdS. This, in turn, leads to an increased carrier collection in the UV spectral range and allows to considering CdS:O film as a candidate for improved window-layer material for solar cell application. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Optical constants of CdS:O window layers for solar cells were studied as a function of the oxygen content. The CdS:O thin films were deposited on glass substrates in the presence of oxygen at 0, 2, 3 and 5% values of O/Ar ratio by rf magnetron sputtering. Ellipsometric measurements on CdS:O thin films were carried out over 0.75–6.0 eV photon energies at room temperature. Optical constants were determined by using a the best-fit dispersion model. Broadening of spectral features of the obtained optical constants is found to increase with increasing O/Ar ratio. Besides, the CdS:O films grown at 100 °C as compared to those grown at 200 °C exhibit increased spectral broadening. In fact, almost complete smearing of band gap spectral feature is observed for CdS:O films deposited at 5% value of O/Ar ratio, resulting in appreciable transparency of the films in a spectral range above the energy gap of CdS. This, in turn, leads to an increased carrier collection in the UV spectral range and allows to considering CdS:O film as a candidate for improved window-layer material for solar cell application. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200833" xmlns="http://purl.org/rss/1.0/"><title>Effect of Ga content and growth temperature on Cu(In,Ga)Se2 thin film deposited on heat-resistant glass substrates</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200833</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Effect of Ga content and growth temperature on Cu(In,Ga)Se2 thin film deposited on heat-resistant glass substrates</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Takashi Higuchi, Noritaka Usami, Takashi Minemoto</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:53.337072-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200833</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200833</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200833</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu(In,Ga)Se<sub>2</sub> (CIGS) thin films were deposited on the Mo/heat-resistant glasses (SS-8, Nippon Electric Glass) by the three-stage evaporation process. The coefficient of thermal expansion (CTE) of SS-8 is 8.4×10<sup>–6</sup>/K, strain point of SS-8 is 582 °C. SS-8 has the CTE similar to that of SLG but higher thermal tolerance. Substrate temperature (T<sub>sub</sub>) during deposition and Ga/(In+Ga) atomic ratio of CIGS thin films were controlled to 550∼600 °C and 0∼0.7, respectively. The effect of T<sub>sub</sub> and Ga/(In+Ga) atomic ratios of CIGS films have been characterized by electron backscatter diffraction (EBSD) measurements. Grain size and ∑3 grain boundary ratio increased at higher T<sub>sub</sub>. ∑3 grain boundary ratio was calculated from the fraction of the length of ∑3 grain boundary by the length of the total grain boundaries on EBSD image. There was the correlation among Ga contents, T<sub>sub</sub>, grain size and efficiency. It is difficult to distinguish between effect of grain size and effect of grain boundary to efficiency. However, it is found that high Ga content up to 0.7 results in both high efficiency and ∑3 grain boundary ratio. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu(In,Ga)Se2 (CIGS) thin films were deposited on the Mo/heat-resistant glasses (SS-8, Nippon Electric Glass) by the three-stage evaporation process. The coefficient of thermal expansion (CTE) of SS-8 is 8.4×10–6/K, strain point of SS-8 is 582 °C. SS-8 has the CTE similar to that of SLG but higher thermal tolerance. Substrate temperature (Tsub) during deposition and Ga/(In+Ga) atomic ratio of CIGS thin films were controlled to 550∼600 °C and 0∼0.7, respectively. The effect of Tsub and Ga/(In+Ga) atomic ratios of CIGS films have been characterized by electron backscatter diffraction (EBSD) measurements. Grain size and ∑3 grain boundary ratio increased at higher Tsub. ∑3 grain boundary ratio was calculated from the fraction of the length of ∑3 grain boundary by the length of the total grain boundaries on EBSD image. There was the correlation among Ga contents, Tsub, grain size and efficiency. It is difficult to distinguish between effect of grain size and effect of grain boundary to efficiency. However, it is found that high Ga content up to 0.7 results in both high efficiency and ∑3 grain boundary ratio. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200832" xmlns="http://purl.org/rss/1.0/"><title>Spin-polarized exciton transfer in Zn-Cd-Mn-Se multi quantum wells</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200832</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Spin-polarized exciton transfer in Zn-Cd-Mn-Se multi quantum wells</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Takashi Matsumoto, Fumiaki Iwasaki, Masao Hishikawa, Sakyo Fukasawa, Tsutomu Muranaka, Yoichi Nabetani</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:52.355181-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200832</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200832</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200832</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Four-quantum-well structure consisting of a ZnCdMnSe diluted magnetic semiconductor (DMS) well and three ZnCdSe non-magnetic semiconductor (NMS) wells separated by 15 nm-thick ZnSe barrier layers were prepared by using ALE and MBE technique. The sample was excited by CW and pulse lasers with photon energy larger than the barrier layer band gap, and circularly polarized PL spectra due to recombination of excitons localized in each well were measured as a function of external magnetic field in the Faraday geometry up to 8 T at 4 K. The PL from the NMS well next to the DMS well and from the NMS well next-but-one to the DMS well showed positive circular polarization due to LO phonon assisted transfer of positively spin polarized excitons from the DMS well to the NMS wells. The two NMS wells showed different magnetic field dependence of the degree of circular polarization of PL, which suggested that the exciton transfer from the DMS well to the NMS well next-but-one was governed by direct interaction between the two wells, not by cascade transfer process. The degree of circular polarization of PL from the NMS wells increased from zero to 20∼30% after pulse excitation. Raise time of the polarization degree was discussed on the basis of the difference of distance between the NMS well and the DMS well. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Four-quantum-well structure consisting of a ZnCdMnSe diluted magnetic semiconductor (DMS) well and three ZnCdSe non-magnetic semiconductor (NMS) wells separated by 15 nm-thick ZnSe barrier layers were prepared by using ALE and MBE technique. The sample was excited by CW and pulse lasers with photon energy larger than the barrier layer band gap, and circularly polarized PL spectra due to recombination of excitons localized in each well were measured as a function of external magnetic field in the Faraday geometry up to 8 T at 4 K. The PL from the NMS well next to the DMS well and from the NMS well next-but-one to the DMS well showed positive circular polarization due to LO phonon assisted transfer of positively spin polarized excitons from the DMS well to the NMS wells. The two NMS wells showed different magnetic field dependence of the degree of circular polarization of PL, which suggested that the exciton transfer from the DMS well to the NMS well next-but-one was governed by direct interaction between the two wells, not by cascade transfer process. The degree of circular polarization of PL from the NMS wells increased from zero to 20∼30% after pulse excitation. Raise time of the polarization degree was discussed on the basis of the difference of distance between the NMS well and the DMS well. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200831" xmlns="http://purl.org/rss/1.0/"><title>Raman spectra of wurtzstannite quaternary compounds</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200831</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Raman spectra of wurtzstannite quaternary compounds</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Maxim Guc, Victor Izquierdo-Roca, Alejandro Pérez Rodríguez, Galina Gurieva, Serghei Levcenko, Susan Schorr, Ernest Arushanov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:51.119144-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200831</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200831</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200831</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Wurtzstannite-type Cu<sub>2</sub>ZnGeS<sub>4</sub>, Cu<sub>2</sub>ZnSiSe<sub>4</sub> and Cu<sub>2</sub>ZnSiS<sub>4</sub> single crystals were grown by chemical vapor transport method using iodine as transport agent. Raman spectra of obtained crystals were investigated and 17, 11 and 18 peaks were observed for Cu<sub>2</sub>ZnGeS<sub>4</sub>, Cu<sub>2</sub>ZnSiSe<sub>4</sub> and Cu<sub>2</sub>ZnSiS<sub>4</sub>, respectively. In all cases, the spectra from these compounds are characterized by three dominant peaks. In case of Cu<sub>2</sub>ZnSiSe<sub>4</sub> the dominant peaks appear at 222 cm<sup>–1</sup>, 179 cm<sup>–1</sup> and 170 cm<sup>–1</sup>. For Cu<sub>2</sub>ZnGeS<sub>4</sub> and Cu<sub>2</sub>ZnSiS<sub>4</sub> the most intense peak shifts from 360 cm<sup>–1</sup> to 393 cm<sup>–1</sup> with replacement of Ge by Si, while the other main peaks have almost the same position for both compounds (272–278 cm<sup>–1</sup> and 291 cm<sup>–1</sup>). Identification of these dominant peaks provides with a characteristic spectral fingerprint for detection of these crystalline phases. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Wurtzstannite-type Cu2ZnGeS4, Cu2ZnSiSe4 and Cu2ZnSiS4 single crystals were grown by chemical vapor transport method using iodine as transport agent. Raman spectra of obtained crystals were investigated and 17, 11 and 18 peaks were observed for Cu2ZnGeS4, Cu2ZnSiSe4 and Cu2ZnSiS4, respectively. In all cases, the spectra from these compounds are characterized by three dominant peaks. In case of Cu2ZnSiSe4 the dominant peaks appear at 222 cm–1, 179 cm–1 and 170 cm–1. For Cu2ZnGeS4 and Cu2ZnSiS4 the most intense peak shifts from 360 cm–1 to 393 cm–1 with replacement of Ge by Si, while the other main peaks have almost the same position for both compounds (272–278 cm–1 and 291 cm–1). Identification of these dominant peaks provides with a characteristic spectral fingerprint for detection of these crystalline phases. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200830" xmlns="http://purl.org/rss/1.0/"><title>ESR study of Ce3+ ions in a CaGa2S4 single crystal</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200830</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">ESR study of Ce3+ ions in a CaGa2S4 single crystal</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Ittetsu Kitajima, Takeo Takizawa, Chiharu Hidaka, Shigetaka Nomura</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:50.119385-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200830</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200830</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200830</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>ESR measurements have been carried out to determine the local environment and the ground state of Ce<sup>3+</sup> ions in the orthorhombic CaGa<sub>2</sub>S<sub>4</sub> at 4.2 K. More than 30 ESR lines are observed with almost the same angular dependence. The local symmetry and the anisotropic <em>g</em>-tensor for the four strongest ESR signals indicate that Ce<sup>3+</sup> ions substitute the three independent Ca sites. A part of Ce<sup>3+</sup> ions at the Ca<sup>2+</sup> sites and a neighbouring sulphur vacancy are expected to form complex centers in view of the other weak ESR lines observed. The ground state of Ce<sup>3+</sup> in the host lattice is shown to consist of mostly <em>ϕ</em><sub>±1/2</sub> by fitting the ESR spectra using the spin Hamiltonian. The upper <sup>2</sup><em>F</em><sub>7/2</sub> state is thought to be slightly mixed into the ground state <sup>2</sup><em>F</em><sub>5/2</sub> judging from a small difference in the fitting. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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ESR measurements have been carried out to determine the local environment and the ground state of Ce3+ ions in the orthorhombic CaGa2S4 at 4.2 K. More than 30 ESR lines are observed with almost the same angular dependence. The local symmetry and the anisotropic g-tensor for the four strongest ESR signals indicate that Ce3+ ions substitute the three independent Ca sites. A part of Ce3+ ions at the Ca2+ sites and a neighbouring sulphur vacancy are expected to form complex centers in view of the other weak ESR lines observed. The ground state of Ce3+ in the host lattice is shown to consist of mostly ϕ±1/2 by fitting the ESR spectra using the spin Hamiltonian. The upper 2F7/2 state is thought to be slightly mixed into the ground state 2F5/2 judging from a small difference in the fitting. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200828" xmlns="http://purl.org/rss/1.0/"><title>Growth and characterization of ZnS films by spray pyrolysis</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200828</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Growth and characterization of ZnS films by spray pyrolysis</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Takahiro Tokuda, Kenji Yoshino</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:49.201334-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200828</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200828</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200828</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>ZnS films are formed by spray method using various zinc sources such as zinc acetate (Zn(CH<sub>3</sub>COO)<sub>2</sub>), zinc sulfate (ZnSO<sub>4</sub>), zinc nitrate (Zn(NO<sub>3</sub>)<sub>2</sub>), zinc iodide (ZnI<sub>2</sub>), zinc chloride (ZnCl<sub>2</sub>), zinc acetyl (Zn(acac)<sub>2</sub>). ZnS film using zinc iodide is sharp spectrum and zinc sulfate is broad spectrum by X-ray diffraction (XRD). The XRD spectra indicates that ZnS using zinc chloride and zinc iodide at 100 °C the source of zinc to zinc acetate and zinc nitrate at 200 °C, zinc acetyl at 300 °C, zinc sulfate at 400 °C can be confirmed. These results are consistent with the difference in the instability constants of each zinc source. The ionization of Zn becomes difficult with increasing the instability constant of zinc sources. Reaction is slow due to low ionized zinc in solution. Therefore, it is considered that ZnS films are hard to crystallize at low substrate temperature. The grain size becomes large with decreasing the instability constant. It is considered that this is proportional to the amount of zinc ions in solution. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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ZnS films are formed by spray method using various zinc sources such as zinc acetate (Zn(CH3COO)2), zinc sulfate (ZnSO4), zinc nitrate (Zn(NO3)2), zinc iodide (ZnI2), zinc chloride (ZnCl2), zinc acetyl (Zn(acac)2). ZnS film using zinc iodide is sharp spectrum and zinc sulfate is broad spectrum by X-ray diffraction (XRD). The XRD spectra indicates that ZnS using zinc chloride and zinc iodide at 100 °C the source of zinc to zinc acetate and zinc nitrate at 200 °C, zinc acetyl at 300 °C, zinc sulfate at 400 °C can be confirmed. These results are consistent with the difference in the instability constants of each zinc source. The ionization of Zn becomes difficult with increasing the instability constant of zinc sources. Reaction is slow due to low ionized zinc in solution. Therefore, it is considered that ZnS films are hard to crystallize at low substrate temperature. The grain size becomes large with decreasing the instability constant. It is considered that this is proportional to the amount of zinc ions in solution. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200826" xmlns="http://purl.org/rss/1.0/"><title>Recycling of CIGS absorber layer for deposition of CIGS film</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200826</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Recycling of CIGS absorber layer for deposition of CIGS film</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Hisashi Miyazaki</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:47.971194-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200826</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200826</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200826</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We tried to recycle CIGS thin film solar cell absorber layer as a deposition source. The deposition source is peeled off from Mo/SLG substrate. The recycled-CIGS films were evaluated by XRD, Raman scattering spectroscopy, and SEM. As compared with high-efficiency CIGS films, the XRD patterns and Raman spectra show that the crystallinity of deposited CIGS film using peeling-off powders was similar. A secondary phase is not generated on the surface of the deposited CIGS film by SEM observation. From these results, we thought that the CIGS materials from solar cell structures were able to be recycled for new solar cell absorber layer. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We tried to recycle CIGS thin film solar cell absorber layer as a deposition source. The deposition source is peeled off from Mo/SLG substrate. The recycled-CIGS films were evaluated by XRD, Raman scattering spectroscopy, and SEM. As compared with high-efficiency CIGS films, the XRD patterns and Raman spectra show that the crystallinity of deposited CIGS film using peeling-off powders was similar. A secondary phase is not generated on the surface of the deposited CIGS film by SEM observation. From these results, we thought that the CIGS materials from solar cell structures were able to be recycled for new solar cell absorber layer. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200820" xmlns="http://purl.org/rss/1.0/"><title>Ge content dependence of radiation damage in Si1-xGex source/drain p-type metal oxide semiconductor field effect transistors</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200820</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Ge content dependence of radiation damage in Si1-xGex source/drain p-type metal oxide semiconductor field effect transistors</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Toshiyuki Nakashima, Masashi Yoneoka, Isao Tsunoda, Kenichiro Takakura, Mireia Bargallo Gonzalez, Eddy Simoen, Cor Claeys, Kenji Yoshino</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:47.117629-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200820</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200820</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200820</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The 2-MeV electron radiation damage of Si<sub>1-x</sub>Ge<sub>x</sub> source/drain (S/D) p-type metal oxide semiconductor field effect transistors (p-MOSFETs) with different Ge contents is studied. Before electron irradiation, an enhancement of the hole mobility with Ge content of the S/D stressors is clearly observed. On the other hand, after electron irradiation, the drain current and the maximum hole mobility decreases with increasing electron fluence for all Ge contents, because of lattice defects are introduced by the electron irradiation in the Si channel. The threshold voltage shifts and the maximum hole mobility degradation is independent on the Ge content for all electron fluences. These results indicate that the strain-induced hole mobility enhancement due to Ge doping is retained after electron irradiation in the studied device structure. This indicates that the compressive strain is maintained in the channel. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The 2-MeV electron radiation damage of Si1-xGex source/drain (S/D) p-type metal oxide semiconductor field effect transistors (p-MOSFETs) with different Ge contents is studied. Before electron irradiation, an enhancement of the hole mobility with Ge content of the S/D stressors is clearly observed. On the other hand, after electron irradiation, the drain current and the maximum hole mobility decreases with increasing electron fluence for all Ge contents, because of lattice defects are introduced by the electron irradiation in the Si channel. The threshold voltage shifts and the maximum hole mobility degradation is independent on the Ge content for all electron fluences. These results indicate that the strain-induced hole mobility enhancement due to Ge doping is retained after electron irradiation in the studied device structure. This indicates that the compressive strain is maintained in the channel. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200841" xmlns="http://purl.org/rss/1.0/"><title>Synthesis of porous CuInS2 crystals using a stirrer</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200841</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Synthesis of porous CuInS2 crystals using a stirrer</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yoji Akaki, Yuki Ohno, Takanori Momiki</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:46.154458-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200841</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200841</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200841</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Porous CuInS<sub>2</sub> crystals were grown from starting materials CuCl<sub>2</sub>·2H<sub>2</sub>O, InCl<sub>3</sub>·4H<sub>2</sub>O and thiorea with ethylene glycol solution, that were placed into a flask, heated, and refluxed for 1 hour. The diffraction peaks only from CuInS<sub>2</sub> phase appear for all the samples. The morphology of CuInS<sub>2</sub> crystal was porous, and the porous crystals exist in two kinds. One kind was flower-like crystals which complexly lack the flakes, another one was sphere-like crystals existed with a number of the poles. The specific surface area of the samples grown by stirring starting materials with In to Cu ratio of 4.3 for 30 minutes was found approximately to be 55 m<sup>2</sup>/g. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Porous CuInS2 crystals were grown from starting materials CuCl2·2H2O, InCl3·4H2O and thiorea with ethylene glycol solution, that were placed into a flask, heated, and refluxed for 1 hour. The diffraction peaks only from CuInS2 phase appear for all the samples. The morphology of CuInS2 crystal was porous, and the porous crystals exist in two kinds. One kind was flower-like crystals which complexly lack the flakes, another one was sphere-like crystals existed with a number of the poles. The specific surface area of the samples grown by stirring starting materials with In to Cu ratio of 4.3 for 30 minutes was found approximately to be 55 m2/g. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200842" xmlns="http://purl.org/rss/1.0/"><title>Rapid direct preparation of Cu2ZnSn(S1–x,Sex)4 films using microwave irradiation</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200842</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Rapid direct preparation of Cu2ZnSn(S1–x,Sex)4 films using microwave irradiation</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Ryuji Kaigawa, Satomi Hirata, Muneo Sasaki, R. Klenk</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:45.177063-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200842</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200842</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200842</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu<sub>2</sub>ZnSn(S<sub>1−x</sub>,Se<sub>x</sub>)<sub>4</sub> (CZTSSe) solid solution films were prepared on Ti foils by means of non-vacuum, instantaneous, direct synthesis from elemental Cu, Zn, Sn, S, and Se precursor films using microwave irradiation. XRD patterns and Raman scattering spectra show that the resulting films consist of CZTSe crystals. The lattice constants of CZTSSe decreased in direct proportion to the S/(S+Se) ratio almost satisfying Vegard's law. Resulting films were relatively compact and continuous in the inner part. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu2ZnSn(S1−x,Sex)4 (CZTSSe) solid solution films were prepared on Ti foils by means of non-vacuum, instantaneous, direct synthesis from elemental Cu, Zn, Sn, S, and Se precursor films using microwave irradiation. XRD patterns and Raman scattering spectra show that the resulting films consist of CZTSe crystals. The lattice constants of CZTSSe decreased in direct proportion to the S/(S+Se) ratio almost satisfying Vegard's law. Resulting films were relatively compact and continuous in the inner part. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200843" xmlns="http://purl.org/rss/1.0/"><title>Photoluminescence characterization of Cu2ZnGeS4 single crystals</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200843</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Photoluminescence characterization of Cu2ZnGeS4 single crystals</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">S. Levcenko, M. Guc, C. Merschjann, G. Gurieva, S. Schorr, M. Lux-Steiner, E. Arushanov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:44.170732-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200843</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200843</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200843</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Optical properties of the Cu<sub>2</sub>ZnGeS<sub>4</sub> bulk single crystals were characterized by using Raman spectroscopy and photoluminescence spectroscopy technique. The strongest lattice vibration mode of this compound observed at 359 cm<sup>–1</sup> and less intensive modes at 273, 291, 332, 370, 383, 405 and 414 cm<sup>–1</sup>. PL spectra of the Cu<sub>2</sub>ZnGeS<sub>4</sub> consist of dominant broad emission band located at about 1.40 eV and a less intensive near 2.00 eV at 4.5 K. The observed PL bands were attributed to the donor acceptor pair transitions, with activation energy of 37 (140) meV for dominant and less intensive band, respectively. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Optical properties of the Cu2ZnGeS4 bulk single crystals were characterized by using Raman spectroscopy and photoluminescence spectroscopy technique. The strongest lattice vibration mode of this compound observed at 359 cm–1 and less intensive modes at 273, 291, 332, 370, 383, 405 and 414 cm–1. PL spectra of the Cu2ZnGeS4 consist of dominant broad emission band located at about 1.40 eV and a less intensive near 2.00 eV at 4.5 K. The observed PL bands were attributed to the donor acceptor pair transitions, with activation energy of 37 (140) meV for dominant and less intensive band, respectively. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300024" xmlns="http://purl.org/rss/1.0/"><title>Twinning mechanism of nucleation</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300024</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Twinning mechanism of nucleation</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Marat Akchurin, Ruslan Zakalyukin, Alexander Kaminskii</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:43.110126-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300024</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300024</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300024</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A new mechanism of nucleation during mechanosynthesis of complex oxides, based on the mass transfer due to plastic deformation is reported. Preparation of optical ceramics shows the role of the twinning process in the nucleation of yttrium aluminum garnet (Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub>) and spinel (MgAl<sub>2</sub>O<sub>4</sub>) by grinding powders of Al<sub>2</sub>O<sub>3</sub> + Y<sub>2</sub>O<sub>3</sub> and MgO + Al<sub>2</sub>O<sub>3</sub>, respectively. A new look at the role of twinning in the plastic deformation suggested that mechanical twinning is the main mechanism of mechanochemical solid-state reactions. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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A new mechanism of nucleation during mechanosynthesis of complex oxides, based on the mass transfer due to plastic deformation is reported. Preparation of optical ceramics shows the role of the twinning process in the nucleation of yttrium aluminum garnet (Y3Al5O12) and spinel (MgAl2O4) by grinding powders of Al2O3 + Y2O3 and MgO + Al2O3, respectively. A new look at the role of twinning in the plastic deformation suggested that mechanical twinning is the main mechanism of mechanochemical solid-state reactions. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200862" xmlns="http://purl.org/rss/1.0/"><title>Excitonic emission of CuInS2 crystals using confocal microscopy system</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200862</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Excitonic emission of CuInS2 crystals using confocal microscopy system</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yusuke Horikawa, Shingo Matsuo, YongGu Shim, Kazuki Wakita</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:42.239907-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200862</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200862</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200862</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Photoluminescence (PL) spectra in the band-edge region on bulk single-crystals of CuInS<sub>2</sub> grown by the traveling heater method have been investigated using a confocal microscopy system. The observed PL spectra are separated into two Lorentzian peaks which are assigned to be A and B free excitons, by the analysis of the excitation intensity dependence of the emissions. Consequently, we present the behaviour of B free exciton within a wide range of temperatures. The time-resolved emissions of A free exciton have also been examined. The decay of the emissions is analyzed using a double exponential curve. Fast and slow components are attributed to nonradiative relaxation and radiative recombination, respectively. The decay-time constant of the slow component corresponds to the radiative lifetime of A free exciton and is obtained over the wide temperature region until 300 K. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Photoluminescence (PL) spectra in the band-edge region on bulk single-crystals of CuInS2 grown by the traveling heater method have been investigated using a confocal microscopy system. The observed PL spectra are separated into two Lorentzian peaks which are assigned to be A and B free excitons, by the analysis of the excitation intensity dependence of the emissions. Consequently, we present the behaviour of B free exciton within a wide range of temperatures. The time-resolved emissions of A free exciton have also been examined. The decay of the emissions is analyzed using a double exponential curve. Fast and slow components are attributed to nonradiative relaxation and radiative recombination, respectively. The decay-time constant of the slow component corresponds to the radiative lifetime of A free exciton and is obtained over the wide temperature region until 300 K. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200856" xmlns="http://purl.org/rss/1.0/"><title>Cu2ZnSnS4 thin films grown by spray pyrolysis: characterization by Raman spectroscopy and X-ray diffraction</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200856</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Cu2ZnSnS4 thin films grown by spray pyrolysis: characterization by Raman spectroscopy and X-ray diffraction</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">G. Gurieva, M. Guc, L. I. Bruk, V. Izquierdo-Roca, A. Pérez Rodríguez, S. Schorr, E. Arushanov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:41.346582-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200856</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200856</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200856</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) thin films were deposited on glass substrates by spray pyrolysis a fast, cost effective and vacuum-free method. X-ray fluorescence, Raman spectroscopy and grazing incidence X-ray diffraction, were used to characterize the obtained thin films. The analysis of these data showed a close to stoichiometry composition of the films and CZTS adopts the kesterite type structure but with poor crystalline quality and possible existence of secondary phases, such as ZnS and Cu<sub>2</sub>SnS<sub>3</sub>. An annealing procedure in presence of elemental Sn and S was applied in order to improve the quality of the films. The annealing leads to an improvement of the crystalline quality of the thin films. The lattice parameters <em>a</em> and <em>c</em> of the annealed CZTS thin films were obtained as result of the Rietveld analysis of the gracing incidence X-ray diffraction data. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu2ZnSnS4 (CZTS) thin films were deposited on glass substrates by spray pyrolysis a fast, cost effective and vacuum-free method. X-ray fluorescence, Raman spectroscopy and grazing incidence X-ray diffraction, were used to characterize the obtained thin films. The analysis of these data showed a close to stoichiometry composition of the films and CZTS adopts the kesterite type structure but with poor crystalline quality and possible existence of secondary phases, such as ZnS and Cu2SnS3. An annealing procedure in presence of elemental Sn and S was applied in order to improve the quality of the films. The annealing leads to an improvement of the crystalline quality of the thin films. The lattice parameters a and c of the annealed CZTS thin films were obtained as result of the Rietveld analysis of the gracing incidence X-ray diffraction data. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200855" xmlns="http://purl.org/rss/1.0/"><title>Raman scattering and electric conductivity in Bi2(Te0.9Se0.1)3 thin films</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200855</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Raman scattering and electric conductivity in Bi2(Te0.9Se0.1)3 thin films</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Afet Kerimova, Nadir A. Abdullayev, Nadir M. Abdullayev, Khayala Aliguliyeva, Yong Gu Shim, Kazuki Wakita, Nazim Mamedov, Ayaz Bayramov, Sergey Nemov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:40.073574-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200855</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200855</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200855</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>High-grade Bi<sub>2</sub>(Te<sub>0.9</sub>Se<sub>0.1</sub>)<sub>3</sub> thin films have been obtained and studied by means of confocal Raman spectroscopy and electrical measurements. The annealed films demonstrate the Raman-active modes, <span class="math"><img alt="equation image" src="http://onlinelibrary.wiley.com/store/10.1002/pssc.201200855/asset/equation/tex2gif-ueqn-1.gif?v=1&amp;s=0d3872c537c78064312ce4b8f54b3a0f2214fe25" class="inlineGraphic"/></span>(61 cm<sup>–1</sup>) and <span class="math"><img alt="equation image" src="http://onlinelibrary.wiley.com/store/10.1002/pssc.201200855/asset/equation/tex2gif-ueqn-2.gif?v=1&amp;s=ab787b1ef6a88f8207fc38222bf37a74cdebd86e" class="inlineGraphic"/></span>(101 cm<sup>–1</sup>), which were not observed on as-grown samples. At densities of incident laser irradiation above 50 W/mm<sup>2</sup>, the infrared-active modes, (95 cm<sup>–1</sup>) and <span class="math"><img alt="equation image" src="http://onlinelibrary.wiley.com/store/10.1002/pssc.201200855/asset/equation/tex2gif-ueqn-3.gif?v=1&amp;s=b51a62b10c522bff0ead46a00455ff870c4cfb77" class="inlineGraphic"/></span>(120 cm<sup>–1</sup>), emerge in the Raman spectra. The last fact is ascribed to symmetry breaking that is resulting from the internal stress and structural deformations caused by local over-heating. The obtained Bi<sub>2</sub>(Te<sub>0.9</sub>Se<sub>0.1</sub>)<sub>3</sub> films manifest dielectric rather than metallic conductivity that is usually observed for bulky crystals of this sort. The variable range hopping conduction has been found to be dominant at temperatures below 100 K. Localization radius and density of localized states at Fermi level have been estimated. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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High-grade Bi2(Te0.9Se0.1)3 thin films have been obtained and studied by means of confocal Raman spectroscopy and electrical measurements. The annealed films demonstrate the Raman-active modes, $ A^1_{1g}$(61 cm–1) and $ E^2_g$(101 cm–1), which were not observed on as-grown samples. At densities of incident laser irradiation above 50 W/mm2, the infrared-active modes, (95 cm–1) and $ A^2_{1u}$(120 cm–1), emerge in the Raman spectra. The last fact is ascribed to symmetry breaking that is resulting from the internal stress and structural deformations caused by local over-heating. The obtained Bi2(Te0.9Se0.1)3 films manifest dielectric rather than metallic conductivity that is usually observed for bulky crystals of this sort. The variable range hopping conduction has been found to be dominant at temperatures below 100 K. Localization radius and density of localized states at Fermi level have been estimated. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200854" xmlns="http://purl.org/rss/1.0/"><title>Optical and electrical characterization of transparent Ga-doped ZnO thin films grown by atmospheric spray pyrolysis using diethylzinc solution</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200854</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Optical and electrical characterization of transparent Ga-doped ZnO thin films grown by atmospheric spray pyrolysis using diethylzinc solution</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Minoru Oshima, Akiko Ide, Akiko Mochihara, Kenji Yoshino, Yujin Tanikemoto, Kouji Toyota, Koichiro Inaba, Ken-ichi Haga, Toshio Naka, Koichi Tokudome</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:38.977286-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200854</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200854</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200854</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Non-doped and Ga-doped ZnO film on glass substrate were successfully grown at 150 °C by conventional atmospheric spray pyrolysis using diethylzinc-based solution. The samples had an average optical transmittance of more than 80% and were strongly <em>a</em>-axis orientated according to the results of optical transmittance and X-ray diffraction analysis, respectively. The n-type Ga-doped ZnO films had a low resistivity of 2.3 × 10<sup>–3</sup> Ωcm, a carrier concentration of 1.1 × 10<sup>20</sup> cm<sup>–3</sup> and a mobility of 10 cm<sup>2</sup> (Vs)<sup>–1</sup> at an optimal Ga content of 2 at% upon UV irradiation. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Non-doped and Ga-doped ZnO film on glass substrate were successfully grown at 150 °C by conventional atmospheric spray pyrolysis using diethylzinc-based solution. The samples had an average optical transmittance of more than 80% and were strongly a-axis orientated according to the results of optical transmittance and X-ray diffraction analysis, respectively. The n-type Ga-doped ZnO films had a low resistivity of 2.3 × 10–3 Ωcm, a carrier concentration of 1.1 × 1020 cm–3 and a mobility of 10 cm2 (Vs)–1 at an optimal Ga content of 2 at% upon UV irradiation. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200844" xmlns="http://purl.org/rss/1.0/"><title>From SnS and PbS towards complex sulfosalts: thin film growth and properties</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200844</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">From SnS and PbS towards complex sulfosalts: thin film growth and properties</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Sandra Lobe, Gerald Wagner, Klaus Bente</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:37.864715-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200844</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200844</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200844</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Polycrystalline thin films of Sn<sub>1−x</sub>Pb<sub>x</sub>S (0 ≤ x ≤ 0.5) were grown by multi-beam hot-wall deposition using SnS and PbS as source materials. Employing evaporation temperatures of T<sub>PbS</sub> ≈ 680 °C and T<sub>SnS</sub> ≈ 600 °C dendritic thin film growth appears due to high supersaturation at the substrate surface (T<sub>Substrate</sub> ≈ 240…375 °C). Therefore, both evaporation temperatures were lowered to T<sub>PbS</sub> ≈ 600 °C and T<sub>SnS</sub> ≈ 540 °C. Calculated and measured thin film compositions agree very well. The variation of the deposition time exhibits linear thin film growth. At the very beginning of film growth a well-distinct texture can be observed. If the growth proceeds (t &gt; 5 min) this texture disappears. As determined by transmission UV-Vis spectroscopy all Sn<sub>1−x</sub>Pb<sub>x</sub>S films show a direct allowed transition which bandgap energy increases with increasing x and an indirect allowed transition which bandgap energy decreases with increasing lead content. Decreasing film thickness leads to an increase of both bandgap energies. The obtained results were discussed with respect to a possible application as absorber material in solar cells. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Polycrystalline thin films of Sn1−xPbxS (0 ≤ x ≤ 0.5) were grown by multi-beam hot-wall deposition using SnS and PbS as source materials. Employing evaporation temperatures of TPbS ≈ 680 °C and TSnS ≈ 600 °C dendritic thin film growth appears due to high supersaturation at the substrate surface (TSubstrate ≈ 240…375 °C). Therefore, both evaporation temperatures were lowered to TPbS ≈ 600 °C and TSnS ≈ 540 °C. Calculated and measured thin film compositions agree very well. The variation of the deposition time exhibits linear thin film growth. At the very beginning of film growth a well-distinct texture can be observed. If the growth proceeds (t &gt; 5 min) this texture disappears. As determined by transmission UV-Vis spectroscopy all Sn1−xPbxS films show a direct allowed transition which bandgap energy increases with increasing x and an indirect allowed transition which bandgap energy decreases with increasing lead content. Decreasing film thickness leads to an increase of both bandgap energies. The obtained results were discussed with respect to a possible application as absorber material in solar cells. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200819" xmlns="http://purl.org/rss/1.0/"><title>Structure and optical properties of CdS:O thin films</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200819</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Structure and optical properties of CdS:O thin films</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Ryo Asaba, Kazuki Wakita, Atsushi Kitano, YongGu Shim, Nazim Mamedov, Ayaz Bayramov, Emil Huseynov, Ilham Hasanov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T05:10:36.46681-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200819</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200819</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200819</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We have studied structure and optical properties of CdS:O thin films deposited on soda lime glass substrates by rf magnetron sputtering in the atmosphere of oxygen/argon gases. According to X-ray diffraction and confocal Raman scattering data, the films deposited under oxygen partial pressure below 3% show crystalline structure of CdS. On the other hand, X-ray diffraction, confocal Raman scattering, TEM (transmission electron microscopy) and XPS (X-ray photoelectron spectroscopy) data are indicative of amorphization, nano-crystallization, and inclusion of CdO<sub>2</sub> in CdS:O thin films obtained under oxygen partial pressure of 5%. The last films have shown significantly increased transmittance in a spectral range above the energy gap of CdS. The origin of this transmittance is discussed by taking into account redistribution of electronic density-of-states in amorphous phase, quantum size effect and contribution of CdO<sub>2</sub>. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We have studied structure and optical properties of CdS:O thin films deposited on soda lime glass substrates by rf magnetron sputtering in the atmosphere of oxygen/argon gases. According to X-ray diffraction and confocal Raman scattering data, the films deposited under oxygen partial pressure below 3% show crystalline structure of CdS. On the other hand, X-ray diffraction, confocal Raman scattering, TEM (transmission electron microscopy) and XPS (X-ray photoelectron spectroscopy) data are indicative of amorphization, nano-crystallization, and inclusion of CdO2 in CdS:O thin films obtained under oxygen partial pressure of 5%. The last films have shown significantly increased transmittance in a spectral range above the energy gap of CdS. The origin of this transmittance is discussed by taking into account redistribution of electronic density-of-states in amorphous phase, quantum size effect and contribution of CdO2. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200795" xmlns="http://purl.org/rss/1.0/"><title>Thin film formation of EuGa2S4 by rf sputtering and improvement of film transmittance</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200795</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Thin film formation of EuGa2S4 by rf sputtering and improvement of film transmittance</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Minoru Dohi</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T03:10:20.812493-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200795</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200795</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200795</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Eu<sub>x</sub>Ca<sub>1–x</sub>Ga<sub>2</sub>S<sub>4</sub> is one of the phosphors with high luminescence quantum efficiency. It has high optical gain due to less concentration quenching for Eu centre. Production of EuGa<sub>2</sub>S<sub>4</sub> film with smooth surface would lead to a possible construction of surface emitting lasers. We prepared films by sputtering with EuGa<sub>2</sub>S<sub>4</sub> target. The EuGa<sub>2</sub>S<sub>4</sub> films deposited on the substrates heated at 550–640 °C had the surfaces smoother than that of films post-annealed at 800–900 °C. The Eu<sub>3</sub>Ga<sub>5</sub>O<sub>12</sub> films were deposited on the substrates heated at 660–800 °C. The Eu<sub>3</sub>Ga<sub>5</sub>O<sub>12</sub> films, which were transparent and colourless, showed no photoluminescence and had smooth surfaces. The films were deposited on the cooled substrate for 30 min and sequentially deposited on the substrate heated at 640–700 °C for 10–30 min. The films, which consisted of two layers, EuGa<sub>2</sub>S<sub>4</sub> and Eu<sub>3</sub>Ga<sub>5</sub>O<sub>12</sub>, show high transmittances and exhibited yellow green emission. The films have the possibility to be applied to the laser. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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EuxCa1–xGa2S4 is one of the phosphors with high luminescence quantum efficiency. It has high optical gain due to less concentration quenching for Eu centre. Production of EuGa2S4 film with smooth surface would lead to a possible construction of surface emitting lasers. We prepared films by sputtering with EuGa2S4 target. The EuGa2S4 films deposited on the substrates heated at 550–640 °C had the surfaces smoother than that of films post-annealed at 800–900 °C. The Eu3Ga5O12 films were deposited on the substrates heated at 660–800 °C. The Eu3Ga5O12 films, which were transparent and colourless, showed no photoluminescence and had smooth surfaces. The films were deposited on the cooled substrate for 30 min and sequentially deposited on the substrate heated at 640–700 °C for 10–30 min. The films, which consisted of two layers, EuGa2S4 and Eu3Ga5O12, show high transmittances and exhibited yellow green emission. The films have the possibility to be applied to the laser. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200759" xmlns="http://purl.org/rss/1.0/"><title>Steps towards removing some obstacles of industrialization of CIGS solar cells</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200759</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Steps towards removing some obstacles of industrialization of CIGS solar cells</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Huey-Liang Hwang, Bae-Heng Tseng, Letha Ayra Jagadhamma, Yafei Zhang</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T03:10:07.577992-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200759</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200759</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200759</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Fundamental obstacles such as low production yields, non-reproducibility, and non-uniformity over large area are encountered in the commercialization of copper indium gallium (di) selenide (CIGS) solar cell. The precise control and manipulation of the thin film's local chemical compositional distribution during production is particularly difficult. In this paper, we develop a concept of metal organic (MO) sputtering using metal organic precursor in which the film compositions could be fine-tuned and tailored according to programmed intelligent material and device design. An essential feedback control of the film compositions using optical spectroscopy is crucial. Moreover, the addition of sulfur to enlarge the band gap of CIGS film is indispensable to improve the cell efficiency. We are also developing the chemical sulfurization technique, in which the sulfur and selenium atoms are interchanged in solution at room temperature and large band gap copper indium gallium sulfur-selenide (CIGSS) films can be obtained. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Fundamental obstacles such as low production yields, non-reproducibility, and non-uniformity over large area are encountered in the commercialization of copper indium gallium (di) selenide (CIGS) solar cell. The precise control and manipulation of the thin film's local chemical compositional distribution during production is particularly difficult. In this paper, we develop a concept of metal organic (MO) sputtering using metal organic precursor in which the film compositions could be fine-tuned and tailored according to programmed intelligent material and device design. An essential feedback control of the film compositions using optical spectroscopy is crucial. Moreover, the addition of sulfur to enlarge the band gap of CIGS film is indispensable to improve the cell efficiency. We are also developing the chemical sulfurization technique, in which the sulfur and selenium atoms are interchanged in solution at room temperature and large band gap copper indium gallium sulfur-selenide (CIGSS) films can be obtained. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200813" xmlns="http://purl.org/rss/1.0/"><title>Magnetic properties of shandite-type Co3Sn2S2-xSex</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200813</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Magnetic properties of shandite-type Co3Sn2S2-xSex</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yuki Sakai, Yoichi Kamihara, Masanori Matoba</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:45.414991-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200813</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200813</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200813</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We investigated the magnetic properties of polycrystalline Co<sub>3</sub>Sn<sub>2</sub>S<sub>2-<em>x</em></sub>Se<em><sub>x</sub></em> (0≤<em>x</em> ≤1.2) to ascertain the magnetism of the metallic ferromagnet Co<sub>3</sub>Sn<sub>2</sub>S<sub>2</sub>. In Co<sub>3</sub>Sn<sub>2</sub>S<sub>2-<em>x</em></sub>Se<em><sub>x</sub></em>, <em>T</em><sub>C</sub> and magnetization gradually decrease with increasing <em>x</em>, but there is no magnetic phase transition from ferromagnetic throughout the full range of composition. These results indicate that Se substitution effect on magnetism is small compared with In and Ni substitution. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We investigated the magnetic properties of polycrystalline Co3Sn2S2-xSex (0≤x ≤1.2) to ascertain the magnetism of the metallic ferromagnet Co3Sn2S2. In Co3Sn2S2-xSex, TC and magnetization gradually decrease with increasing x, but there is no magnetic phase transition from ferromagnetic throughout the full range of composition. These results indicate that Se substitution effect on magnetism is small compared with In and Ni substitution. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200814" xmlns="http://purl.org/rss/1.0/"><title>Hard X-ray photoemission study of the covalent-chain antiferromagnets TlFeS2 and TlFeSe2</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200814</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Hard X-ray photoemission study of the covalent-chain antiferromagnets TlFeS2 and TlFeSe2</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Kojiro Mimura, Satoru Motonami, YongGu Shim, Kazuki Wakita, Zakir Jahangirli, Oktay Alekperov, Nazim Mamedov, Hitoshi Sato, Yuki Utsumi, Shigenori Ueda, Kenya Shimada, Yukihiro Taguchi, Keisuke Kobayashi, Gustav Bihlmayer, Hirofumi Namatame, Masaki Taniguchi</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:44.194968-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200814</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200814</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200814</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Bulk electronic structures of covalent-chain antiferromagnets TlFeS<sub>2</sub> and TlFeSe<sub>2</sub> have been investigated by hard X-ray photoemission spectroscopy (HAXPES) and band calculations based on the full-potential linearized augmented plane wave method. Competition between localized and delocalized characters of Fe 3d electrons has been suggested by the slight discrepancies between valence-band HAXPES spectra and calculated density of states, as well as Fe 2p spectra with a broad charge-transfer satellite. It is assumed that this competition closely related to the crystallographic onedimensionality of these materials. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Bulk electronic structures of covalent-chain antiferromagnets TlFeS2 and TlFeSe2 have been investigated by hard X-ray photoemission spectroscopy (HAXPES) and band calculations based on the full-potential linearized augmented plane wave method. Competition between localized and delocalized characters of Fe 3d electrons has been suggested by the slight discrepancies between valence-band HAXPES spectra and calculated density of states, as well as Fe 2p spectra with a broad charge-transfer satellite. It is assumed that this competition closely related to the crystallographic onedimensionality of these materials. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300013" xmlns="http://purl.org/rss/1.0/"><title>0.4 J/10 ns/10 kHz-4 kW coherent beam combined laser using stimulated Brillouin scattering phase conjugation mirrors for industrial applications</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300013</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">0.4 J/10 ns/10 kHz-4 kW coherent beam combined laser using stimulated Brillouin scattering phase conjugation mirrors for industrial applications</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Hong Jin Kong, Sangwoo Park, Seongwoo Cha, Jom Sool Kim</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:43.150934-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300013</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300013</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300013</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A laser system that can produce 0.4 J/10 ns/10 kHz-4 kW using a coherent beam combination with stimulated Brillouin scattering phase conjugate mirrors (SBS-PCMs) is proposed. The 4 kW coherent beam combination laser system consists of a front-end system, a pre-amplifier module, a coherent beam divider/combiner, and 4 main amplifier modules. The front-end system produces 1064 nm @ 10 kHz laser pulses, and it is amplified by the pre-amplifier. After the pre-amplifier module, the laser beam is divided into 4 sub-beams. Each sub-beam is amplified by the main amplifier module in a double-pass configuration and reflected by SBS-PCMs. Sub-beams are combined by a coherent beam combiner, and the output of the total system is designed to be 4 kW. With this 4 kW laser module, high-speed 2D holographic laser processing will be utilized. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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A laser system that can produce 0.4 J/10 ns/10 kHz-4 kW using a coherent beam combination with stimulated Brillouin scattering phase conjugate mirrors (SBS-PCMs) is proposed. The 4 kW coherent beam combination laser system consists of a front-end system, a pre-amplifier module, a coherent beam divider/combiner, and 4 main amplifier modules. The front-end system produces 1064 nm @ 10 kHz laser pulses, and it is amplified by the pre-amplifier. After the pre-amplifier module, the laser beam is divided into 4 sub-beams. Each sub-beam is amplified by the main amplifier module in a double-pass configuration and reflected by SBS-PCMs. Sub-beams are combined by a coherent beam combiner, and the output of the total system is designed to be 4 kW. With this 4 kW laser module, high-speed 2D holographic laser processing will be utilized. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300014" xmlns="http://purl.org/rss/1.0/"><title>Fundamental investigations in orientation control process for anisotropic laser ceramics</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300014</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Fundamental investigations in orientation control process for anisotropic laser ceramics</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yoichi Sato, Jun Akiyama, Takunori Taira</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:40.845065-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300014</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300014</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300014</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We present theoretical studies on the orientation control of micro-domains in anisotropic laser ceramics. The direction of the crystal axis that is parallel to easy magnetization in each micro-domain can be aligned along the direction of the applied magnetic field via two steps of fabrication processes. In the first step the alignment is performed during the slip-casting under the magnetic field, where directions of primary particles are forced to align along the direction of easy magnetization. However, even though rare-earth trivalent ions doped into primary particles as luminous ions enhance their magnetic moment, the perfect alignment control is not always possible due to Brownian fluctuations by slurry solvent at this stage. The further orientation control can be processed by the preferential grain growth, where an adequate orientation distribution of primary articles in the casted green body is required for the nearly perfect alignment in sintered ceramics. Therefore, it is important for further improvements of anisotropic laser ceramics to find the orientation distribution of primary particles in the slurry, which is determined by the ratio between the anisotropic magnetic potential and the thermal fluctuations. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We present theoretical studies on the orientation control of micro-domains in anisotropic laser ceramics. The direction of the crystal axis that is parallel to easy magnetization in each micro-domain can be aligned along the direction of the applied magnetic field via two steps of fabrication processes. In the first step the alignment is performed during the slip-casting under the magnetic field, where directions of primary particles are forced to align along the direction of easy magnetization. However, even though rare-earth trivalent ions doped into primary particles as luminous ions enhance their magnetic moment, the perfect alignment control is not always possible due to Brownian fluctuations by slurry solvent at this stage. The further orientation control can be processed by the preferential grain growth, where an adequate orientation distribution of primary articles in the casted green body is required for the nearly perfect alignment in sintered ceramics. Therefore, it is important for further improvements of anisotropic laser ceramics to find the orientation distribution of primary particles in the slurry, which is determined by the ratio between the anisotropic magnetic potential and the thermal fluctuations. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300016" xmlns="http://purl.org/rss/1.0/"><title>Synthesis and properties of Yb:LuAG transparent ceramics</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300016</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Synthesis and properties of Yb:LuAG transparent ceramics</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Benxue Jiang, Xiao Lu, Yanping Zeng, Shuping Liu, Jiang Li, Wenbin Liu, Yun Shi, Yubai Pan</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:35.2347-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300016</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300016</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300016</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Yb<sup>3+</sup>-doped Lu<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (Yb:LuAG) transparent ceramics were fabricated by vacuum sintering and hot isostatic pressing(HIP) method. TEOS and Sc<sub>2</sub>O<sub>3</sub> were added as sintering aids by a high energy ball milling. Transparent nearly-fully dense samples with grain size of about tens of micrometers were obtained after 1820 °C sintering, while the grain size of HIP sample was only about several micrometers. The absorption spectra, emission spectra, and fluorescence life time of these transparent Yb:LuAG ceramics at room temperature have were measuredd. The absorption and emission cross-section of Yb:LuAG Ceramics at 937 nm and 1030 nm were 7.6×10<sup>–21</sup> and 23×10<sup>–21</sup>cm<sup>2</sup> which are much higher than those of Yb:YAG crystal. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Yb3+-doped Lu3Al5O12 (Yb:LuAG) transparent ceramics were fabricated by vacuum sintering and hot isostatic pressing(HIP) method. TEOS and Sc2O3 were added as sintering aids by a high energy ball milling. Transparent nearly-fully dense samples with grain size of about tens of micrometers were obtained after 1820 °C sintering, while the grain size of HIP sample was only about several micrometers. The absorption spectra, emission spectra, and fluorescence life time of these transparent Yb:LuAG ceramics at room temperature have were measuredd. The absorption and emission cross-section of Yb:LuAG Ceramics at 937 nm and 1030 nm were 7.6×10–21 and 23×10–21cm2 which are much higher than those of Yb:YAG crystal. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300021" xmlns="http://purl.org/rss/1.0/"><title>Fabrication of transparent ceramics by millimeter-wave sintering</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300021</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Fabrication of transparent ceramics by millimeter-wave sintering</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yury Bykov, Sergey Egorov, Anatoly Eremeev</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:31.017521-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300021</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300021</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300021</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The distinctive features of the millimeter-wave sintering which make a method appealing for fabrication of optical ceramics are discussed. Among them are the absence of high temperature resistive heaters and the problem of their service life, favorable for elimination of porosity the inverse temperature distribution inherent in the volumetric microwave heating, highly uniform distribution of the millimeter-wave energy in applicators allowing for the sintering of large-size articles. This paper reports the results of the research on fabrication of optically transparent ceramics of compositions Nd:Y<sub>2</sub>O<sub>3</sub>, Yb:YAG, and Yb:(LaY)<sub>2</sub>O<sub>3</sub> using a gyrotron-based set-up operating at frequency of 24 GHz. The green bodies of different compositions were compacted from powders produced by different methods: Nd:Y<sub>2</sub>O<sub>3</sub> from the powder synthesized by laser evaporation of the target, Yb:YAG from a mixture of commercial powders, Yb:(LaY)<sub>2</sub>O<sub>3</sub> from powder fabricated by self-propagating high-temperature synthesis. Laser oscillation was obtained from the sintered samples of all compositions. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The distinctive features of the millimeter-wave sintering which make a method appealing for fabrication of optical ceramics are discussed. Among them are the absence of high temperature resistive heaters and the problem of their service life, favorable for elimination of porosity the inverse temperature distribution inherent in the volumetric microwave heating, highly uniform distribution of the millimeter-wave energy in applicators allowing for the sintering of large-size articles. This paper reports the results of the research on fabrication of optically transparent ceramics of compositions Nd:Y2O3, Yb:YAG, and Yb:(LaY)2O3 using a gyrotron-based set-up operating at frequency of 24 GHz. The green bodies of different compositions were compacted from powders produced by different methods: Nd:Y2O3 from the powder synthesized by laser evaporation of the target, Yb:YAG from a mixture of commercial powders, Yb:(LaY)2O3 from powder fabricated by self-propagating high-temperature synthesis. Laser oscillation was obtained from the sintered samples of all compositions. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300022" xmlns="http://purl.org/rss/1.0/"><title>Experiments on Laguerre-Gaussian modes selection in ceramic lasers</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300022</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Experiments on Laguerre-Gaussian modes selection in ceramic lasers</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yu. Senatsky, J.-F. Bisson, J. Li, A. Shirakawa, M. Thirugnanasambandam, K. Ueda</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:25.850282-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300022</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300022</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300022</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A study on Laguerre-Gaussian (LG) modes selection in cw and pulsed Nd:YAG or Yb:YAG ceramic lasers pumped by diodes or an external laser source was carried out. Methods of scalar and vector LG modes selection from low to high orders, involving shaping of the pump profile, usage of intra-cavity lenses, uniaxial crystals and polarization selective mirrors, are considered. CCD camera images of beam profiles of hollow scalar <em>LG<sub>pm</sub></em> modes (<em>p</em>-radial, <em>m</em>-azimuth indices) of record high-orders and Bessel-like multi-ring modes with highly directional propagation properties are presented. CW and pulsed ceramic lasers with radially or azimuthally polarized LG vector modes of low and high orders are also demonstrated. Applications of the developed laser schemes and LG beams are discussed. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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A study on Laguerre-Gaussian (LG) modes selection in cw and pulsed Nd:YAG or Yb:YAG ceramic lasers pumped by diodes or an external laser source was carried out. Methods of scalar and vector LG modes selection from low to high orders, involving shaping of the pump profile, usage of intra-cavity lenses, uniaxial crystals and polarization selective mirrors, are considered. CCD camera images of beam profiles of hollow scalar LGpm modes (p-radial, m-azimuth indices) of record high-orders and Bessel-like multi-ring modes with highly directional propagation properties are presented. CW and pulsed ceramic lasers with radially or azimuthally polarized LG vector modes of low and high orders are also demonstrated. Applications of the developed laser schemes and LG beams are discussed. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300023" xmlns="http://purl.org/rss/1.0/"><title>Progress in fluoride laser ceramics</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300023</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Progress in fluoride laser ceramics</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Maxim E. Doroshenko, Alexey A. Demidenko, Pavel P. Fedorov, Evgeniy A. Garibin, Pavel E. Gusev, Helena Jelinkova, Vasiliy A. Konyshkin, Mikhail A. Krutov, Sergey V. Kuznetsov, Vyacheslav V. Osiko, Pavel A. Popov, Jan Shulc</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:30:20.547692-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300023</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300023</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300023</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A variety of Er<sup>3+</sup>-, Tm<sup>3+</sup>-, and Yb<sup>3+</sup>-activated CaF<sub>2</sub>-, SrF<sub>2</sub>-, (Ca, Sr)F<sub>2</sub>- and (Sr, Ba)F<sub>2</sub>-based fluoride laser ceramics have been prepared by the hot-forming technique. Lasing of the SrF<sub>2</sub>:Yb<sup>3+</sup>, (Ca, Sr)F<sub>2</sub>:Er<sup>3+</sup>, (Ca, Sr)F<sub>2</sub>:Tm<sup>3+</sup>, (Ba, Sr)F<sub>2</sub>:Tm<sup>3+</sup> and (Ba, Sr)F<sub>2</sub>:Yb<sup>3+</sup> specimens with diode pumping has been observed for the first time. Thermal conductivity data for the above fluorite-type laser materials are also presented and discussed. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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A variety of Er3+-, Tm3+-, and Yb3+-activated CaF2-, SrF2-, (Ca, Sr)F2- and (Sr, Ba)F2-based fluoride laser ceramics have been prepared by the hot-forming technique. Lasing of the SrF2:Yb3+, (Ca, Sr)F2:Er3+, (Ca, Sr)F2:Tm3+, (Ba, Sr)F2:Tm3+ and (Ba, Sr)F2:Yb3+ specimens with diode pumping has been observed for the first time. Thermal conductivity data for the above fluorite-type laser materials are also presented and discussed. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200800" xmlns="http://purl.org/rss/1.0/"><title>Fabrication of Cu2ZnSnSe4 thin films from an electrodeposited Cu-Zn-Sn-Se/Cu-Sn-Se bilayer</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200800</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Fabrication of Cu2ZnSnSe4 thin films from an electrodeposited Cu-Zn-Sn-Se/Cu-Sn-Se bilayer</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Wilman Septina, Shigeru Ikeda, Takashi Harada, Michio Matsumura</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:23:42.101937-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200800</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200800</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200800</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>In this study, a novel sequential electrodeposition of Cu-Zn-Sn-Se and Cu-Sn-Se layers was applied for fabrication of a Cu<sub>2</sub>ZnSnSe<sub>4</sub> (CZTSe) thin film. The desired Cu-Zn-Sn-Se/Cu-Sn-Se bilayer was obtained at a selected applied potential from electrolytes containing corresponding metal and selenium ions. Annealing of the bilayer film under argon (Ar) flow induced significant losses of Sn and Se components due probably to evaporation of the SnSe compound. Suppression of these losses could be realized by introduction of Se vapor during the annealing: as a result, a CZTSe thin film with an ideal Cu-poor/Zn-rich composition for solar cell application was obtained. The solar cell with a device with the structure of glass/Mo/CZTSe/CdS/ZnO/AZO derived from thus-obtained CZTSe film exhibited a conversion efficiency of 1.1%, while the device still possessed a significant leakage current and a high series resistance. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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In this study, a novel sequential electrodeposition of Cu-Zn-Sn-Se and Cu-Sn-Se layers was applied for fabrication of a Cu2ZnSnSe4 (CZTSe) thin film. The desired Cu-Zn-Sn-Se/Cu-Sn-Se bilayer was obtained at a selected applied potential from electrolytes containing corresponding metal and selenium ions. Annealing of the bilayer film under argon (Ar) flow induced significant losses of Sn and Se components due probably to evaporation of the SnSe compound. Suppression of these losses could be realized by introduction of Se vapor during the annealing: as a result, a CZTSe thin film with an ideal Cu-poor/Zn-rich composition for solar cell application was obtained. The solar cell with a device with the structure of glass/Mo/CZTSe/CdS/ZnO/AZO derived from thus-obtained CZTSe film exhibited a conversion efficiency of 1.1%, while the device still possessed a significant leakage current and a high series resistance. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200809" xmlns="http://purl.org/rss/1.0/"><title>Cu2ZnSn(S,Se)4 thin films prepared by thermal crystallization in S/Se atmosphere and their photovoltaic applications</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200809</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Cu2ZnSn(S,Se)4 thin films prepared by thermal crystallization in S/Se atmosphere and their photovoltaic applications</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">T. Yamaguchi, Y. Oka, S. Niiyama, T. Imanishi</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:23:40.950227-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200809</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200809</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200809</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu<sub>2</sub>ZnSn(S,Se)<sub>4</sub> thin films were prepared by annealing the Cu/Sn/Zn precursors in sulfur/selenium mixing atmosphere. From EPMA analysis, the S/(S+Se) mole ratio in the thin films increased with increasing the S/(S+Se) mole ratio in the sealed ampoule. XRD study showed that the thin films had a kesterite phase in Cu<sub>2</sub>ZnSn(S,Se)<sub>4</sub> and the a- and c-axis constants decreased with increasing the S/(S+Se) mole ratio in the thin films, following the usual linear Vegard behavior. Cu<sub>2</sub>ZnSn(S,Se)<sub>4</sub> thin film solar cells annealed in S/Se atmosphere with an addition of Sn demonstrated V<sub>oc</sub>=460 mV, I<sub>sc</sub>=6.99 mA/cm<sup>2</sup> and V<sub>oc</sub>=605 mV, I<sub>sc</sub>=5.53 mA/cm<sup>2</sup>. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu2ZnSn(S,Se)4 thin films were prepared by annealing the Cu/Sn/Zn precursors in sulfur/selenium mixing atmosphere. From EPMA analysis, the S/(S+Se) mole ratio in the thin films increased with increasing the S/(S+Se) mole ratio in the sealed ampoule. XRD study showed that the thin films had a kesterite phase in Cu2ZnSn(S,Se)4 and the a- and c-axis constants decreased with increasing the S/(S+Se) mole ratio in the thin films, following the usual linear Vegard behavior. Cu2ZnSn(S,Se)4 thin film solar cells annealed in S/Se atmosphere with an addition of Sn demonstrated Voc=460 mV, Isc=6.99 mA/cm2 and Voc=605 mV, Isc=5.53 mA/cm2. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200810" xmlns="http://purl.org/rss/1.0/"><title>Preparation of Cu2ZnSnSe4 thin films by selenization of precursor evaporated from Cu2ZnSnSe4 compound</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200810</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Preparation of Cu2ZnSnSe4 thin films by selenization of precursor evaporated from Cu2ZnSnSe4 compound</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">T. Yamaguchi, K. Kawamoto, S. Oura, S. Niiyama, T. Imanishi</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:23:39.901086-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200810</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200810</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200810</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cu<sub>2</sub>ZnSnSe<sub>4</sub> ingot was synthesized and then used as a precursor for selenization process in order to fabricate Cu<sub>2</sub>ZnSnSe<sub>4</sub> thin films. The thin films were prepared at each point A-F in our selenization process and their properties were investigated. Cu<sub>2</sub>ZnSnSe<sub>4</sub> ingot and thin films had a kesterite Cu<sub>2</sub>ZnSnSe<sub>4</sub> structure. From EPMA analysis and XRD studies, the mechanism of Cu<sub>2</sub>ZnSnSe<sub>4</sub> formation was discussed. Cu-Se phases were related to Cu<sub>2</sub>ZnSnSe<sub>4</sub> formation. Cu<sub>2</sub>ZnSnSe<sub>4</sub> may decompose to Sn-Se compound during the annealing process at 550 <sup>o</sup>C. Cu<sub>2</sub>ZnSnSe<sub>4</sub> thin film solar cells demonstrated V<sub>oc</sub>=300 mV, I<sub>sc</sub>=7.25 mA/cm<sup>2</sup>. The band gap energy of Cu<sub>2</sub>ZnSnSe<sub>4</sub> thin film determined from the QE spectra estimated to be approximately 1.04 eV. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cu2ZnSnSe4 ingot was synthesized and then used as a precursor for selenization process in order to fabricate Cu2ZnSnSe4 thin films. The thin films were prepared at each point A-F in our selenization process and their properties were investigated. Cu2ZnSnSe4 ingot and thin films had a kesterite Cu2ZnSnSe4 structure. From EPMA analysis and XRD studies, the mechanism of Cu2ZnSnSe4 formation was discussed. Cu-Se phases were related to Cu2ZnSnSe4 formation. Cu2ZnSnSe4 may decompose to Sn-Se compound during the annealing process at 550 oC. Cu2ZnSnSe4 thin film solar cells demonstrated Voc=300 mV, Isc=7.25 mA/cm2. The band gap energy of Cu2ZnSnSe4 thin film determined from the QE spectra estimated to be approximately 1.04 eV. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200812" xmlns="http://purl.org/rss/1.0/"><title>First principles calculations of electronic structures for orthorhombic and monoclinic Cu4SnS4</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200812</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">First principles calculations of electronic structures for orthorhombic and monoclinic Cu4SnS4</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yosuke Goto, Yoichi Kamihara, Masanori Matoba</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:23:38.813812-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200812</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200812</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200812</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Electronic structures of orthorhombic and monoclinic Cu<sub>4</sub>SnS<sub>4</sub>, which exhibit a first-order phase transition at 232 K, are demonstrated based on the generalized gradient approximation (GGA) of the density functional theory (DFT). The calculated band gap was 0.39 eV for orthorhombic phase, while that was not obtained for monoclinic one. These calculated results confirm monoclinic phase has smaller activation energy (<em>E</em><sub>a</sub>) than orthorhombic phase. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Electronic structures of orthorhombic and monoclinic Cu4SnS4, which exhibit a first-order phase transition at 232 K, are demonstrated based on the generalized gradient approximation (GGA) of the density functional theory (DFT). The calculated band gap was 0.39 eV for orthorhombic phase, while that was not obtained for monoclinic one. These calculated results confirm monoclinic phase has smaller activation energy (Ea) than orthorhombic phase. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200753" xmlns="http://purl.org/rss/1.0/"><title>Preliminary XAS investigations on some phases of the Cu-Sn-S system</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200753</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Preliminary XAS investigations on some phases of the Cu-Sn-S system</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Francesco Di Benedetto, Francesco d'Acapito, Ilaria Bencistà, Antonio De Luca, Gabriele Fornaciai, Silvia Frizzera, Massimo Innocenti, Giordano Montegrossi, Luca A. Pardi, Maurizio Romanelli</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:20:28.407308-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200753</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200753</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200753</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>X-ray absorption spectroscopy investigation has been carried out at the Cu K edge on synthetic materials belonging to the ternary Cu-Sn-S system. In particular, Cu<sub>3</sub>SnS<sub>4</sub> nanocrystalline powders, obtained through a solvothermal approach, and Cu<sub>4</sub>SnS<sub>4</sub> microcrystalline powders, obtained through standard solid state reactions, were investigated.</p></div>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>From the XANES spectra, Cu is confirmed to be monovalent in both samples, thus implying a complex mechanism to achieve charge balance in Cu<sub>3</sub>SnS<sub>4</sub>. In this sample, the Cu-S EXAFS distance is found surprisingly short, and this suggests that Cu ions could be shifted outside the barycentre of the tetrahedra. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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X-ray absorption spectroscopy investigation has been carried out at the Cu K edge on synthetic materials belonging to the ternary Cu-Sn-S system. In particular, Cu3SnS4 nanocrystalline powders, obtained through a solvothermal approach, and Cu4SnS4 microcrystalline powders, obtained through standard solid state reactions, were investigated.
From the XANES spectra, Cu is confirmed to be monovalent in both samples, thus implying a complex mechanism to achieve charge balance in Cu3SnS4. In this sample, the Cu-S EXAFS distance is found surprisingly short, and this suggests that Cu ions could be shifted outside the barycentre of the tetrahedra. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200796" xmlns="http://purl.org/rss/1.0/"><title>XPS depth profile strudy of CZTS thin films prepared by spray pyrolysis</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200796</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">XPS depth profile strudy of CZTS thin films prepared by spray pyrolysis</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Masami Aono, Koichiro Yoshitake, Hisashi Miyazaki</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-06T02:20:26.575354-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200796</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200796</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200796</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Uniformity of elements distribution in Cu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) thin films were analyzed using X-ray photoelectron spectroscopy (XPS) to improve of conversion efficiency on solar cells. The films were prepared from CuCl or CuCl<sub>2</sub>, ZnCl<sub>2</sub>, SnCl<sub>2</sub>, and thiourea by spray pyrolysis on quartz glass. The composition on surfaces of the as-grown CZTS films was Cu-poor and near stoichiometric compositions of Zn, Sn and S. In contrast to the surface, Cu-rich and Sn-poor compositions were obtained in the films. An existence of oxygen was observed on the film surface less than 20 nm. With increasing of thiourea concentration in the precursor, internal Cu composition, Cu/(Sn+Zn), was increased. S/metal ratio and Sn/Zn ratio in the films were less influenced by the thiourea concentration in the precursor solution. Cupper composition in the films was also affected a valence of Cu ion in the precursor. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Uniformity of elements distribution in Cu2ZnSnS4 (CZTS) thin films were analyzed using X-ray photoelectron spectroscopy (XPS) to improve of conversion efficiency on solar cells. The films were prepared from CuCl or CuCl2, ZnCl2, SnCl2, and thiourea by spray pyrolysis on quartz glass. The composition on surfaces of the as-grown CZTS films was Cu-poor and near stoichiometric compositions of Zn, Sn and S. In contrast to the surface, Cu-rich and Sn-poor compositions were obtained in the films. An existence of oxygen was observed on the film surface less than 20 nm. With increasing of thiourea concentration in the precursor, internal Cu composition, Cu/(Sn+Zn), was increased. S/metal ratio and Sn/Zn ratio in the films were less influenced by the thiourea concentration in the precursor solution. Cupper composition in the films was also affected a valence of Cu ion in the precursor. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300012" xmlns="http://purl.org/rss/1.0/"><title>Sintering and optical quality of highly transparent yb-doped yttrium lanthanum oxide ceramics</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300012</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Sintering and optical quality of highly transparent yb-doped yttrium lanthanum oxide ceramics</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Maxim Ivanov, Yury Kopylov, Valery Kravchenko, Sergey Zayats</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:27.375156-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300012</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300012</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300012</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>To produce highly transparent Yb-doped yttrium lanthanum oxide (Yb<sup>3+</sup>:(La<sub>x</sub>Y<sub>1–x</sub>)<sub>2</sub>O<sub>3</sub>) ceramics two original technologies were used: laser synthesis of nanopowder and pulsed magnetic compacting. Sintering of the compacts in vacuum 3×10<sup>–4</sup> Pa at 1600–1700 °C during 13 hours led to transparent ceramics fabrication. The ceramics with relative density higher than 99.99% and grain size about 40 µm were fabricated. Full transmittance of 1.8 mm thick Yb<sub>0,11</sub>La<sub>0,23</sub>Y<sub>1,66</sub>O<sub>3</sub> ceramics reaches 82.5%@800 nm. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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To produce highly transparent Yb-doped yttrium lanthanum oxide (Yb3+:(LaxY1–x)2O3) ceramics two original technologies were used: laser synthesis of nanopowder and pulsed magnetic compacting. Sintering of the compacts in vacuum 3×10–4 Pa at 1600–1700 °C during 13 hours led to transparent ceramics fabrication. The ceramics with relative density higher than 99.99% and grain size about 40 µm were fabricated. Full transmittance of 1.8 mm thick Yb0,11La0,23Y1,66O3 ceramics reaches 82.5%@800 nm. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300009" xmlns="http://purl.org/rss/1.0/"><title>Optical and mechanical properties of transparent polycrystalline MgAl2O4 spinel depending on SPS conditions</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300009</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Optical and mechanical properties of transparent polycrystalline MgAl2O4 spinel depending on SPS conditions</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Oleg Khasanov, Edgar Dvilis, Alexey Khasanov, Elena Polisadova, Artem Kachaev</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:26.520873-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300009</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300009</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300009</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Optical and mechanical properties of transparent ceramic MgAl<sub>2</sub>O<sub>4</sub> spinel versus SPS conditions have been investigated. Syntheses kinetics of MgAl<sub>2</sub>O<sub>4</sub> has been studied at different heating duration, pressure force. Behaviour of spinel transparency, density, elasto-plastic properties in depend on the mentioned terms has been studied. High transparency (72.6 % at wavelength of 555 nm) and high mechanical properties (fracture toughness of 2.4 MPa × m<sup>1/2</sup>, microhardness of 18.52 GPa, Young's modulus of 212 GPa) have been achieved by decreasing the sintering duration and optimization of the pressing force. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Optical and mechanical properties of transparent ceramic MgAl2O4 spinel versus SPS conditions have been investigated. Syntheses kinetics of MgAl2O4 has been studied at different heating duration, pressure force. Behaviour of spinel transparency, density, elasto-plastic properties in depend on the mentioned terms has been studied. High transparency (72.6 % at wavelength of 555 nm) and high mechanical properties (fracture toughness of 2.4 MPa × m1/2, microhardness of 18.52 GPa, Young's modulus of 212 GPa) have been achieved by decreasing the sintering duration and optimization of the pressing force. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300008" xmlns="http://purl.org/rss/1.0/"><title>Efficient 2.1-μm lasers based on Tm3+:Lu2O3 ceramics pumped by 800–nm laser diodes</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300008</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Efficient 2.1-μm lasers based on Tm3+:Lu2O3 ceramics pumped by 800–nm laser diodes</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">O. L. Antipov, A. A. Novikov, N. G. Zakharov, A. P. Zinoviev, H. Yagi, N. V. Sakharov, M. V. Kruglova, M. O. Marychev, O. N. Gorshkov, A. A. Lagatskii</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:25.553463-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300008</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300008</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300008</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Structural, optical and spectroscopic properties of Tm<sup>3+</sup>:Lu<sub>2</sub>O<sub>3</sub> ceramics were studied. CW laser operation at 2068 nm with an output power of up to 34 W and a slope efficiency of 44% was obtained. Q-switched ocsilation with a pulse duration of 100-150 ns and a repetition rate of 1-10 kHz was achieved. Passive mode locking was achieved using an ion-implanted InGaAsSb quantum-well based SESAM or single graphene layer. Transform-limited pulses as short as 180 fs are generated at 2076 nm with an average output power of 400 mW and a pulse repetition frequency of 121.2 MHz. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Structural, optical and spectroscopic properties of Tm3+:Lu2O3 ceramics were studied. CW laser operation at 2068 nm with an output power of up to 34 W and a slope efficiency of 44% was obtained. Q-switched ocsilation with a pulse duration of 100-150 ns and a repetition rate of 1-10 kHz was achieved. Passive mode locking was achieved using an ion-implanted InGaAsSb quantum-well based SESAM or single graphene layer. Transform-limited pulses as short as 180 fs are generated at 2076 nm with an average output power of 400 mW and a pulse repetition frequency of 121.2 MHz. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300007" xmlns="http://purl.org/rss/1.0/"><title>Optical properties and laser performance of Ho:LuAG ceramics</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300007</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Optical properties and laser performance of Ho:LuAG ceramics</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Hao Yang, Jian Zhang, Dewei Luo, Hui Lin, Hao Chen, Deyuan Shen, Dingyuan Tang</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:24.572645-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300007</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300007</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300007</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Lutetium aluminum garnet (LuAG) is a garnet isostructure similar to yttrium aluminum garnet (YAG). High optical quality of 1.0 mol% Ho<sup>3+</sup> doped LuAG transparent polycrystalline ceramics were fabricated successfully by reactive sintering method. The microstructures, optical properties and laser performance of the Ho:LuAG ceramics were investigated in this study. The in-line transmittance of Ho:LuAG transparent ceramics is higher than 84% at 2500 nm. The absorption coefficient of 1.0 mol% Ho:LuAG is 0.88 cm<sup>–1</sup> at 1906 nm and its absorption cross section is calculated to be 0.62×10<sup>–20</sup> cm<sup>2</sup>. The laser oscillation of Ho:LuAG transparent ceramic without coated was also firstly obtained in this study. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Lutetium aluminum garnet (LuAG) is a garnet isostructure similar to yttrium aluminum garnet (YAG). High optical quality of 1.0 mol% Ho3+ doped LuAG transparent polycrystalline ceramics were fabricated successfully by reactive sintering method. The microstructures, optical properties and laser performance of the Ho:LuAG ceramics were investigated in this study. The in-line transmittance of Ho:LuAG transparent ceramics is higher than 84% at 2500 nm. The absorption coefficient of 1.0 mol% Ho:LuAG is 0.88 cm–1 at 1906 nm and its absorption cross section is calculated to be 0.62×10–20 cm2. The laser oscillation of Ho:LuAG transparent ceramic without coated was also firstly obtained in this study. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300004" xmlns="http://purl.org/rss/1.0/"><title>Mode-locked Yb:LuAG ceramics laser</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300004</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Mode-locked Yb:LuAG ceramics laser</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Dewei Luo, Jian Zhang, Changwen Xu, Hui Lin, Hao Yang, Haiyong Zhu, Guodong Shao, Dingyuan Tang, Lingbing Kong</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:23.672828-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300004</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300004</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300004</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A diode-pumped Yb:LuAG ceramics laser was investigated. CW laser performance was achieved. Passively femtosecond mode-locked laser operation was also successfully realized by using a SESAM mirror. The mode-locked pulse duration as short as 650 fs was obtained with a maximum output power of 200 mW. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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A diode-pumped Yb:LuAG ceramics laser was investigated. CW laser performance was achieved. Passively femtosecond mode-locked laser operation was also successfully realized by using a SESAM mirror. The mode-locked pulse duration as short as 650 fs was obtained with a maximum output power of 200 mW. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300001" xmlns="http://purl.org/rss/1.0/"><title>High doping Nd:YAG transparent ceramics fabricated by solid-state reactive sintering</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300001</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">High doping Nd:YAG transparent ceramics fabricated by solid-state reactive sintering</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Jing Liu, Qiang Liu, Jiang Li, Xuewei Ba, Wenbin Liu, Huamin Kou, Benxue Jiang, Yubai Pan, Xiaonong Cheng, Jingkun Guo</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:22.458687-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201300001</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201300001</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201300001</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Nd:YAG transparent ceramics with different doping concentrations were fabricated by a solid-state reaction method and vacuum sintering. Powder mixture of α-Al<sub>2</sub>O<sub>3</sub>, Y<sub>2</sub>O<sub>3</sub>, and Nd<sub>2</sub>O<sub>3</sub> doped with tetraethoxysilane (TEOS) and MgO were sintered between 1500 <sub>o</sub>C and 1750 <sub>o</sub>C to examine the densification behavior in Nd:YAG ceramics. For the high doping 5 at%Nd:YAG transparent ceramics, the sintering kinetics and microstructure evolution were mainly discussed. It is found that the optimal sintering temperature for 5.0 at%Nd:YAG ceramics was at ∼1700 <sup>o</sup>C, and the in-line transmittance increased with the increase of holding time. The best specimen with the holding time of 30h achieved 82.2% in transmittance at 1064nm, whose average grain size was ∼15μm. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Nd:YAG transparent ceramics with different doping concentrations were fabricated by a solid-state reaction method and vacuum sintering. Powder mixture of α-Al2O3, Y2O3, and Nd2O3 doped with tetraethoxysilane (TEOS) and MgO were sintered between 1500 oC and 1750 oC to examine the densification behavior in Nd:YAG ceramics. For the high doping 5 at%Nd:YAG transparent ceramics, the sintering kinetics and microstructure evolution were mainly discussed. It is found that the optimal sintering temperature for 5.0 at%Nd:YAG ceramics was at ∼1700 oC, and the in-line transmittance increased with the increase of holding time. The best specimen with the holding time of 30h achieved 82.2% in transmittance at 1064nm, whose average grain size was ∼15μm. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200983" xmlns="http://purl.org/rss/1.0/"><title>The influence of HfO2 additives on the optical properties of Nd3+-doped Y2O3 ceramics</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200983</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">The influence of HfO2 additives on the optical properties of Nd3+-doped Y2O3 ceramics</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">V. V. Osipov, A. N. Orlov, R. N. Maksimov, V. V. Lisenkov, V. V. Platonov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:21.486759-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200983</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200983</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200983</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Transparent yttria ceramics were fabricated by sintering a mixture of 1 at.% Nd:Y<sub>2</sub>O<sub>3</sub> and HfO<sub>2</sub> nanopowders produced by laser synthesis method. The best transmittance was 80.96% at the wavelength of λ=1080 nm in 6 mol.% HfO<sub>2</sub> doped sample (1.5 mm thick). The additives of hafnium broaden both pumping and luminescence bands of Nd<sub>3+</sub> ion in yttria ceramics. The luminescence intensity of <sub>4</sub>F<sub>3/2</sub>→<sub>4</sub>I<sub>11/2</sub> transition was little affected by hafnium concentration. The effective lifetime of <sup>4</sup>F<sub>3/2</sub> level in Nd:Y<sub>2</sub>O<sub>3</sub> ceramics enhanced by 30% at 10 mol.% HfO<sub>2</sub> doping concentration and the decay kinetics of laser transition attains Förster's behavior. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Transparent yttria ceramics were fabricated by sintering a mixture of 1 at.% Nd:Y2O3 and HfO2 nanopowders produced by laser synthesis method. The best transmittance was 80.96% at the wavelength of λ=1080 nm in 6 mol.% HfO2 doped sample (1.5 mm thick). The additives of hafnium broaden both pumping and luminescence bands of Nd3+ ion in yttria ceramics. The luminescence intensity of 4F3/2→4I11/2 transition was little affected by hafnium concentration. The effective lifetime of 4F3/2 level in Nd:Y2O3 ceramics enhanced by 30% at 10 mol.% HfO2 doping concentration and the decay kinetics of laser transition attains Förster's behavior. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200965" xmlns="http://purl.org/rss/1.0/"><title>Production of nanopowders of oxides by means of fiber and pulse-periodical CO2 lasers</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200965</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Production of nanopowders of oxides by means of fiber and pulse-periodical CO2 lasers</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">V. V. Osipov, V. V. Platonov, V. V. Lisenkov, A. V. Podkin, E. E. Zakharova</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-02T01:12:20.432169-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200965</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200965</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200965</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The results of investigation of YSZ, Nd:Y<sub>2</sub>O<sub>3</sub>, Al<sub>2</sub>O<sub>3</sub> nanopowder production by laser evaporation of oxide targets in a gas current are reported in present paper. For this purpose we used the pulse-periodical CO<sub>2</sub> laser and the continuous fiber ytterbium laser with 550 W and 600 W radiation mean power accordingly. The powders obtained by these lasers, consisted of weakly agglomerated spherical nanopartices (≥ 99 wt%), and ≤ 1 wt% of micron sized particles (drops and target fragments). Nanoparticles from various oxides produced by CO<sub>2</sub> laser in atmospheric pressure air had close average sizes (10÷16 nm). The productivity of nanopowder synthesis by CO<sub>2</sub> laser from YSZ 1%Nd:Y<sub>2</sub>O<sub>3</sub>, 1%Nd:Y<sub>2</sub>O<sub>3</sub>, Al<sub>2</sub>O<sub>3</sub>, and CeGdO was 23 g/hour, 29 g/hour, 24 g/hour and 80 g/hour, respectively. Unlike CO<sub>2</sub> laser the deep melting mode is realized during evaporation of 1%Nd:Y<sub>2</sub>O<sub>3</sub> and Al<sub>2</sub>O<sub>3</sub> targets by fiber laser. The crater depth increases up to 300–1000 μm in this mode. As a result, the target surface became very irregular and productivity of nanopowder synthesis was less, than in the case of CO<sub>2</sub> laser. To reduce the effect of deep melting the evaporation of a target has been investigated experimentally and theoretically. As a result of our investigations we have obtained 1%Nd:Y<sub>2</sub>O<sub>3</sub> nanopowder with specific surface of 70 m<sup>2</sup>/g and productivity of 23 g/hour at air pressure 70 kPa. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The results of investigation of YSZ, Nd:Y2O3, Al2O3 nanopowder production by laser evaporation of oxide targets in a gas current are reported in present paper. For this purpose we used the pulse-periodical CO2 laser and the continuous fiber ytterbium laser with 550 W and 600 W radiation mean power accordingly. The powders obtained by these lasers, consisted of weakly agglomerated spherical nanopartices (≥ 99 wt%), and ≤ 1 wt% of micron sized particles (drops and target fragments). Nanoparticles from various oxides produced by CO2 laser in atmospheric pressure air had close average sizes (10÷16 nm). The productivity of nanopowder synthesis by CO2 laser from YSZ 1%Nd:Y2O3, 1%Nd:Y2O3, Al2O3, and CeGdO was 23 g/hour, 29 g/hour, 24 g/hour and 80 g/hour, respectively. Unlike CO2 laser the deep melting mode is realized during evaporation of 1%Nd:Y2O3 and Al2O3 targets by fiber laser. The crater depth increases up to 300–1000 μm in this mode. As a result, the target surface became very irregular and productivity of nanopowder synthesis was less, than in the case of CO2 laser. To reduce the effect of deep melting the evaporation of a target has been investigated experimentally and theoretically. As a result of our investigations we have obtained 1%Nd:Y2O3 nanopowder with specific surface of 70 m2/g and productivity of 23 g/hour at air pressure 70 kPa. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.200900117" xmlns="http://purl.org/rss/1.0/"><title>Numerical analysis of light elements transport in a unidirectional solidification furnace</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.200900117</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Numerical analysis of light elements transport in a unidirectional solidification furnace</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Koichi Kakimoto, Bing Gao, Satoshi Nakano</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2010-11-15T04:22:05.648279-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.200900117</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.200900117</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.200900117</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Quantitative study of light elements such as carbon and oxygen in multi-crystalline silicon for solar cells is required to grow crystals with high quality. The transport of both carbon and oxygen is one of the critical issues to increase efficiency of solar cells made of silicon materials. Concentrations of carbon and oxygen in a furnace affect each others, therefore it is important to control mass transfer of carbon and oxygen in a furnace. Numerical calculation with a chemical reaction between carbon and oxygen was carried out to study how both light impurities are incorporated into crystals through the melt and gas during solidification process. The effects of flow rate and pressure on the impurities were examined. An increase in the flow rate can reduce both carbon and oxygen impurities in the crystal, though the reduction of carbon is more obvious. An increase in gas pressure can also obviously reduce the oxygen impurity but has only a small effect on the carbon impurity (© 2010 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Quantitative study of light elements such as carbon and oxygen in multi-crystalline silicon for solar cells is required to grow crystals with high quality. The transport of both carbon and oxygen is one of the critical issues to increase efficiency of solar cells made of silicon materials. Concentrations of carbon and oxygen in a furnace affect each others, therefore it is important to control mass transfer of carbon and oxygen in a furnace. Numerical calculation with a chemical reaction between carbon and oxygen was carried out to study how both light impurities are incorporated into crystals through the melt and gas during solidification process. The effects of flow rate and pressure on the impurities were examined. An increase in the flow rate can reduce both carbon and oxygen impurities in the crystal, though the reduction of carbon is more obvious. An increase in gas pressure can also obviously reduce the oxygen impurity but has only a small effect on the carbon impurity (© 2010 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201390008" xmlns="http://purl.org/rss/1.0/"><title>Cover Picture: Phys. Status Solidi C 5/2013</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201390008</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Cover Picture: Phys. Status Solidi C 5/2013</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-21T06:51:16.467861-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201390008</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201390008</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201390008</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Cover Picture</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[<a title="Link to full-size graphical abstract" class="figZoom" href="http://onlinelibrary.wiley.com/store/10.1002/pssc.201390008/asset/image_m/mcontent01.gif?v=1&amp;s=d67f7a8835a00a4c17445d40ea24c70857eb49e7" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><img alt="Thumbnail image of graphical abstract" title="Thumbnail image of graphical abstract" src="http://onlinelibrary.wiley.com/store/10.1002/pssc.201390008/asset/image_n/ncontent01.gif?v=1&amp;s=86a9007b416e9ffdfabe4306ae8ca12d4cd686c8"/></a>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A triple quantum dot containing three electrons is a versatile solid-state system allowing different tuneable qubits by choosing different pairs of the three-spin levels. S. Studenikin, G. Aers, G. Granger, L. Gaudreau, A. Kam, P. Zawadzki, Z. R. Wasilewski, and A. Sachrajda in their paper on pp. 752–755 demonstrate that disparate qubits and more complex entities can be realized by optimizing the manipulation pulses. The cover figure demonstrates the situation when different pure qubits |1〉 ⟷ |2〉 (blue arrows on the left top inset and the lowest right bottom inset) and |2〉 ⟷ |3〉 (green arrows and the upper right inset) can be realized experimentally, or where all three quantum levels are involved in a coherent process (recently predicted theoretically by Särkkä and Harju [New J. Phys. <b>13</b>, 043010-09 (2011).]). This situation can be considered as a solid-state qutrit – “a unit of quantum information that can exist in three possible states” (wikipedia).</p></div>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><!--Unmatched element: w:blockFixed--></div>
]]></content:encoded><description>A triple quantum dot containing three electrons is a versatile solid-state system allowing different tuneable qubits by choosing different pairs of the three-spin levels. S. Studenikin, G. Aers, G. Granger, L. Gaudreau, A. Kam, P. Zawadzki, Z. R. Wasilewski, and A. Sachrajda in their paper on pp. 752–755 demonstrate that disparate qubits and more complex entities can be realized by optimizing the manipulation pulses. The cover figure demonstrates the situation when different pure qubits |1〉 ⟷ |2〉 (blue arrows on the left top inset and the lowest right bottom inset) and |2〉 ⟷ |3〉 (green arrows and the upper right inset) can be realized experimentally, or where all three quantum levels are involved in a coherent process (recently predicted theoretically by Särkkä and Harju [New J. Phys. 13, 043010-09 (2011).]). This situation can be considered as a solid-state qutrit – “a unit of quantum information that can exist in three possible states” (wikipedia).






</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201390009" xmlns="http://purl.org/rss/1.0/"><title>Issue Information: Phys. Status Solidi C 5/2013</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201390009</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Issue Information: Phys. Status Solidi C 5/2013</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-21T06:51:16.467861-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201390009</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201390009</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201390009</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Issue Information</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">n/a</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[]]></content:encoded><description/></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201360162" xmlns="http://purl.org/rss/1.0/"><title>Contents: Phys. Status Solidi C 5/2013</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201360162</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Contents: Phys. Status Solidi C 5/2013</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-21T06:51:16.467861-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201360162</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201360162</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201360162</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contents</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">713</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">717</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[]]></content:encoded><description/></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201360163" xmlns="http://purl.org/rss/1.0/"><title>Compound Semiconductors</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201360163</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Compound Semiconductors</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Sanjay Krishna, Elena Plis, Pallab Bhattacharya, Diana Huffaker</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-21T06:51:16.467861-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201360163</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201360163</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201360163</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Preface</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">719</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">725</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The present issue of <em>physica status solidi</em> contains papers presented at the 39th International Symposium on Compound Semiconductors (ISCS 2012) held in Santa Barbara on the UCSB campus, August 27–30, 2012. ISCS 2012 was colocated with the 24th International Conference on Indium Phosphide and Related Materials (IPRM 2012) during Compound Semiconductor Week (CSW 2012).</p></div>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>CSW 2012 was kicked-off with a joint plenary session. The four distinguished plenary speakers and the titles of their talks were William Deal, <em>THz Integrated Circuits</em>; John Geisz, <em>III–V Semiconductors for High-efficiency Multijunction Photovoltaics</em>; Andrew Shields, <em>Semiconductor Devices for Quantum Information Applications</em>; Marc A. Taubenblatt, <em>Optical Interconnects for Computer-com</em>. The opening session was followed by invited talks, contributed oral presentations, and poster presentations in both ISCS and IPRM. Also included in the technical program were two short courses and a rump session organized by IPRM.</p></div>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The week also included an awards session, an excursion to downtown Santa Barbara with wine tasting and the conference barbeque on Goleta beach.</p></div>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We extend our sincere thanks and appreciation to members of the Program Committees for their tireless efforts in assembling a high quality technical program and to members of the International Steering Committees and the UCSB Committee on Local Arrangements for their help. We also thank the exhibitors for their participation and support and gratefully acknowledge the support provided by the Office of Naval Research. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The present issue of physica status solidi contains papers presented at the 39th International Symposium on Compound Semiconductors (ISCS 2012) held in Santa Barbara on the UCSB campus, August 27–30, 2012. ISCS 2012 was colocated with the 24th International Conference on Indium Phosphide and Related Materials (IPRM 2012) during Compound Semiconductor Week (CSW 2012).
CSW 2012 was kicked-off with a joint plenary session. The four distinguished plenary speakers and the titles of their talks were William Deal, THz Integrated Circuits; John Geisz, III–V Semiconductors for High-efficiency Multijunction Photovoltaics; Andrew Shields, Semiconductor Devices for Quantum Information Applications; Marc A. Taubenblatt, Optical Interconnects for Computer-com. The opening session was followed by invited talks, contributed oral presentations, and poster presentations in both ISCS and IPRM. Also included in the technical program were two short courses and a rump session organized by IPRM.
The week also included an awards session, an excursion to downtown Santa Barbara with wine tasting and the conference barbeque on Goleta beach.
We extend our sincere thanks and appreciation to members of the Program Committees for their tireless efforts in assembling a high quality technical program and to members of the International Steering Committees and the UCSB Committee on Local Arrangements for their help. We also thank the exhibitors for their participation and support and gratefully acknowledge the support provided by the Office of Naval Research. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200650" xmlns="http://purl.org/rss/1.0/"><title>Estimation of effective mass and subbands in multi-quantum wells using polarized light irradiation</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200650</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Estimation of effective mass and subbands in multi-quantum wells using polarized light irradiation</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">K. Tanaka, N. Happo, M. Fujiwara, N. Kotera</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-27T04:11:11.876674-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200650</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200650</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200650</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">727</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">731</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Nonparabolic nature of optical interband transitions of multi-quantum wells structure is important for related device designs. The optical interband transitions of In<sub>0.53</sub>Ga<sub>0.47</sub>As/In<sub>0.52</sub>Al<sub>0.48</sub>As MQWs including 20-nm-wide well clearly appeared on photocurrent spectra with polarized light source. The nonparabolic nature of conduction subbands was decided from experimental interband transitions. The electron effective mass smoothly increased from 0.041 m<sub>0</sub> to 0.07 m<sub>0</sub> in the conduction quantum well. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Nonparabolic nature of optical interband transitions of multi-quantum wells structure is important for related device designs. The optical interband transitions of In0.53Ga0.47As/In0.52Al0.48As MQWs including 20-nm-wide well clearly appeared on photocurrent spectra with polarized light source. The nonparabolic nature of conduction subbands was decided from experimental interband transitions. The electron effective mass smoothly increased from 0.041 m0 to 0.07 m0 in the conduction quantum well. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200611" xmlns="http://purl.org/rss/1.0/"><title>MOVPE growth for photodiodes in 2.5 µm region with InGaAs/GaAsSb type-II quantum wells</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200611</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">MOVPE growth for photodiodes in 2.5 µm region with InGaAs/GaAsSb type-II quantum wells</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Kei Fujii, Takashi Ishizuka, Youichi Nagai, Yasuhiro Iguchi, Katsushi Akita</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:10:32.36009-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200611</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200611</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200611</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">732</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">735</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Low dark current photodiodes (PDs) in the short wavelength infrared (SWIR) region over 1.7 µm are expected to be used for many applications. InGaAs/GaAsSb type-II quantum well (QW) structures are considered to be attractive material systems for realizing low dark current PDs, owing to lattice-matching to InP substrates. In this report, we describe the successful operation of pin-PDs with InGaAs/GaAsSb QWs with InP capping layers grown by metal-organic vapor phase epitaxy (MOVPE). Distinct X-ray diffraction satellite peaks and emissions from type-II transition were observed. Electrical and optical characteristics of pin-PDs, such as dependence of responsivity on the number of QWs, were investigated. Dark current was 9.0 µA/cm<sup>2</sup> at 233 K and an external quantum efficiency (EQE) of 48% was obtained. These results indicate that it is possible to reduce the dark current of InGaAs/GaAsSb type-II PDs by using the InP capping layers grown by MOVPE. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Low dark current photodiodes (PDs) in the short wavelength infrared (SWIR) region over 1.7 µm are expected to be used for many applications. InGaAs/GaAsSb type-II quantum well (QW) structures are considered to be attractive material systems for realizing low dark current PDs, owing to lattice-matching to InP substrates. In this report, we describe the successful operation of pin-PDs with InGaAs/GaAsSb QWs with InP capping layers grown by metal-organic vapor phase epitaxy (MOVPE). Distinct X-ray diffraction satellite peaks and emissions from type-II transition were observed. Electrical and optical characteristics of pin-PDs, such as dependence of responsivity on the number of QWs, were investigated. Dark current was 9.0 µA/cm2 at 233 K and an external quantum efficiency (EQE) of 48% was obtained. These results indicate that it is possible to reduce the dark current of InGaAs/GaAsSb type-II PDs by using the InP capping layers grown by MOVPE. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200654" xmlns="http://purl.org/rss/1.0/"><title>Polarization dependent photocurrent spectroscopy for identification of quantum confined interband transitions in type-II InAs/GaSb superlattices</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200654</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Polarization dependent photocurrent spectroscopy for identification of quantum confined interband transitions in type-II InAs/GaSb superlattices</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Nutan Gautam, Ajit Vijay Barve, Sanjay Krishna</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-19T04:31:21.874425-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200654</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200654</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200654</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">736</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">739</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We report on the use of polarization sensitive photocurrent spectroscopy for identifying the participating transitions in type-II superlattices based on InAs/GaSb system. Prominent features in measured transverse magnetic and transverse electric photocurrent response on photodetectors have been analyzed to unambiguously predict the correct ordering of hole minibands as heavy and light hole minibands. Measurements carried out on both midwave infrared as well as long wave infrared superlattice detectors reveal the order of the participating valence minibands as: heavy-hole1, light-hole1and light-hole2, with the increasing energy. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We report on the use of polarization sensitive photocurrent spectroscopy for identifying the participating transitions in type-II superlattices based on InAs/GaSb system. Prominent features in measured transverse magnetic and transverse electric photocurrent response on photodetectors have been analyzed to unambiguously predict the correct ordering of hole minibands as heavy and light hole minibands. Measurements carried out on both midwave infrared as well as long wave infrared superlattice detectors reveal the order of the participating valence minibands as: heavy-hole1, light-hole1and light-hole2, with the increasing energy. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200624" xmlns="http://purl.org/rss/1.0/"><title>An accurate interband tunneling model for InAs/GaSb heterostructure devices</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200624</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">An accurate interband tunneling model for InAs/GaSb heterostructure devices</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Md. Itrat Bin Shams, Yi Xie, Yeqing Lu, Patrick Fay</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T08:10:46.962959-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200624</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200624</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200624</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">740</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">743</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A numerical model that accurately describes interband tunneling in backward diodes and broken-gap tunnel diode structures based on the InAs/GaSb material system is described. The model applies the transfer matrix method to discretized bias-dependent energy band profiles to calculate the transmission probability for tunneling. The model has been validated against experimental results, with good agreement in the current-voltage and curvature coefficient having been obtained for a range of hetero-structure backward diode and interband tunnel diode structures. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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A numerical model that accurately describes interband tunneling in backward diodes and broken-gap tunnel diode structures based on the InAs/GaSb material system is described. The model applies the transfer matrix method to discretized bias-dependent energy band profiles to calculate the transmission probability for tunneling. The model has been validated against experimental results, with good agreement in the current-voltage and curvature coefficient having been obtained for a range of hetero-structure backward diode and interband tunnel diode structures. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200777" xmlns="http://purl.org/rss/1.0/"><title>Noise characteristics of InAs/GaSb superlattice infrared photodiodes</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200777</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Noise characteristics of InAs/GaSb superlattice infrared photodiodes</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Andreas Wörl, Philipp Kleinow, Robert Rehm, Johannes Schmitz, Martin Walther</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T08:10:35.816044-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200777</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200777</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200777</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">744</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">747</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>A sophisticated noise measurement setup employing a switching unit to measure statistically relevant numbers of InAs/GaSb superlattice photodiodes has been developed. The noise current resolution limit of 20 fA Hz<sup>-1/2</sup> enables the characterization of focal plane array-sized InAs/GaSb superlattice homojunction photodiodes for the long-wavelength infrared at 77 K. To resolve midwavelength infrared photodiodes a junction area of about (400 µm)<sup>2</sup> is required. Without switching unit and by using a dedicated low noise amplifier, noise currents down to 2 fA Hz<sup>-1/2</sup> can be achieved, allowing the noise characterization of mid-wavelength photodiodes with smaller junction areas. With this setup long-wavelength and mid-wavelength InAs/GaSb superlattice photodiodes, with generation-recombination limited dark current behavior, are investigated at 77 K. The measured diode noise follows the theoretically predicted shot noise level within the white noise part of the spectra. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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A sophisticated noise measurement setup employing a switching unit to measure statistically relevant numbers of InAs/GaSb superlattice photodiodes has been developed. The noise current resolution limit of 20 fA Hz-1/2 enables the characterization of focal plane array-sized InAs/GaSb superlattice homojunction photodiodes for the long-wavelength infrared at 77 K. To resolve midwavelength infrared photodiodes a junction area of about (400 µm)2 is required. Without switching unit and by using a dedicated low noise amplifier, noise currents down to 2 fA Hz-1/2 can be achieved, allowing the noise characterization of mid-wavelength photodiodes with smaller junction areas. With this setup long-wavelength and mid-wavelength InAs/GaSb superlattice photodiodes, with generation-recombination limited dark current behavior, are investigated at 77 K. The measured diode noise follows the theoretically predicted shot noise level within the white noise part of the spectra. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200605" xmlns="http://purl.org/rss/1.0/"><title>(111) InAs/GaSb type-II strained layer superlattice material for high operating temperature detection</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200605</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">(111) InAs/GaSb type-II strained layer superlattice material for high operating temperature detection</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Elena Plis, Brianna Klein, Stephen Myers, Nutan Gautam, Sanjay Krishna</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:36.357556-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200605</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200605</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200605</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">748</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">751</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We report on the detailed radiometric characterization of the mid-wave infrared InAs/GaSb type-II strained layer superlattice detectors grown on GaSb (111) substrate. A red shift of 1.7 μm (at 295 K) was observed with respect to a similar detector grown on GaSb (100) substrate. We have measured, at 295 K and λ<sub>100% cut-off</sub> = 5.6 μm, a dark current density of 0.53 A/cm<sup>2</sup> (at -50 mV) and a Johnson noise limited D* of 8.5 x 10<sup>9</sup>Jones, which are superior values to state-of-the-art T2SL detectors with the same (pin) design grown on conventional GaSb (100) substrates and operating in a similar wavelength range. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We report on the detailed radiometric characterization of the mid-wave infrared InAs/GaSb type-II strained layer superlattice detectors grown on GaSb (111) substrate. A red shift of 1.7 μm (at 295 K) was observed with respect to a similar detector grown on GaSb (100) substrate. We have measured, at 295 K and λ100% cut-off = 5.6 μm, a dark current density of 0.53 A/cm2 (at -50 mV) and a Johnson noise limited D* of 8.5 x 109Jones, which are superior values to state-of-the-art T2SL detectors with the same (pin) design grown on conventional GaSb (100) substrates and operating in a similar wavelength range. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200655" xmlns="http://purl.org/rss/1.0/"><title>Coherent manipulation of three-spin states in a GaAs/AlGaAs triple dot device</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200655</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Coherent manipulation of three-spin states in a GaAs/AlGaAs triple dot device</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">S. Studenikin, G. Aers, G. Granger, L. Gaudreau, A. Kam, P. Zawadzki, Z. R. Wasilewski, A. Sachrajda</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T08:10:39.845834-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200655</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200655</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200655</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Invited Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">752</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">755</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>In this paper we describe our recent experiments on coherent manipulation of electron spin states formed in a highly tunable GaAs/AlGaAs triple quantum dot device. The coherent evolution of spin states is achieved by using fast pulses from an initialization point in the (201) charge configuration region of the stability diagram. We demonstrate the versatility of the triple dot system capable of tuning to different regimes controlled by the width of the (111) region and pulse parameters. In particular we observe Δ'<sub>1/2</sub>-Q<sub>3/2</sub> (analogue of S-T<sub>+</sub> in a double dot) and Δ'<sub>1/2</sub>-Δ<sub>1/2</sub> exchange driven oscillations from both sides of the stability diagram involving all three spins. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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In this paper we describe our recent experiments on coherent manipulation of electron spin states formed in a highly tunable GaAs/AlGaAs triple quantum dot device. The coherent evolution of spin states is achieved by using fast pulses from an initialization point in the (201) charge configuration region of the stability diagram. We demonstrate the versatility of the triple dot system capable of tuning to different regimes controlled by the width of the (111) region and pulse parameters. In particular we observe Δ'1/2-Q3/2 (analogue of S-T+ in a double dot) and Δ'1/2-Δ1/2 exchange driven oscillations from both sides of the stability diagram involving all three spins. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200675" xmlns="http://purl.org/rss/1.0/"><title>Photovoltaic operation of quantum dot quantum cascade detector with low photoconductive gain for midwave infrared photodetection</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200675</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Photovoltaic operation of quantum dot quantum cascade detector with low photoconductive gain for midwave infrared photodetection</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Ajit V. Barve, Sanjay Krishna</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:20:31.426858-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200675</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200675</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200675</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">756</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">760</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We demonstrate photovoltaic operation of midwave (MW) quantum dot infrared photodetector (QDIP) with conventional n-i-n geometry, with a quantum cascade design. Quantum dot quantum cascade detector (QD-QCD) provides zero bias operation with responsivity of 10 mA/W and detectivity of 9×10<sup>9</sup> cm.Hz<sup>1/2</sup>W<sup>-1</sup> at 77 K for f/2 optics. Measured photoconductive gain is below 0.4, which is difficult to obtain with the traditional QDIP architecture, and is highly attractive for focal plane array applications. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We demonstrate photovoltaic operation of midwave (MW) quantum dot infrared photodetector (QDIP) with conventional n-i-n geometry, with a quantum cascade design. Quantum dot quantum cascade detector (QD-QCD) provides zero bias operation with responsivity of 10 mA/W and detectivity of 9×109 cm.Hz1/2W-1 at 77 K for f/2 optics. Measured photoconductive gain is below 0.4, which is difficult to obtain with the traditional QDIP architecture, and is highly attractive for focal plane array applications. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200593" xmlns="http://purl.org/rss/1.0/"><title>Au-assisted growth of InAs nanowires on GaAs(111)B, GaAs(100), InP(111)B, InP(100) by MOVPE</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200593</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Au-assisted growth of InAs nanowires on GaAs(111)B, GaAs(100), InP(111)B, InP(100) by MOVPE</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">S. Murakami, H. Funayama, K. Shimomura, T. Waho</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-19T04:31:14.310619-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200593</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200593</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200593</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">761</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">764</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Au-assisted growth of InAs NWs by MOVPE growth was investigated. We will discuss the NWs characteristics on GaAs and InP substrate with (111)B and (100) orientation, and on the V/III ratio during the growth. We have observed the growth direction of NWs on each substrates and confirmed that the surface diffusion have relation to the diameter of NWs. In the GaAs (111)B substrate, the diameter and length of NWs were depended on the local density of NWs. Furthermore, the tapered NWs were decreased by lowering the V/III ratio. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Au-assisted growth of InAs NWs by MOVPE growth was investigated. We will discuss the NWs characteristics on GaAs and InP substrate with (111)B and (100) orientation, and on the V/III ratio during the growth. We have observed the growth direction of NWs on each substrates and confirmed that the surface diffusion have relation to the diameter of NWs. In the GaAs (111)B substrate, the diameter and length of NWs were depended on the local density of NWs. Furthermore, the tapered NWs were decreased by lowering the V/III ratio. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200623" xmlns="http://purl.org/rss/1.0/"><title>High quality strain-compensated multiple InAs/AlGaNAs quantum dot layers grown by MBE</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200623</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">High quality strain-compensated multiple InAs/AlGaNAs quantum dot layers grown by MBE</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Hong Ye, Mahdad Sadeghi, Yuxin Song, Zonghe Lai, Yi Gu, Shumin Wang</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T08:10:51.847943-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200623</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200623</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200623</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">765</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">768</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Intermediate band solar cells have attracted significant interest as a possible means of achieving high conversion efficiency. Under optimized growth parameters, we successfully achieve a high density of uniform InAs QDs grown on various matrixes by molecular beam epitaxy. Incorporating N atoms into GaAs and AlGaAs barriers effectively compensates the internal compressive strain and avoids formation of dislocations and defects. The 50 stacking of high density and uniform InAs QDs was demonstrated without detectable dislocations using 26 nm GaNAs as a barrier. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Intermediate band solar cells have attracted significant interest as a possible means of achieving high conversion efficiency. Under optimized growth parameters, we successfully achieve a high density of uniform InAs QDs grown on various matrixes by molecular beam epitaxy. Incorporating N atoms into GaAs and AlGaAs barriers effectively compensates the internal compressive strain and avoids formation of dislocations and defects. The 50 stacking of high density and uniform InAs QDs was demonstrated without detectable dislocations using 26 nm GaNAs as a barrier. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200674" xmlns="http://purl.org/rss/1.0/"><title>InGaAs/InP DHBTs with emitter and base defined through electron-beam lithography for reduced Ccb and increased RF cut-off frequency</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200674</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">InGaAs/InP DHBTs with emitter and base defined through electron-beam lithography for reduced Ccb and increased RF cut-off frequency</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Evan Lobisser, Johann C. Rode, Vibhor Jain, Han-Wei Chiang, Ashish Baraskar, William J. Mitchell, Brian J. Thibeault, Mark J. W. Rodwell, Miguel Urteaga, Dmitri Loubychev, Andrew Snyder, Ying Wu, Joel M. Fastenau, Amy W. K. Liu</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:20:37.456131-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200674</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200674</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200674</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">769</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">772</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>InGaAs/InP DHBTs are fabricated using electron-beam lithography to define the emitter and base mesas. Emitter mesas 150 nm wide, and base mesas with &lt; 25 nm misalignment to the emitter have been developed. Emitter contacts are prepared through blanket, refractory metal evaporation to obtain emitter contact resistivity<em> ρ<sub>ex</sub></em> = 2 Ω·µm<sup>2</sup>. This low record resistivity, combined with the narrow emitter and base mesas, enables device RF performance of simultaneous <em>f<sub>τ</sub></em> and <em>f<sub>max</sub></em> of 530 GHz and 750 GHz, respectively, at a power density of &gt; 40 mW/µm<sup>2</sup>. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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InGaAs/InP DHBTs are fabricated using electron-beam lithography to define the emitter and base mesas. Emitter mesas 150 nm wide, and base mesas with &lt; 25 nm misalignment to the emitter have been developed. Emitter contacts are prepared through blanket, refractory metal evaporation to obtain emitter contact resistivity ρex = 2 Ω·µm2. This low record resistivity, combined with the narrow emitter and base mesas, enables device RF performance of simultaneous fτ and fmax of 530 GHz and 750 GHz, respectively, at a power density of &gt; 40 mW/µm2. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200610" xmlns="http://purl.org/rss/1.0/"><title>InGaAs HEMTs with T-gate electrodes formed by multi-layer SiCN molds</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200610</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">InGaAs HEMTs with T-gate electrodes formed by multi-layer SiCN molds</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Tomohiro Yoshida, Kengo Kobayashi, Taiichi Otsuji, Tetsuya Suemitsu</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-18T04:11:32.470507-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200610</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200610</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200610</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">773</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">776</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We report a method to control the shape of T-gates precisely by using multi-layer SiCN molds. The SiCN molds consist of a series of SiCN thin films with gradually changed etching properties. The SiCN was deposited by plasma-enhanced chemical vapor deposition using hexamethyldisilazane (HMDS) vapor. An optimized deposition condition of SiCN molds enables us to achieve more precisely control in the T-gate shape such as the stem angle. The SiCN molds technique was applied to the fabrication of T-gates in InGaAs high electron mobility transistors (HEMTs). Two types of HEMTs using the SiCN molds with different deposition conditions were fabricated. The detail analysis of the HEMTs indicates that the difference in the parasitic gate delay and gate resistance reflects the T-gate shapes. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
]]></content:encoded><description>

We report a method to control the shape of T-gates precisely by using multi-layer SiCN molds. The SiCN molds consist of a series of SiCN thin films with gradually changed etching properties. The SiCN was deposited by plasma-enhanced chemical vapor deposition using hexamethyldisilazane (HMDS) vapor. An optimized deposition condition of SiCN molds enables us to achieve more precisely control in the T-gate shape such as the stem angle. The SiCN molds technique was applied to the fabrication of T-gates in InGaAs high electron mobility transistors (HEMTs). Two types of HEMTs using the SiCN molds with different deposition conditions were fabricated. The detail analysis of the HEMTs indicates that the difference in the parasitic gate delay and gate resistance reflects the T-gate shapes. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200621" xmlns="http://purl.org/rss/1.0/"><title>Modeling of Sb-heterostructure backward diode for millimeter- and submillimeter-wave detection</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200621</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Modeling of Sb-heterostructure backward diode for millimeter- and submillimeter-wave detection</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Parisa Yadranjee Aghdam, Huan Zhao</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:20:39.804458-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200621</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200621</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200621</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">777</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">781</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We present modeling of Sb-heterostructure backward tunneling diode (Sb-HBD) for high efficient millimeter- and submillimeter wave detection. The diode heterostructure is modeled and optimized using TCAD software implementing a non-local band-to-band tunneling model combining with the standard drift-diffusion model. The physical device model was found to be in good agreement with reported experimental results. InAsSb/AlSb/AlGaSb structures were proposed and simulated considering the material growth. The potential of the Sb-HBDs for high frequency operation applications is investigated. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We present modeling of Sb-heterostructure backward tunneling diode (Sb-HBD) for high efficient millimeter- and submillimeter wave detection. The diode heterostructure is modeled and optimized using TCAD software implementing a non-local band-to-band tunneling model combining with the standard drift-diffusion model. The physical device model was found to be in good agreement with reported experimental results. InAsSb/AlSb/AlGaSb structures were proposed and simulated considering the material growth. The potential of the Sb-HBDs for high frequency operation applications is investigated. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200592" xmlns="http://purl.org/rss/1.0/"><title>Extremely improved InP template and GaInAsP system growth on directly-bonded InP/SiO2-Si and InP/glass substrate</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200592</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Extremely improved InP template and GaInAsP system growth on directly-bonded InP/SiO2-Si and InP/glass substrate</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Keiichi Matsumoto, Tatsunori Makino, Katsuya Kimura, Kazuhiko Shimomura</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:10:33.637512-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200592</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200592</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200592</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">782</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">785</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We have developed an ultrathin InP template with low defect density on SiO<sub>2</sub>-Si and glass substrate by employing wet etching and wafer direct bonding technique. We have demonstrated epitaxial growth on these substrates and GaInAs/InP multiple quantum well layers were grown by low pressure metal-organic vapor-phase epitaxy. Photoluminescence measurements of the layers show that they are optically active and we have obtained almost the same intensity from these substrates compared to the InP substrate. These results may be attributed to improvement of InP template quality and should provide further improvements in device performance realized on SiO<sub>2</sub>-Si and glass substrate. And, these are promising results in terms of integration of InP-based several functional optical devices on SiO<sub>2</sub>-Si and glass substrate. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We have developed an ultrathin InP template with low defect density on SiO2-Si and glass substrate by employing wet etching and wafer direct bonding technique. We have demonstrated epitaxial growth on these substrates and GaInAs/InP multiple quantum well layers were grown by low pressure metal-organic vapor-phase epitaxy. Photoluminescence measurements of the layers show that they are optically active and we have obtained almost the same intensity from these substrates compared to the InP substrate. These results may be attributed to improvement of InP template quality and should provide further improvements in device performance realized on SiO2-Si and glass substrate. And, these are promising results in terms of integration of InP-based several functional optical devices on SiO2-Si and glass substrate. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200612" xmlns="http://purl.org/rss/1.0/"><title>AlGaAs anode heterojunction PIN diodes</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200612</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">AlGaAs anode heterojunction PIN diodes</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">T. Boles, J. Brogle, D. Hoag, D. Carlson</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-27T04:11:09.262987-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200612</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200612</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200612</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">786</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">789</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>This paper describes the development of a heterojunction AlGaAs/GaAs PIN diode as a revolutionary improvement as compared to the homojunction GaAs PIN diode commonly used in microwave systems for commercial and military applications. In a heterojunction device the injected carriers from the junction are confined by the bandgap discontinuity between the AlGaAs/GaAs layers. This confinement effectively reduces the series resistance within the I-region of a PIN diode. Simulations of both single and double heterojunction PIN diodes predict a significant improvement in the return loss and insertion loss as compared to an equivalent GaAs PIN structure. In particular, the single heterojunction PIN diode, when simulated at a bias of 10 mA, indicates a factor of two reduction in high frequency insertion loss. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
]]></content:encoded><description>

This paper describes the development of a heterojunction AlGaAs/GaAs PIN diode as a revolutionary improvement as compared to the homojunction GaAs PIN diode commonly used in microwave systems for commercial and military applications. In a heterojunction device the injected carriers from the junction are confined by the bandgap discontinuity between the AlGaAs/GaAs layers. This confinement effectively reduces the series resistance within the I-region of a PIN diode. Simulations of both single and double heterojunction PIN diodes predict a significant improvement in the return loss and insertion loss as compared to an equivalent GaAs PIN structure. In particular, the single heterojunction PIN diode, when simulated at a bias of 10 mA, indicates a factor of two reduction in high frequency insertion loss. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200609" xmlns="http://purl.org/rss/1.0/"><title>AlGaN/GaN MIS-gate HEMTs with SiCN gate stacks</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200609</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">AlGaN/GaN MIS-gate HEMTs with SiCN gate stacks</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">K. Kobayashi, M. Kano, T. Yoshida, R. Katayama, T. Matsuoka, T. Otsuji, T. Suemitsu</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T08:10:54.213654-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200609</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200609</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200609</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">790</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">793</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>This paper reports AlGaN/GaN metal-insulator-semiconductor (MIS)-gate high electron mobility transistors (HEMTs) with a SiCN gate stack deposited by plasma-enhanced chemical vapour deposition (PECVD) using hexamethyldisilazane (HMDS) vapor. A transconductance of 69 mS/mm and a current gain cutoff frequency (<em>f</em><sub><em>T</em></sub>) of 25 GHz are obtained for the SiCN MIS-HEMTs with a gate length of 0.3 µm. These performances are better than those of the Schottky-gate reference devices. To clarify the origin of these improvements, we verified the cleaning effect of hydrogen used as a carrier gas for HMDS during the PECVD of SiCN. The results indicate that the hydrogen annealing improves the drain current density and <em>f</em><sub><em>T</em></sub> as well as it suppresses the current collapse. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
]]></content:encoded><description>

This paper reports AlGaN/GaN metal-insulator-semiconductor (MIS)-gate high electron mobility transistors (HEMTs) with a SiCN gate stack deposited by plasma-enhanced chemical vapour deposition (PECVD) using hexamethyldisilazane (HMDS) vapor. A transconductance of 69 mS/mm and a current gain cutoff frequency (fT) of 25 GHz are obtained for the SiCN MIS-HEMTs with a gate length of 0.3 µm. These performances are better than those of the Schottky-gate reference devices. To clarify the origin of these improvements, we verified the cleaning effect of hydrogen used as a carrier gas for HMDS during the PECVD of SiCN. The results indicate that the hydrogen annealing improves the drain current density and fT as well as it suppresses the current collapse. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200620" xmlns="http://purl.org/rss/1.0/"><title>Role of bias conditions in the hot carrier degradation of AlGaN/GaN high electron mobility transistors</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200620</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Role of bias conditions in the hot carrier degradation of AlGaN/GaN high electron mobility transistors</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Shubhajit Mukherjee, Yevgeny Puzyrev, John Hinckley, Ronald D. Schrimpf, Daniel M. Fleetwood, Jasprit Singh, Sokrates T. Pantelides</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:20:41.234896-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200620</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200620</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200620</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">794</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">798</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The impacts of gate bias and device temperature on carrier energy distributions are reported for AlGaN/GaN High Electron Mobility Transistors. The lateral electric field and the average carrier energy are the highest at the end of gate on the gate-drain access side. The number of high energy carriers is the greatest in the semi-ON operating condition, with maximum energies exceeding the activation energy of defects in the AlGaN. There is a significant decrease in the number of very high energy carriers (greater than 2 eV) as the device temperature increases whereas the number of moderately energetic carriers (between 1 to 2 eV) is higher at elevated temperatures.(© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The impacts of gate bias and device temperature on carrier energy distributions are reported for AlGaN/GaN High Electron Mobility Transistors. The lateral electric field and the average carrier energy are the highest at the end of gate on the gate-drain access side. The number of high energy carriers is the greatest in the semi-ON operating condition, with maximum energies exceeding the activation energy of defects in the AlGaN. There is a significant decrease in the number of very high energy carriers (greater than 2 eV) as the device temperature increases whereas the number of moderately energetic carriers (between 1 to 2 eV) is higher at elevated temperatures.(© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200607" xmlns="http://purl.org/rss/1.0/"><title>Insulating behavior of interfaces in regrown Al0.23Ga0.77N/GaN double heterostructures on Al0.07Ga0.93N back-barrier templates</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200607</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Insulating behavior of interfaces in regrown Al0.23Ga0.77N/GaN double heterostructures on Al0.07Ga0.93N back-barrier templates</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">B. Reuters, H. Hahn, H. Behmenburg, M. Heuken, H. Kalisch, A. Vescan</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T08:10:55.595212-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200607</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200607</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200607</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">799</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">802</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>An important issue in multi-step epitaxial growth processes are the electrical characteristics of regrown interfaces. Here, we present a study on interface quality and its effect onto insulating behavior and scattering effects in planar transistors. A double heterostructure with an AlGaN/GaN high electron mobility transistor on top of an AlGaN back-barrier is used to assess electrical properties. Back-barrier templates were exposed to air for several days and subsequently treated by wet and dry chemical etching. A strong impact on leakage behaviour of the regrown interface was observed. Lateral leakage currents as low as 1x10<sup>–8</sup> A/mm are achieved with an optimized pre-treatment. Furthermore, under optimized conditions, the regrown GaN channel thickness is varied to investigate the effect of different distances between the two-dimensional electron gas (2DEG) and the regrown interface. Here, enhanced scattering mechanisms, probably due to ionized impurities, lead to a mobility drop of the 2DEG. A parasitic channel is observed, which indicates the presence of additional impurities at the regrown interface. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
]]></content:encoded><description>

An important issue in multi-step epitaxial growth processes are the electrical characteristics of regrown interfaces. Here, we present a study on interface quality and its effect onto insulating behavior and scattering effects in planar transistors. A double heterostructure with an AlGaN/GaN high electron mobility transistor on top of an AlGaN back-barrier is used to assess electrical properties. Back-barrier templates were exposed to air for several days and subsequently treated by wet and dry chemical etching. A strong impact on leakage behaviour of the regrown interface was observed. Lateral leakage currents as low as 1x10–8 A/mm are achieved with an optimized pre-treatment. Furthermore, under optimized conditions, the regrown GaN channel thickness is varied to investigate the effect of different distances between the two-dimensional electron gas (2DEG) and the regrown interface. Here, enhanced scattering mechanisms, probably due to ionized impurities, lead to a mobility drop of the 2DEG. A parasitic channel is observed, which indicates the presence of additional impurities at the regrown interface. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200603" xmlns="http://purl.org/rss/1.0/"><title>Improvement of the electrical properties of Al2O3/AlGaN/GaN MOSHFETs by gate-first process</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200603</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Improvement of the electrical properties of Al2O3/AlGaN/GaN MOSHFETs by gate-first process</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Eiji Miyazaki, Shigeru Kishimoto, Takashi Mizutani</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-19T04:31:19.988428-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200603</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200603</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200603</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">803</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">807</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We have studied “gate-first process” in the fabrication of the Al<sub>2</sub>O<sub>3</sub>/AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors (MOSHFETs) to improve the electrical properties of the MOSHFETs, where Al<sub>2</sub>O<sub>3</sub> gate oxide is deposited before ohmic contact alloying. The interface state density of the Al<sub>2</sub>O<sub>3</sub>/GaN MOS diodes fabricated by the gate-first process was more than one order of magnitude smaller than that of the diodes fabricated by the conventional “gate-last process” where Al<sub>2</sub>O<sub>3</sub> gate oxide was deposited after ohmic contact alloying. In addition, the saturation of the drain current at large gate voltages in the <em>I</em><sub>D</sub>-<em>V</em><sub>GS</sub> characteristics of the Al<sub>2</sub>O<sub>3</sub>/AlGaN/GaN MOSHFETs was relaxed and the maximum drain current was increased by employing the gate-first process. The hysteresis width of the <em>I</em><sub>D</sub>-<em>V</em><sub>GS</sub> curve of the MOSHFETs fabricated by the gate-first process was smaller than that of the devices fabricated by the gate-last process. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We have studied “gate-first process” in the fabrication of the Al2O3/AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors (MOSHFETs) to improve the electrical properties of the MOSHFETs, where Al2O3 gate oxide is deposited before ohmic contact alloying. The interface state density of the Al2O3/GaN MOS diodes fabricated by the gate-first process was more than one order of magnitude smaller than that of the diodes fabricated by the conventional “gate-last process” where Al2O3 gate oxide was deposited after ohmic contact alloying. In addition, the saturation of the drain current at large gate voltages in the ID-VGS characteristics of the Al2O3/AlGaN/GaN MOSHFETs was relaxed and the maximum drain current was increased by employing the gate-first process. The hysteresis width of the ID-VGS curve of the MOSHFETs fabricated by the gate-first process was smaller than that of the devices fabricated by the gate-last process. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200627" xmlns="http://purl.org/rss/1.0/"><title>Tensile strain-induced formation of micro-cracks for AlGaN/GaN heterostructures</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200627</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Tensile strain-induced formation of micro-cracks for AlGaN/GaN heterostructures</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Junji Kotani, Shuichi Tomabechi, Toyoo Miyajima, Norikazu Nakamura, Toshihide Kikkawa, Keiji Watanabe, Kenji Imanishi</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T08:10:41.480258-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200627</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200627</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200627</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">808</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">811</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>This paper investigated the effect of tensile strain in AlGaN barrier layer on the formation of micro-cracks at the surface of AlGaN/GaN HEMT structures. The Al<sub>0.2</sub>Ga<sub>0.8</sub>N/GaN HEMT structures were cooled down under N<sub>2</sub> + NH<sub>3</sub> and H<sub>2</sub> + NH<sub>3</sub> environments and high-density micro-cracks were found only for the latter case, indicating that hydrogen etching is essential for crack formation. On the other hand, no micro-cracks were observed even for H<sub>2</sub> + NH<sub>3</sub> cooling for thick AlGaN bulk layer. These results clearly correlate the tensile strain in the epitaxial layer and the formation of micro-cracks. Cross-sectional TEM analysis unveiled that screw/mixed dislocations were responsible for the formation of micro-cracks. It is believed that etching preferably starts from the dislocations and propagates along the crystal planes with the help of the tensile strain in the epitaxial layers. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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This paper investigated the effect of tensile strain in AlGaN barrier layer on the formation of micro-cracks at the surface of AlGaN/GaN HEMT structures. The Al0.2Ga0.8N/GaN HEMT structures were cooled down under N2 + NH3 and H2 + NH3 environments and high-density micro-cracks were found only for the latter case, indicating that hydrogen etching is essential for crack formation. On the other hand, no micro-cracks were observed even for H2 + NH3 cooling for thick AlGaN bulk layer. These results clearly correlate the tensile strain in the epitaxial layer and the formation of micro-cracks. Cross-sectional TEM analysis unveiled that screw/mixed dislocations were responsible for the formation of micro-cracks. It is believed that etching preferably starts from the dislocations and propagates along the crystal planes with the help of the tensile strain in the epitaxial layers. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200583" xmlns="http://purl.org/rss/1.0/"><title>Carrier lifetimes in green emitting InGaN/GaN disks-in-nanowire and characteristics of green light emitting diodes</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200583</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Carrier lifetimes in green emitting InGaN/GaN disks-in-nanowire and characteristics of green light emitting diodes</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Shafat Jahangir, Animesh Banerjee, Pallab Bhattacharya</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:27.935222-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200583</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200583</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200583</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">812</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">815</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Improvement in the internal quantum efficiency (IQE) of InGaN/GaN disks-in-nanowires by surface passivation is demonstrated. The highest IQE achieved through surface passivation for green emitting (λ=540 nm) InGaN/GaN disks-in-nanowires is ∼53%. Radiative and nonradiative carrier lifetimes are calculated for as-grown and surface passivated green emitting disks-in-nanowires. Passivated green sample exhibits a room temperature radiative lifetime of ∼748 ps, which is much smaller than that of equivalent quantum wells. Electroluminescence measurements on passivated green light emitting diodes containing InGaN disks demonstrate no roll over or efficiency droop up to 375 A/cm<sup>2</sup>, and exhibit a blue-shift of 7 nm in peak wavelength. An enhancement in the light output due to surface passivation is observable in the relative external quantum efficiency of the surface passivated devices as compared with the as-grown samples. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Improvement in the internal quantum efficiency (IQE) of InGaN/GaN disks-in-nanowires by surface passivation is demonstrated. The highest IQE achieved through surface passivation for green emitting (λ=540 nm) InGaN/GaN disks-in-nanowires is ∼53%. Radiative and nonradiative carrier lifetimes are calculated for as-grown and surface passivated green emitting disks-in-nanowires. Passivated green sample exhibits a room temperature radiative lifetime of ∼748 ps, which is much smaller than that of equivalent quantum wells. Electroluminescence measurements on passivated green light emitting diodes containing InGaN disks demonstrate no roll over or efficiency droop up to 375 A/cm2, and exhibit a blue-shift of 7 nm in peak wavelength. An enhancement in the light output due to surface passivation is observable in the relative external quantum efficiency of the surface passivated devices as compared with the as-grown samples. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200577" xmlns="http://purl.org/rss/1.0/"><title>Ridge waveguide InGaN/GaN quantum dot edge emitting visible lasers</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200577</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Ridge waveguide InGaN/GaN quantum dot edge emitting visible lasers</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Animesh Banerjee, Thomas Frost, Shafat Jahangir, Ethan Stark, Pallab Bhattacharya</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:25.44405-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200577</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200577</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200577</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">816</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">819</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Blue-emitting and green-emitting laser heterostructures were grown by molecular beam epitaxy, incorporating InGaN/GaN quantum dots as the active medium, with a measured quantum efficiency of 60% on n-GaN bulk substrates. These quantum dots exhibit no S-shape in the photoluminescence peak wavelength as a function of temperature, as typically found in comparable quantum well devices. The lasers were characterized by a threshold current density, J<sub>th</sub>, of 930 A/cm<sup>2</sup> under pulsed bias, with a differential efficiency of 13.9%, and a wall plug (power conversion) efficiency of 0.4% at 1050 A/cm<sup>2</sup>. Green-emitting quantum dot lasers have J<sub>th</sub> = 935 A/cm<sup>2</sup>. The lasers were also characterized by their modal properties through near field imaging (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Blue-emitting and green-emitting laser heterostructures were grown by molecular beam epitaxy, incorporating InGaN/GaN quantum dots as the active medium, with a measured quantum efficiency of 60% on n-GaN bulk substrates. These quantum dots exhibit no S-shape in the photoluminescence peak wavelength as a function of temperature, as typically found in comparable quantum well devices. The lasers were characterized by a threshold current density, Jth, of 930 A/cm2 under pulsed bias, with a differential efficiency of 13.9%, and a wall plug (power conversion) efficiency of 0.4% at 1050 A/cm2. Green-emitting quantum dot lasers have Jth = 935 A/cm2. The lasers were also characterized by their modal properties through near field imaging (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200625" xmlns="http://purl.org/rss/1.0/"><title>High transconductance ion-implanted GaN MISFETs using atomic layer deposited high-k dielectrics</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200625</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">High transconductance ion-implanted GaN MISFETs using atomic layer deposited high-k dielectrics</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">S. Gu, H. Katayose, K. Nomoto, T. Nakamura, A. Ohoka, K. Lee, W. Lu, P. M. Asbeck</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-18T04:11:37.996776-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200625</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200625</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200625</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">820</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">823</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We demonstrate MISFETs based on GaN p-epilayers with ion-implanted source/drain regions and atomic layer deposited (ALD) gate dielectrics of Al<sub>2</sub>O<sub>3</sub> and HfO<sub>2</sub>. The fabrication technology is similar to that used for silicon MOSFETs. We find that there are significant shifts (of order 1 V) in threshold voltage between FETs produced with Al<sub>2</sub>O<sub>3</sub> and HfO<sub>2</sub> films, enabling depletion mode and enhancement mode device operation for the same substrate doping. The GaN MISFETs obtained maximum drain current of 580mA/mm and an extrinsic transconductance as high as 160 mS/mm. To the authors' knowledge, the transconductance achieved represents record performance for ion-implanted MISFETs of GaN without heterostructure barriers. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We demonstrate MISFETs based on GaN p-epilayers with ion-implanted source/drain regions and atomic layer deposited (ALD) gate dielectrics of Al2O3 and HfO2. The fabrication technology is similar to that used for silicon MOSFETs. We find that there are significant shifts (of order 1 V) in threshold voltage between FETs produced with Al2O3 and HfO2 films, enabling depletion mode and enhancement mode device operation for the same substrate doping. The GaN MISFETs obtained maximum drain current of 580mA/mm and an extrinsic transconductance as high as 160 mS/mm. To the authors' knowledge, the transconductance achieved represents record performance for ion-implanted MISFETs of GaN without heterostructure barriers. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200608" xmlns="http://purl.org/rss/1.0/"><title>Over 550 V breakdown voltage of InAlN/GaN HEMT on Si</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200608</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Over 550 V breakdown voltage of InAlN/GaN HEMT on Si</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Hisashi Saito, Yoshiharu Takada, Masahiko Kuraguchi, Miki Yumoto, Kunio Tsuda</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-27T04:11:07.557584-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200608</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200608</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200608</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">824</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">826</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>InAlN/GaN high electron mobility transistor (HEMT) on Si substrate with a high breakdown voltage is reported. The observed off-state breakdown voltage was over 550 V and the specific on-state resistance was 0.7 mΩcm<sup>2</sup> in the fabricated device with the spacing between the gate and drain (L<sub>gd</sub>) of 8 µm. After the measurement, the device was found not to be broken when it was observed by an optical microscope. The off-state breakdown voltage might be about 550 V in the device with L<sub>gd</sub> of 5 µm, because the increase of the off-state leakage current was observed at the drain voltage of 550 V. If the off-state breakdown voltage was proportional to L<sub>gd</sub>, the speculated off-state breakdown voltage from this result was 880 V in the device with L<sub>gd</sub> of 8 µm. Therefore, InAlN/GaN HEMTs have potential for application as power electronics devices. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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InAlN/GaN high electron mobility transistor (HEMT) on Si substrate with a high breakdown voltage is reported. The observed off-state breakdown voltage was over 550 V and the specific on-state resistance was 0.7 mΩcm2 in the fabricated device with the spacing between the gate and drain (Lgd) of 8 µm. After the measurement, the device was found not to be broken when it was observed by an optical microscope. The off-state breakdown voltage might be about 550 V in the device with Lgd of 5 µm, because the increase of the off-state leakage current was observed at the drain voltage of 550 V. If the off-state breakdown voltage was proportional to Lgd, the speculated off-state breakdown voltage from this result was 880 V in the device with Lgd of 8 µm. Therefore, InAlN/GaN HEMTs have potential for application as power electronics devices. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200541" xmlns="http://purl.org/rss/1.0/"><title>317 GHz InAlGaN/GaN HEMTs with extremely low on-resistance</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200541</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">317 GHz InAlGaN/GaN HEMTs with extremely low on-resistance</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Dong Seup Lee, Oleg Laboutin, Yu Cao, Wayne Johnson, Edward Beam, Andrew Ketterson, Michael Schuette, Paul Saunier, David Kopp, Patrick Fay, Tomás Palacios</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:29.618114-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200541</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200541</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200541</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">827</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">830</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>This paper reports depletion-mode In<sub>0.13</sub>Al<sub>0.83</sub>Ga<sub>0.04</sub>N/GaN high electron mobility transistors (HEMTs) on a SiC substrate with a record current gain cutoff frequency (f<sub>T</sub>) of 317 GHz. Thanks to the combination of high electron mobility, regrown n<sup>+</sup> InGaN/GaN ohmic contacts and scaled source-to-drain distance, the devices have an very low on-resistance of 0.4 Ω·mm. This very low resistance enables a significant reduction of the transistor parasitic delay and devices with a peak f<sub>T</sub> of 317 GHz have been demonstrated for a 26 nm gate length. The device performance is limited by a relatively thick top barrier which causes serious short-channel effects (SCEs) in the devices with gate length below 50 nm. It is expected that a suppression of the SCEs will render further improvements in frequency performance in future devices. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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This paper reports depletion-mode In0.13Al0.83Ga0.04N/GaN high electron mobility transistors (HEMTs) on a SiC substrate with a record current gain cutoff frequency (fT) of 317 GHz. Thanks to the combination of high electron mobility, regrown n+ InGaN/GaN ohmic contacts and scaled source-to-drain distance, the devices have an very low on-resistance of 0.4 Ω·mm. This very low resistance enables a significant reduction of the transistor parasitic delay and devices with a peak fT of 317 GHz have been demonstrated for a 26 nm gate length. The device performance is limited by a relatively thick top barrier which causes serious short-channel effects (SCEs) in the devices with gate length below 50 nm. It is expected that a suppression of the SCEs will render further improvements in frequency performance in future devices. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200563" xmlns="http://purl.org/rss/1.0/"><title>GaN-based high voltage transistors for efficient power switching</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200563</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">GaN-based high voltage transistors for efficient power switching</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Patrick Waltereit, Richard Reiner, Heiko Czap, Detlef Peschel, Stefan Müller, Rüdiger Quay, Michael Mikulla, Oliver Ambacher</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-18T04:11:34.733029-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200563</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200563</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200563</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">831</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">834</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We present results from GaN-based high voltage transistors used for power switching applications. The static and dynamic properties of transistors on SiC and Si substrates are determined. Overall, this technology is capable to deliver 1000 V breakdown and 95 A output current as well as a lower product of on-resistance and gate charge than conventional Si-based structures. Areas of further improvement in epitaxial growth and device processing are outlined in order to combine these high currents and high voltages in a single device. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We present results from GaN-based high voltage transistors used for power switching applications. The static and dynamic properties of transistors on SiC and Si substrates are determined. Overall, this technology is capable to deliver 1000 V breakdown and 95 A output current as well as a lower product of on-resistance and gate charge than conventional Si-based structures. Areas of further improvement in epitaxial growth and device processing are outlined in order to combine these high currents and high voltages in a single device. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200589" xmlns="http://purl.org/rss/1.0/"><title>&gt;1200 V GaN-on-silicon Schottky diode</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200589</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">&gt;1200 V GaN-on-silicon Schottky diode</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">T. Boles, C. Varmazis, D. Carlson, T. Palacios, G. W. Turner, R. J. Molnar</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-27T04:11:06.560419-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200589</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200589</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200589</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">835</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">839</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>M/A-COM Technology Solutions has continuing joint development efforts sponsored by the Department of Energy with MIT main campus and MIT Lincoln Laboratory to develop GaN on silicon two and three terminal high voltage/high current switching devices. The initial developmental goals were for a Schottky diode that has a reverse breakdown blocking voltage of &gt;600 V and is capable of handling 10 A of forward current. A comparison of the M/A-COM Technology Solutions lateral GaN Schottky diode on-resistance as a function of reverse breakdown voltage for a number of both lateral and vertical GaN Schottky diode geometries taken from the literature is presented. The substrates employed for all of these data points are either sapphire, SiC, silicon, and even one study which utilized single crystal GaN. Also included in this plot are theoretical limits for the basic materials typically used in GaN Schottky diode construction. It can be seen that the reverse breakdown results of approximately 1500 V for M/A-COM Technology Solutions lateral anode connected field GaN Schottky diodes on silicon substrates compare extremely favorably with the reported performance of the state-of-the-art devices, regardless of substrate material or design geometry. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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M/A-COM Technology Solutions has continuing joint development efforts sponsored by the Department of Energy with MIT main campus and MIT Lincoln Laboratory to develop GaN on silicon two and three terminal high voltage/high current switching devices. The initial developmental goals were for a Schottky diode that has a reverse breakdown blocking voltage of &gt;600 V and is capable of handling 10 A of forward current. A comparison of the M/A-COM Technology Solutions lateral GaN Schottky diode on-resistance as a function of reverse breakdown voltage for a number of both lateral and vertical GaN Schottky diode geometries taken from the literature is presented. The substrates employed for all of these data points are either sapphire, SiC, silicon, and even one study which utilized single crystal GaN. Also included in this plot are theoretical limits for the basic materials typically used in GaN Schottky diode construction. It can be seen that the reverse breakdown results of approximately 1500 V for M/A-COM Technology Solutions lateral anode connected field GaN Schottky diodes on silicon substrates compare extremely favorably with the reported performance of the state-of-the-art devices, regardless of substrate material or design geometry. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200594" xmlns="http://purl.org/rss/1.0/"><title>Enhancement mode InAlGaN/GaN MISHFETs with plasma-oxidised AlOx/TiOx as gate insulator</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200594</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Enhancement mode InAlGaN/GaN MISHFETs with plasma-oxidised AlOx/TiOx as gate insulator</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Herwig Hahn, Hannes Behmenburg, Nico Ketteniss, Michael Heuken, Holger Kalisch, Andrei Vescan</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-18T04:11:35.723355-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200594</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200594</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200594</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">840</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">843</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Enhancement mode GaN-based devices can be realised i.a. by gate recessing or the utilisation of a thin barrier. Yet, as this concept bases upon an increase in barrier capacitance, the application of a gate dielectric causing a capacitance reduction remains as a critical issue. A charge-free dielectric would shift the threshold voltage to negative values, eventually forming a depletion mode device. However, with an appropriate charge-containing dielectric, the same threshold voltage as for an HFET could be maintained. Here, a metal stack consisting of Al and Ti on top of a quaternary In<sub>0.11</sub>Al<sub>0.72</sub>Ga<sub>0.17</sub>N barrier was plasma-oxidised and is shown to form insulated-gate devices with almost the same threshold voltage as their Schottky gate counterparts. The effects on the threshold voltage are discussed. It is shown that the transconductance improves by more than 80%, record drain current of 860 mA/mm is achieved and the dynamic behaviour dramatically improves. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Enhancement mode GaN-based devices can be realised i.a. by gate recessing or the utilisation of a thin barrier. Yet, as this concept bases upon an increase in barrier capacitance, the application of a gate dielectric causing a capacitance reduction remains as a critical issue. A charge-free dielectric would shift the threshold voltage to negative values, eventually forming a depletion mode device. However, with an appropriate charge-containing dielectric, the same threshold voltage as for an HFET could be maintained. Here, a metal stack consisting of Al and Ti on top of a quaternary In0.11Al0.72Ga0.17N barrier was plasma-oxidised and is shown to form insulated-gate devices with almost the same threshold voltage as their Schottky gate counterparts. The effects on the threshold voltage are discussed. It is shown that the transconductance improves by more than 80%, record drain current of 860 mA/mm is achieved and the dynamic behaviour dramatically improves. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200613" xmlns="http://purl.org/rss/1.0/"><title>High voltage GaN-on-silicon HEMT</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200613</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">High voltage GaN-on-silicon HEMT</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">T. Boles, C. Varmazis, D. Carlson, T. Palacios, G. W. Turner, R. J. Molnar</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-03-27T04:11:10.837933-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200613</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200613</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200613</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">844</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">848</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>M/A-COM Technology Solutions has continued in the joint development efforts sponsored by the Department of Energy with MIT main campus and MIT Lincoln Labs to develop GaN on silicon three terminal high voltage/high current HEMT switching devices. The first year developmental goals were for a three terminal structure that has a reverse breakdown characteristic of &gt;1200 V and is capable of switching 10 amperes of current. An average three terminal breakdown of 1322 V was achieved on a single finger 250 µm GaN on silicon HEMT device utilizing a source connected field plate with a 4.5 µm drain region overlap. An individual device breakdown on a single finger 250 µm GaN on silicon HEMT device with a SCFP of &gt;1630 V was measured at a current of 250 µA (1mA/mm) – One of the highest yet reported for GaN on silicon in the industry. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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M/A-COM Technology Solutions has continued in the joint development efforts sponsored by the Department of Energy with MIT main campus and MIT Lincoln Labs to develop GaN on silicon three terminal high voltage/high current HEMT switching devices. The first year developmental goals were for a three terminal structure that has a reverse breakdown characteristic of &gt;1200 V and is capable of switching 10 amperes of current. An average three terminal breakdown of 1322 V was achieved on a single finger 250 µm GaN on silicon HEMT device utilizing a source connected field plate with a 4.5 µm drain region overlap. An individual device breakdown on a single finger 250 µm GaN on silicon HEMT device with a SCFP of &gt;1630 V was measured at a current of 250 µA (1mA/mm) – One of the highest yet reported for GaN on silicon in the industry. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200569" xmlns="http://purl.org/rss/1.0/"><title>Fast GaN based Schottky diodes on Si(111) substrate with low onset voltage and strong reverse blocking</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200569</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Fast GaN based Schottky diodes on Si(111) substrate with low onset voltage and strong reverse blocking</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Eldad Bahat Treidel, Oliver Hilt, Andreas Wentzel, Joachim Würfl, Günther Tränkle</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:15.394383-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200569</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200569</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200569</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">849</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">852</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>GaN-based heterostructure lateral Schottky barrier diodes (SBD) grown on Si(111) substrate are presented in this work. These SBDs own very low onset-voltage, <em>V</em><sub>F</sub> = 0.50 V, high reverse blocking <em>V</em><sub>BR</sub> &gt; 600 V for <em>L</em><sub>AC</sub> &gt; 8 µm, very low capacitive charge of 0.415 nC/A and a very fast recovery time of 6 ps extracted under large signal operation conditions. These unique qualities are achieved by combining lateral topology, AlGaN back-barrier epitaxial structure, fully recessed Schottky anode (<em>ϕ</em><sub>B</sub> = 0.62 eV) and anode field plate extension (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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GaN-based heterostructure lateral Schottky barrier diodes (SBD) grown on Si(111) substrate are presented in this work. These SBDs own very low onset-voltage, VF = 0.50 V, high reverse blocking VBR &gt; 600 V for LAC &gt; 8 µm, very low capacitive charge of 0.415 nC/A and a very fast recovery time of 6 ps extracted under large signal operation conditions. These unique qualities are achieved by combining lateral topology, AlGaN back-barrier epitaxial structure, fully recessed Schottky anode (ϕB = 0.62 eV) and anode field plate extension (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200599" xmlns="http://purl.org/rss/1.0/"><title>Carrier dynamics and localization in AlInN/GaN heterostructures</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200599</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Carrier dynamics and localization in AlInN/GaN heterostructures</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Saulius Marcinkevičius, Vytautas Liuolia, Daniel Billingsley, Maxim Shatalov, Jinwei Yang, Remis Gaska, Michael S. Shur</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-06T07:40:46.712083-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200599</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200599</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200599</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">853</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">856</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Photoexcited carrier dynamics and localization potentials in Al<sub>0.86</sub>In<sub>0.14</sub>N/GaN heterostructure have been examined by time-resolved photoluminescence (PL), transient photoreflectance and scanning near-field optical spectroscopy. The large GaN and AlInN PL intensity difference, and the short AlInN PL decay and GaN PL rise times indicate efficient photoexcited carrier transfer from AlInN to GaN via sub-band edge states. Near-field PL scans and photoreflectance data show that the diameter of the localization sites and the distance between them are well below 100 nm. Majority of these states is assigned to In clusters, in which the valence band has a higher energy than the valence band in a uniform AlInN alloy. It is likely that the carrier transport through the sub-band edge states proceeds via high conductivity channels involving extended defects. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Photoexcited carrier dynamics and localization potentials in Al0.86In0.14N/GaN heterostructure have been examined by time-resolved photoluminescence (PL), transient photoreflectance and scanning near-field optical spectroscopy. The large GaN and AlInN PL intensity difference, and the short AlInN PL decay and GaN PL rise times indicate efficient photoexcited carrier transfer from AlInN to GaN via sub-band edge states. Near-field PL scans and photoreflectance data show that the diameter of the localization sites and the distance between them are well below 100 nm. Majority of these states is assigned to In clusters, in which the valence band has a higher energy than the valence band in a uniform AlInN alloy. It is likely that the carrier transport through the sub-band edge states proceeds via high conductivity channels involving extended defects. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200570" xmlns="http://purl.org/rss/1.0/"><title>Systematic theoretical investigations for the polytypism in SiC</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200570</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Systematic theoretical investigations for the polytypism in SiC</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Tomonori Ito, Toru Akiyama, Kohji Nakamura</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:20.629928-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200570</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200570</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200570</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">857</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">860</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>SiC polytypes in bulk form is systematically investigated using ab initio pseudopotential approach for the total energy calculations in four structures such as 3C (zinc blende), 6H, 4H, and 2H (wurtzite) structures with vacancy and nitrogen doping. Our calculated energy differences <em>ΔE</em> among four structures reveal that 3C and 4H are favorable for prefect SiC. The <em>ΔE</em> for SiC with vacancy suggests the most stable structures such as 6H with Si-vacancy and 4H with C-vacancy. The calculated vacancy formation energies suggest that C-rich condition prefers 6H whereas 4H is favored under Si-rich condition. Furthermore, nitrogen substituting for carbon and silicon respectively stabilizes 3C and 4H. These calculated results are consistent with experimental findings. The destabilization due to the vacancy formation and stabilization due to nitrogen of 3C-SiC are discussed by bond charge calculations and our simple formula of <em>ΔE</em>. It is found that vacancy formation inducing large deficit of bond charges favors 6H- and 4H-SiC and nitrogen-doping increasing bond charges stabilizes 3C-SiC. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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SiC polytypes in bulk form is systematically investigated using ab initio pseudopotential approach for the total energy calculations in four structures such as 3C (zinc blende), 6H, 4H, and 2H (wurtzite) structures with vacancy and nitrogen doping. Our calculated energy differences ΔE among four structures reveal that 3C and 4H are favorable for prefect SiC. The ΔE for SiC with vacancy suggests the most stable structures such as 6H with Si-vacancy and 4H with C-vacancy. The calculated vacancy formation energies suggest that C-rich condition prefers 6H whereas 4H is favored under Si-rich condition. Furthermore, nitrogen substituting for carbon and silicon respectively stabilizes 3C and 4H. These calculated results are consistent with experimental findings. The destabilization due to the vacancy formation and stabilization due to nitrogen of 3C-SiC are discussed by bond charge calculations and our simple formula of ΔE. It is found that vacancy formation inducing large deficit of bond charges favors 6H- and 4H-SiC and nitrogen-doping increasing bond charges stabilizes 3C-SiC. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200616" xmlns="http://purl.org/rss/1.0/"><title>Synthesis of AlON materials for UV emitting devices</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200616</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Synthesis of AlON materials for UV emitting devices</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Yujin Cho, Jieun Koo, Youngji Cho, Woong Lee, Jeungwoo Lee, Byeongwoo Lee, Sangtae Lee, Jiho Chang</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-04-04T04:10:34.00629-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200616</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200616</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200616</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">861</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">864</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Aluminum oxynitride (AlON), which is conventionally used as one of the ceramics with good thermal and chemical stability, has an attractive candidate for a tunable extreme UV luminous material due to its unique combination of properties and UV luminescence. In this paper, we have synthesized the novel AlON UV emitting materials, which have a wavelength from 4.29 to 4.54 eV, and discovered the core (AlON)-shell (Al<sub>2</sub>O<sub>3</sub>) like structures in a transmission electron microscopy. Furthermore, their potential application in a UV light emitter has been demonstrated by applying the combination with a CNT field emission cold cathode, which has been made by a simple printing method. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Aluminum oxynitride (AlON), which is conventionally used as one of the ceramics with good thermal and chemical stability, has an attractive candidate for a tunable extreme UV luminous material due to its unique combination of properties and UV luminescence. In this paper, we have synthesized the novel AlON UV emitting materials, which have a wavelength from 4.29 to 4.54 eV, and discovered the core (AlON)-shell (Al2O3) like structures in a transmission electron microscopy. Furthermore, their potential application in a UV light emitter has been demonstrated by applying the combination with a CNT field emission cold cathode, which has been made by a simple printing method. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200597" xmlns="http://purl.org/rss/1.0/"><title>Growth process and morphology of three-dimensional GaSb islands on Ga/Si(111)</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200597</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Growth process and morphology of three-dimensional GaSb islands on Ga/Si(111)</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Shinsuke Hara, Ryuto Machida, Keisuke Yoshiki, Katsumi Irokawa, Hirofumi Miki, Akira Kawazu, Hiroki I. Fujishiro</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:31.549175-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200597</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200597</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200597</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">865</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">868</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The growth process and morphology of three-dimensional GaSb islands grown on a Ga/Si(111)-√3 × √3 reconstructed surface have been studied by ultrahigh-vacuum scanning tunneling microscopy and non-contact atomic force microscopy. Faceted GaSb islands with a density of 10<sup>11</sup> cm<sup>−2</sup> are formed on Ga/Si(111) in multilayer growth at 350 °C. Hexagonal- and pyramid-shaped islands are formed at 400 °C. Dome-shaped islands, which are similar to the islands grown on clean Si(111), are only formed at 450 °C. The growth morphology of GaSb islands varies depending on the atomic species terminated on Si(111) and the growth temperature. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The growth process and morphology of three-dimensional GaSb islands grown on a Ga/Si(111)-√3 × √3 reconstructed surface have been studied by ultrahigh-vacuum scanning tunneling microscopy and non-contact atomic force microscopy. Faceted GaSb islands with a density of 1011 cm−2 are formed on Ga/Si(111) in multilayer growth at 350 °C. Hexagonal- and pyramid-shaped islands are formed at 400 °C. Dome-shaped islands, which are similar to the islands grown on clean Si(111), are only formed at 450 °C. The growth morphology of GaSb islands varies depending on the atomic species terminated on Si(111) and the growth temperature. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200598" xmlns="http://purl.org/rss/1.0/"><title>Electron-beam incident-angle- resolved cathodoluminescence studies on bulk ZnO crystals</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200598</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Electron-beam incident-angle- resolved cathodoluminescence studies on bulk ZnO crystals</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Takeyoshi Onuma, Tomohiro Yamaguchi, Tohru Honda</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-01-29T06:11:32.915659-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200598</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200598</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200598</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">869</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">872</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Electron-beam incidence-angle-resolved cathodoluminescence (IAR-CL) measurements on ZnO single crystals were demonstrated as an alternative way for the depth-resolved cathodoluminescence (CL) study by scanning acceleration voltage of the electron-beam. Incidence-angle dependent near-band-edge CL intensities were well reproduced by analyses considering a radiation pattern, an expansion of the electron-beam irradiation area, and an internal absorption factors. The quantitative agreement between the experimental and simulated results indicates that the IAR-CL technique is suitable for practical use in the depth-resolved CL study of device structures (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Electron-beam incidence-angle-resolved cathodoluminescence (IAR-CL) measurements on ZnO single crystals were demonstrated as an alternative way for the depth-resolved cathodoluminescence (CL) study by scanning acceleration voltage of the electron-beam. Incidence-angle dependent near-band-edge CL intensities were well reproduced by analyses considering a radiation pattern, an expansion of the electron-beam irradiation area, and an internal absorption factors. The quantitative agreement between the experimental and simulated results indicates that the IAR-CL technique is suitable for practical use in the depth-resolved CL study of device structures (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200617" xmlns="http://purl.org/rss/1.0/"><title>Room temperature operation of ITO nano-crystal gas sensor</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200617</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Room temperature operation of ITO nano-crystal gas sensor</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Jieun Koo, Seunghwan Park, Woong Lee, Youngji Cho, Hyojong Lee, Sangtae Lee, Jiho Chang</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:10:31.251783-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200617</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200617</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200617</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">873</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">876</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>We proposed an indium-tin-oxide (ITO) based gas sensor which can operate at room temperature. ITO nano-crystal was screen printed on a quartz substrate. To improve the sensitivity and to decrease the resistivity of the printed ITO layer, pressurized annealing was adopted. Resistivity of the printed ITO gas sensor decreased from 3.5 kΩcm to 1.56 Ωcm by pressurized annealing. We could observe room temperature operation of the printed ITO gas sensor by using various gases such as Ar, N<sub>2</sub>, O<sub>2</sub> and CH<sub>4</sub>. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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We proposed an indium-tin-oxide (ITO) based gas sensor which can operate at room temperature. ITO nano-crystal was screen printed on a quartz substrate. To improve the sensitivity and to decrease the resistivity of the printed ITO layer, pressurized annealing was adopted. Resistivity of the printed ITO gas sensor decreased from 3.5 kΩcm to 1.56 Ωcm by pressurized annealing. We could observe room temperature operation of the printed ITO gas sensor by using various gases such as Ar, N2, O2 and CH4. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200808" xmlns="http://purl.org/rss/1.0/"><title>Spiking rate of myenteric neurons recorded from multi-electrode arrays depending on local microenvironment</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200808</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Spiking rate of myenteric neurons recorded from multi-electrode arrays depending on local microenvironment</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Rebekka Medert, Anne Schuster, Lukas Kristoffer Schwarz, Tanja Schwab, Karl-Herbert Schaefer</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-02-22T10:20:24.783388-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200808</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200808</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200808</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">877</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">881</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>The interaction of cells with their microenvironment is an important factor, which influences phenotype, differentiation state and cell function. Interactions between cells and extracellular matrix (ECM) components are of crucial significance, especially for the development of electrical activity in neurons. For this study multi-electrode arrays were used to examine the influence of different substrates (glass, poly-D-lysine (PDL), PDL/laminin and laminin) on myenteric neurons during stimulation with lipopolysaccharide (LPS). The effect of LPS upon neurons grown on PDL/laminin resulted in an increased neuronal activity and calcium influx through L-type voltage gated calcium channels. Cultures on glass or PDL were not influenced. This demonstrates that the local microenvironment plays an essential role for the electrical potential of myenteric neurons.(© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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The interaction of cells with their microenvironment is an important factor, which influences phenotype, differentiation state and cell function. Interactions between cells and extracellular matrix (ECM) components are of crucial significance, especially for the development of electrical activity in neurons. For this study multi-electrode arrays were used to examine the influence of different substrates (glass, poly-D-lysine (PDL), PDL/laminin and laminin) on myenteric neurons during stimulation with lipopolysaccharide (LPS). The effect of LPS upon neurons grown on PDL/laminin resulted in an increased neuronal activity and calcium influx through L-type voltage gated calcium channels. Cultures on glass or PDL were not influenced. This demonstrates that the local microenvironment plays an essential role for the electrical potential of myenteric neurons.(© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200748" xmlns="http://purl.org/rss/1.0/"><title>Cell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assays</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200748</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Cell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assays</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Stijn Duchateau, Jeroen Broeders, Dieter Croux, Daniel Janssen, Jean-Michel Rigo, Patrick Wagner, Ronald Thoelen, Ward De Ceuninck</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-04-09T02:20:32.460279-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1002/pssc.201200748</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1002/pssc.201200748</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1002%2Fpssc.201200748</prism:url><prism:section xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">Contributed Article</prism:section><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">882</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">888</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<h3 xhtml="http://www.w3.org/1999/xhtml" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib">Abstract</h3>
<div class="para" xmlns="http://www.w3.org/1999/xhtml"><p>Cell proliferation can be monitored by a wide range of well-established techniques. Most of the principles used rely on optical, single end-point methods, often involving the use of absorbent, fluorescent or luminescent compounds. These additives can interfere with the cell growth, thus producing distorted results. Electrochemical impedance spectroscopy provides a solution for this problem and enables continuous monitoring without interference. However equipment for this measurement technique is often bulky, highly expensive and lacks multichannel features. This paper presents a low-cost, compact hardware platform optimized for proliferation measurements, together with custom software to ease interpretation and physical modelling of data. Performance is demonstrated and measurement parameters are fine-tuned for three commonly used cell types in proliferation measurements. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p></div>
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Cell proliferation can be monitored by a wide range of well-established techniques. Most of the principles used rely on optical, single end-point methods, often involving the use of absorbent, fluorescent or luminescent compounds. These additives can interfere with the cell growth, thus producing distorted results. Electrochemical impedance spectroscopy provides a solution for this problem and enables continuous monitoring without interference. However equipment for this measurement technique is often bulky, highly expensive and lacks multichannel features. This paper presents a low-cost, compact hardware platform optimized for proliferation measurements, together with custom software to ease interpretation and physical modelling of data. Performance is demonstrated and measurement parameters are fine-tuned for three commonly used cell types in proliferation measurements. (© 2013 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim)
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