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<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"><channel rdf:about="http://onlinelibrary.wiley.com/rss/journal/10.1111/(ISSN)1600-5767" xmlns="http://purl.org/rss/1.0/"><title>Journal of Applied Crystallography</title><description> Wiley Online Library : Journal of Applied Crystallography</description><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1111%2F%28ISSN%291600-5767</link><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc</dc:publisher><dc:language xmlns:dc="http://purl.org/dc/elements/1.1/">en</dc:language><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/">© International Union of Crystallography</dc:rights><prism:issn xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">0021-8898</prism:issn><prism:eIssn xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">1600-5767</prism:eIssn><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-06-01T00:00:00-05:00</dc:date><prism:coverDisplayDate xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">June 2013</prism:coverDisplayDate><prism:volume xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">46</prism:volume><prism:number xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">3</prism:number><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">587</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">834</prism:endingPage><image rdf:resource="http://onlinelibrary.wiley.com/store/10.1111/jcr.2013.46.issue-3/asset/cover.gif?v=1&amp;s=c0369d815a3ab3a7d5389a96732fbb31fcadcb38"/><items><rdf:Seq><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006894"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300527X"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005797"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008340"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008364"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008194"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007693"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010546"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300592X"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006225"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006511"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300770X"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007991"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300681X"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008182"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008522"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300890X"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005785"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301008X"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301025X"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009023"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010509"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008923"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010571"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005402"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005888"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008030"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009126"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009746"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006195"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005426"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009734"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005955"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006912"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006742"/><rdf:li rdf:resource="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010558"/></rdf:Seq></items></channel><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006894" xmlns="http://purl.org/rss/1.0/"><title>CCL: an algorithm for the efficient comparison of clusters</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006894</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">CCL: an algorithm for the efficient comparison of clusters</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">R. Hundt, J. C. Schön, S. Neelamraju, J. Zagorac, M. Jansen</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813006894</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813006894</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006894</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">587</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">593</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The systematic comparison of the atomic structure of solids and clusters has become an important task in crystallography, chemistry, physics and materials science, in particular in the context of structure prediction and structure determination of nanomaterials. In this work, an efficient and robust algorithm for the comparison of cluster structures is presented, which is based on the mapping of the point patterns of the two clusters onto each other. This algorithm has been implemented as the module CCL in the structure visualization and analysis program <em>KPLOT</em>.</p></div>
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The systematic comparison of the atomic structure of solids and clusters has become an important task in crystallography, chemistry, physics and materials science, in particular in the context of structure prediction and structure determination of nanomaterials. In this work, an efficient and robust algorithm for the comparison of cluster structures is presented, which is based on the mapping of the point patterns of the two clusters onto each other. This algorithm has been implemented as the module CCL in the structure visualization and analysis program KPLOT.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300527X" xmlns="http://purl.org/rss/1.0/"><title>Using GPUs to compute fast Fourier transforms for crystal structure solution and refinement</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300527X</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Using GPUs to compute fast Fourier transforms for crystal structure solution and refinement</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">ElSayed Mohamed Shalaby, Miguel Afonso Oliveira</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S002188981300527X</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S002188981300527X</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300527X</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">594</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">600</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>In the past few years, new hardware tools have become available for computing using the graphical processing units (GPUs) present in modern graphics cards. These GPUs allow efficient parallel calculations with a much higher throughput than microprocessors. In this work, fast Fourier transformation calculations used in <em>SIR2011</em> software algorithms have been carried out using the power of the GPU, and the speed of the calculations has been compared with that achieved using normal CPUs.</p></div>
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In the past few years, new hardware tools have become available for computing using the graphical processing units (GPUs) present in modern graphics cards. These GPUs allow efficient parallel calculations with a much higher throughput than microprocessors. In this work, fast Fourier transformation calculations used in SIR2011 software algorithms have been carried out using the power of the GPU, and the speed of the calculations has been compared with that achieved using normal CPUs.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005797" xmlns="http://purl.org/rss/1.0/"><title>Structural, optical and thermal properties of Zr–Fe co-doped congruent LiNbO3 single crystals</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005797</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Structural, optical and thermal properties of Zr–Fe co-doped congruent LiNbO3 single crystals</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">B. Riscob, R. Bhatt, N. Vijayan, Indranil Bhaumik, S. Ganesamoorthy, M. A. Wahab, , G. Bhagavannarayana</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813005797</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813005797</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005797</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">601</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">609</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Zr–Fe-doped congruent lithium niobate single crystals were grown by the Czochralski technique. The crystal structure and lattice parameter of the grown crystals were assessed by powder X-ray diffraction and the strain developed as a result of doping has been calculated (−1.19 × 10<sup>−3</sup>) by using the Williamson–Hall relation. The incorporated dopant concentration along with the dopant distribution in the specimen crystal was estimated by X-ray florescence spectrometry. A multi-crystal X-ray diffraction analysis was carried out to identify the crystalline perfection of the sample and revealed that the investigated crystal does not contain any structural grain boundaries but does contain point defects and micrometre size mosaic blocks. Birefringence measurements were carried out using a prism coupler spectrometer and found that the optical birefringence is 0.0822 for 532 nm and 0.705 for 1064 nm. A thermal conductivity (κ) study reveals that the doped sample has a lower κ value than the undoped equivalent.</p></div>
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Zr–Fe-doped congruent lithium niobate single crystals were grown by the Czochralski technique. The crystal structure and lattice parameter of the grown crystals were assessed by powder X-ray diffraction and the strain developed as a result of doping has been calculated (−1.19 × 10−3) by using the Williamson–Hall relation. The incorporated dopant concentration along with the dopant distribution in the specimen crystal was estimated by X-ray florescence spectrometry. A multi-crystal X-ray diffraction analysis was carried out to identify the crystalline perfection of the sample and revealed that the investigated crystal does not contain any structural grain boundaries but does contain point defects and micrometre size mosaic blocks. Birefringence measurements were carried out using a prism coupler spectrometer and found that the optical birefringence is 0.0822 for 532 nm and 0.705 for 1064 nm. A thermal conductivity (κ) study reveals that the doped sample has a lower κ value than the undoped equivalent.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008340" xmlns="http://purl.org/rss/1.0/"><title>Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. I. Theoretical concept</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008340</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. I. Theoretical concept</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">M. Meixner, M. Klaus, Ch. Genzel</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813008340</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813008340</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008340</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">610</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">618</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The influence of the gauge volume size and shape on the analysis of steep near-surface residual stress gradients by means of energy-dispersive synchrotron diffraction is studied theoretically. Cases are considered where the irradiated sample volume is confined by narrow-slit systems, in both the primary and the diffracted beam, to dimensions comparable to the `natural' 1/<em>e</em> information depth τ<sub>1/<em>e</em></sub> of the X-rays. It is shown that the ratio between τ<sub>1/e</sub>, defined by the material's absorption, and the immersion depth <em>h</em><sup>GV</sup> of the gauge volume into the sample is the crucial parameter that shapes the <em>d</em><sub>ψ</sub><sup><em>hkl</em></sup> or ɛ<sub>ψ</sub><sup><em>hkl</em></sup><em>versus</em> sin<sup>2</sup>ψ distributions obtained in the Ψ mode of X-ray stress analysis. Since the actual information depth 〈<em>z</em>〉<sup>GV</sup> to which the measured X-ray signal has to be assigned is a superposition of geometrical and exponential weighting functions, ambiguities in the conventional plot of the Laplace stresses <em>versus</em>〈<em>z</em>〉<sup>GV</sup> may occur for measurements performed using narrow-slit configurations. To avoid conflicts in data analysis in these cases, a modified formalism is proposed for the evaluation of the real space residual stress profiles σ<sub>||</sub>(<em>z</em>), which is based on a two-dimensional least-squares fit procedure.</p></div>
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The influence of the gauge volume size and shape on the analysis of steep near-surface residual stress gradients by means of energy-dispersive synchrotron diffraction is studied theoretically. Cases are considered where the irradiated sample volume is confined by narrow-slit systems, in both the primary and the diffracted beam, to dimensions comparable to the `natural' 1/e information depth τ1/e of the X-rays. It is shown that the ratio between τ1/e, defined by the material's absorption, and the immersion depth hGV of the gauge volume into the sample is the crucial parameter that shapes the dψhkl or ɛψhklversus sin2ψ distributions obtained in the Ψ mode of X-ray stress analysis. Since the actual information depth 〈z〉GV to which the measured X-ray signal has to be assigned is a superposition of geometrical and exponential weighting functions, ambiguities in the conventional plot of the Laplace stresses versus〈z〉GV may occur for measurements performed using narrow-slit configurations. To avoid conflicts in data analysis in these cases, a modified formalism is proposed for the evaluation of the real space residual stress profiles σ||(z), which is based on a two-dimensional least-squares fit procedure.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008364" xmlns="http://purl.org/rss/1.0/"><title>Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008364</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">M. Meixner, M. Klaus, Ch. Genzel</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813008364</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813008364</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008364</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">619</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">627</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>On the basis of the theoretical concept for the use of small gauge volumes to study near-surface residual stress fields with high spatial resolution [Meixner, Klaus &amp; Genzel (2013). <em>J. Appl. Cryst.</em><b>46</b>, 610–618], the experimental implementation of the approach is demonstrated. It is shown that specifically designed slit systems are required to avoid effects such as diffuse scattering at the slit blades and total external reflection, both giving rise to a reduced resolution. Starting from the characterization of the small gauge volume, practical guidance on how to control the alignment of the sample relative to the gauge volume for different geometrical conditions of energy-dispersive diffraction is given. The narrow-slit configuration as well as the formalism for data evaluation introduced in the first part of this series is applied to the analysis of a very steep in-plane residual stress gradient in a shot-peened Al<sub>2</sub>O<sub>3</sub> ceramic sample. The results are compared with those obtained by means of a conventional wide-slit setup using the classical universal plot method for residual stress analysis on the one hand, and with the simulations performed in the first part on the other hand.</p></div>
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On the basis of the theoretical concept for the use of small gauge volumes to study near-surface residual stress fields with high spatial resolution [Meixner, Klaus &amp; Genzel (2013). J. Appl. Cryst.46, 610–618], the experimental implementation of the approach is demonstrated. It is shown that specifically designed slit systems are required to avoid effects such as diffuse scattering at the slit blades and total external reflection, both giving rise to a reduced resolution. Starting from the characterization of the small gauge volume, practical guidance on how to control the alignment of the sample relative to the gauge volume for different geometrical conditions of energy-dispersive diffraction is given. The narrow-slit configuration as well as the formalism for data evaluation introduced in the first part of this series is applied to the analysis of a very steep in-plane residual stress gradient in a shot-peened Al2O3 ceramic sample. The results are compared with those obtained by means of a conventional wide-slit setup using the classical universal plot method for residual stress analysis on the one hand, and with the simulations performed in the first part on the other hand.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008194" xmlns="http://purl.org/rss/1.0/"><title>Analytical model for neutron diffraction peak shifts due to the surface effect</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008194</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Analytical model for neutron diffraction peak shifts due to the surface effect</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Jan Šaroun, Joana Rebelo Kornmeier, Michael Hofmann, Pavol Mikula, Miroslav Vrána</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813008194</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813008194</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008194</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">628</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">638</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Residual strains measured by neutron diffraction near sample boundaries can be biased by the surface effect as a result of incomplete filling of the instrumental gauge volume. This effect is manifested as anomalous shifts of diffraction lines, which can be falsely interpreted as a lattice strain unless appropriate data corrections are made. A new analytical model for the surface effect has been developed, which covers a broad variety of instrumental arrangements, including flat mosaic and bent perfect crystal monochromators, narrow slits, and Soller and radial collimators. This model permits the spurious peak shifts to be predicted quantitatively, and also allows the optimum configuration parameters, such as curvature of a focusing monochromator, which lead to suppression of the surface effect, to be calculated. The model has been thoroughly validated by comparisons with Monte Carlo simulations and experiments on a stress-free calibration sample. Predictions of the model proved to be very accurate, often within the interval of experimental errors, which makes it suitable for use in data analysis.</p></div>
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Residual strains measured by neutron diffraction near sample boundaries can be biased by the surface effect as a result of incomplete filling of the instrumental gauge volume. This effect is manifested as anomalous shifts of diffraction lines, which can be falsely interpreted as a lattice strain unless appropriate data corrections are made. A new analytical model for the surface effect has been developed, which covers a broad variety of instrumental arrangements, including flat mosaic and bent perfect crystal monochromators, narrow slits, and Soller and radial collimators. This model permits the spurious peak shifts to be predicted quantitatively, and also allows the optimum configuration parameters, such as curvature of a focusing monochromator, which lead to suppression of the surface effect, to be calculated. The model has been thoroughly validated by comparisons with Monte Carlo simulations and experiments on a stress-free calibration sample. Predictions of the model proved to be very accurate, often within the interval of experimental errors, which makes it suitable for use in data analysis.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007693" xmlns="http://purl.org/rss/1.0/"><title>Surface diffraction on a ψ-circle diffractometer using the χ-axis geometry</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007693</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Surface diffraction on a ψ-circle diffractometer using the χ-axis geometry</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Tim T. Fister, Paul H. Fuoss, Dillon D. Fong, Jeffrey A. Eastman, Chad M. Folkman, Stephan O. Hruszkewycz, Matthew J. Highland, Hua Zhou, Paul Fenter</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813007693</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813007693</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007693</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">639</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">643</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The restricted volume above and below the sample on a six-circle diffractometer can limit the size and complexity of sample environments used in surface diffraction studies. An alternative configuration of the diffractometer, where the sample normal is aligned parallel to the χ axis, allows for ample space above and below the χ circle for instrumentation. The merits of this approach are outlined and angles are derived for the diffraction condition for constant-incident-angle, constant-sample-azimuthal-angle and specular geometries. Using a version of this code written for <em>SPEC</em> (<!--TODO: clickthrough URL--><a href="http://www.certif.com/content/spec/" title="Link to external resource: http://www.certif.com/content/spec/">http://www.certif.com/content/spec/</a>), sample specular and nonspecular crystal truncation rods measured from a 5 nm-thick thin film are presented.</p></div>
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The restricted volume above and below the sample on a six-circle diffractometer can limit the size and complexity of sample environments used in surface diffraction studies. An alternative configuration of the diffractometer, where the sample normal is aligned parallel to the χ axis, allows for ample space above and below the χ circle for instrumentation. The merits of this approach are outlined and angles are derived for the diffraction condition for constant-incident-angle, constant-sample-azimuthal-angle and specular geometries. Using a version of this code written for SPEC (http://www.certif.com/content/spec/), sample specular and nonspecular crystal truncation rods measured from a 5 nm-thick thin film are presented.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010546" xmlns="http://purl.org/rss/1.0/"><title>Structural study of Yb1–xTbxMnO3 manganites: site occupancy and coexistence of hexagonal and orthorhombic phases</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010546</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Structural study of Yb1–xTbxMnO3 manganites: site occupancy and coexistence of hexagonal and orthorhombic phases</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Mónica Esperanza Bolívar Guarín, Alexandre de Melo Moreira, Nivaldo Lúcio Speziali</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813010546</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813010546</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010546</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">644</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">648</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Polycrystalline samples of mixed Yb<sub>1−<em>x</em></sub>Tb<sub><em>x</em></sub>MnO<sub>3</sub> (<em>x</em> = 0, 0.25, 0.50, 0.75 and 1) were prepared by a solid state reaction procedure. Detailed crystal structure studies were performed using X-ray diffraction data obtained at room temperature. The application of the Rietveld method confirmed the reported hexagonal <em>P</em>6<sub>3</sub><em>cm</em> and orthorhombic <em>Pnma</em> phases for <em>x</em> = 0 (YbMnO<sub>3</sub>) and <em>x</em> = 1 (TbMnO<sub>3</sub>), respectively. A single hexagonal phase was also observed for <em>x</em> = 0.25, while in the case of <em>x</em> = 0.50 and <em>x</em> = 0.75 both phases coexist in the produced samples. Crystallographic parameters for the pure compounds are in agreement with those found in the literature. Changes in the lattice parameters, unit-cell volume, polyhedral distortions and tilting observed in the mixed compounds are explained as a function of <em>x</em>. Sharing of Tb<sup>3+</sup> and Yb<sup>3+</sup> ions between different sites is discussed.</p></div>
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Polycrystalline samples of mixed Yb1−xTbxMnO3 (x = 0, 0.25, 0.50, 0.75 and 1) were prepared by a solid state reaction procedure. Detailed crystal structure studies were performed using X-ray diffraction data obtained at room temperature. The application of the Rietveld method confirmed the reported hexagonal P63cm and orthorhombic Pnma phases for x = 0 (YbMnO3) and x = 1 (TbMnO3), respectively. A single hexagonal phase was also observed for x = 0.25, while in the case of x = 0.50 and x = 0.75 both phases coexist in the produced samples. Crystallographic parameters for the pure compounds are in agreement with those found in the literature. Changes in the lattice parameters, unit-cell volume, polyhedral distortions and tilting observed in the mixed compounds are explained as a function of x. Sharing of Tb3+ and Yb3+ ions between different sites is discussed.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300592X" xmlns="http://purl.org/rss/1.0/"><title>Element-selective charge density visualization of endohedral metallofullerenes using synchrotron X-ray multi-wavelength anomalous powder diffraction data</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300592X</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Element-selective charge density visualization of endohedral metallofullerenes using synchrotron X-ray multi-wavelength anomalous powder diffraction data</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Sachiko Maki, Eiji Nishibori, Daisuke Kawaguchi, Makoto Sakata, Masaki Takata, Takashi Inoue, Hisanori Shinohara</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S002188981300592X</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S002188981300592X</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300592X</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">649</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">655</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>An algorithm for determining the element-selective charge density has been developed using the maximum entropy method (MEM), Rietveld analysis and synchrotron X-ray multi-wavelength anomalous powder diffraction data. This article describes in detail both experimental and analytical aspects of the developed method. A structural study of yttrium mono-metallofullerene, Y@C<sub>82</sub>, 1:1 co-crystallized with toluene using the present technique is reported in order to demonstrate the applicability of the method even when only medium resolution data are available (<em>d</em> &gt; 1.32 Å). Element-selective MEM charge density maps, computed from synchrotron X-ray powder diffraction data collected at three distinct wavelengths around the yttrium <em>K</em>-absorption edge (∼0.727 A), are employed for determining three crystallographic sites of the disordered yttrium.</p></div>
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An algorithm for determining the element-selective charge density has been developed using the maximum entropy method (MEM), Rietveld analysis and synchrotron X-ray multi-wavelength anomalous powder diffraction data. This article describes in detail both experimental and analytical aspects of the developed method. A structural study of yttrium mono-metallofullerene, Y@C82, 1:1 co-crystallized with toluene using the present technique is reported in order to demonstrate the applicability of the method even when only medium resolution data are available (d &gt; 1.32 Å). Element-selective MEM charge density maps, computed from synchrotron X-ray powder diffraction data collected at three distinct wavelengths around the yttrium K-absorption edge (∼0.727 A), are employed for determining three crystallographic sites of the disordered yttrium.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006225" xmlns="http://purl.org/rss/1.0/"><title>Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006225</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Predicting anisotropic displacement parameters using molecular dynamics: density functional theory plus dispersion modelling of thermal motion in benzophenone</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Anthony M. Reilly, Derek A. Wann, Matthias J. Gutmann, Marek Jura, Carole A. Morrison, David W. H. Rankin</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813006225</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813006225</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006225</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">656</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">662</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The benefits of combining experimental and computational methods have been demonstrated by a study of the dynamics and solid-state structure of α-benzophenone. Dispersion-corrected and -uncorrected density functional theory molecular dynamics simulations were used to obtain displacement parameters, with the dispersion-corrected simulations showing good agreement with the experimental neutron and X-ray diffraction values. At 70 K, quantum-nuclear effects resulted in poor values for the hydrogen atoms, but the heavy-atom values still show excellent agreement, suggesting that molecular dynamics simulations can be a useful tool for determining displacement parameters where experimental data are poor or limited.</p></div>
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The benefits of combining experimental and computational methods have been demonstrated by a study of the dynamics and solid-state structure of α-benzophenone. Dispersion-corrected and -uncorrected density functional theory molecular dynamics simulations were used to obtain displacement parameters, with the dispersion-corrected simulations showing good agreement with the experimental neutron and X-ray diffraction values. At 70 K, quantum-nuclear effects resulted in poor values for the hydrogen atoms, but the heavy-atom values still show excellent agreement, suggesting that molecular dynamics simulations can be a useful tool for determining displacement parameters where experimental data are poor or limited.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006511" xmlns="http://purl.org/rss/1.0/"><title>Objective algorithm to separate signal from noise in a Poisson-distributed pixel data set</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006511</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Objective algorithm to separate signal from noise in a Poisson-distributed pixel data set</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Tine Straasø, Dirk Müter, Henning Osholm Sørensen, Jens Als-Nielsen</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813006511</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813006511</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006511</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">663</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">671</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>A statistical method to determine the background level and separate signal from background in a Poisson-distributed background data set is described. The algorithm eliminates the pixel with the highest intensity value in an iterative manner until the sample variance equals the sample mean within the estimated uncertainties. The eliminated pixels then contain signal superimposed on the background, so the integrated signal can be obtained by summation or by a simple extension by profile fitting depending on the user's preferences. Two additional steps remove `outliers' and correct for the underestimated extension of the peak area, respectively. The algorithm can be easily modified to specific needs, and an application on crystal truncation rods is presented, dealing with a sloping background.</p></div>
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A statistical method to determine the background level and separate signal from background in a Poisson-distributed background data set is described. The algorithm eliminates the pixel with the highest intensity value in an iterative manner until the sample variance equals the sample mean within the estimated uncertainties. The eliminated pixels then contain signal superimposed on the background, so the integrated signal can be obtained by summation or by a simple extension by profile fitting depending on the user's preferences. Two additional steps remove `outliers' and correct for the underestimated extension of the peak area, respectively. The algorithm can be easily modified to specific needs, and an application on crystal truncation rods is presented, dealing with a sloping background.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300770X" xmlns="http://purl.org/rss/1.0/"><title>Rat-tail tendon fiber SAXS high-order diffraction peaks recovered by a superbright laboratory source and a novel restoration algorithm</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300770X</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Rat-tail tendon fiber SAXS high-order diffraction peaks recovered by a superbright laboratory source and a novel restoration algorithm</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Liberato De Caro, Davide Altamura, Teresa Sibillano, Dritan Siliqi, Giovanni Filograsso, Oliver Bunk, Cinzia Giannini</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S002188981300770X</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S002188981300770X</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300770X</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">672</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">678</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The nanoscale structural order of air-dried rat-tail tendon is investigated using small-angle X-ray scattering (SAXS). SAXS fiber diffraction patterns were collected with a superbright laboratory microsource at XMI-LAB [Altamura, Lassandro, Vittoria, De Caro, Siliqi, Ladisa &amp; Giannini (2012). <em>J. Appl. Cryst.</em><b>45</b>, 869–873] for increasing integration times (up to 10 h) and a novel algorithm was used to estimate and subtract background, and to deconvolve the beam-divergence effects. Once the algorithm is applied, the peak visibility improves considerably and reciprocal space information up to the 22nd diffraction order is retrieved (<em>q</em> = 0.21 Å<sup>−1</sup>, <em>d</em> = 29 Å) for an 8–10 h integration time. The gain in the visibility is already significant for patterns collected for 0.5 h, at least on the more intense peaks. This demonstrates the viability of detecting structural changes on a molecular/nanoscale level in tissues with state-of-the-art laboratory sources and also the technical feasibility to adopt SAXS fiber diffraction as a future potential clinical indicator for disease.</p></div>
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The nanoscale structural order of air-dried rat-tail tendon is investigated using small-angle X-ray scattering (SAXS). SAXS fiber diffraction patterns were collected with a superbright laboratory microsource at XMI-LAB [Altamura, Lassandro, Vittoria, De Caro, Siliqi, Ladisa &amp; Giannini (2012). J. Appl. Cryst.45, 869–873] for increasing integration times (up to 10 h) and a novel algorithm was used to estimate and subtract background, and to deconvolve the beam-divergence effects. Once the algorithm is applied, the peak visibility improves considerably and reciprocal space information up to the 22nd diffraction order is retrieved (q = 0.21 Å−1, d = 29 Å) for an 8–10 h integration time. The gain in the visibility is already significant for patterns collected for 0.5 h, at least on the more intense peaks. This demonstrates the viability of detecting structural changes on a molecular/nanoscale level in tissues with state-of-the-art laboratory sources and also the technical feasibility to adopt SAXS fiber diffraction as a future potential clinical indicator for disease.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007991" xmlns="http://purl.org/rss/1.0/"><title> McXtrace: a Monte Carlo software package for simulating X-ray optics, beamlines and experiments</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007991</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/"> McXtrace: a Monte Carlo software package for simulating X-ray optics, beamlines and experiments</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Erik Bergbäck Knudsen, Andrea Prodi, Jana Baltser, Maria Thomsen, Peter Kjær Willendrup, Manuel Sanchez del Rio, Claudio Ferrero, Emmanuel Farhi, Kristoffer Haldrup, Anette Vickery, Robert Feidenhans'l, Kell Mortensen, Martin Meedom Nielsen, Henning Friis Poulsen, Søren Schmidt, Kim Lefmann</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813007991</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813007991</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813007991</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">679</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">696</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>This article presents the Monte Carlo simulation package <em>McXtrace</em>, intended for optimizing X-ray beam instrumentation and performing virtual X-ray experiments for data analysis. The system shares a structure and code base with the popular neutron simulation code <em>McStas</em> and is a good complement to the standard X-ray simulation software <em>SHADOW</em>. <em>McXtrace</em> is open source, licensed under the General Public License, and does not require the user to have access to any proprietary software for its operation. The structure of the software is described in detail, and various examples are given to showcase the versatility of the <em>McXtrace</em> procedure and outline a possible route to using Monte Carlo simulations in data analysis to gain new scientific insights. The studies performed span a range of X-ray experimental techniques: absorption tomography, powder diffraction, single-crystal diffraction and pump-and-probe experiments. Simulation studies are compared with experimental data and theoretical calculations. Furthermore, the simulation capabilities for computing coherent X-ray beam properties and a comparison with basic diffraction theory are presented.</p></div>
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This article presents the Monte Carlo simulation package McXtrace, intended for optimizing X-ray beam instrumentation and performing virtual X-ray experiments for data analysis. The system shares a structure and code base with the popular neutron simulation code McStas and is a good complement to the standard X-ray simulation software SHADOW. McXtrace is open source, licensed under the General Public License, and does not require the user to have access to any proprietary software for its operation. The structure of the software is described in detail, and various examples are given to showcase the versatility of the McXtrace procedure and outline a possible route to using Monte Carlo simulations in data analysis to gain new scientific insights. The studies performed span a range of X-ray experimental techniques: absorption tomography, powder diffraction, single-crystal diffraction and pump-and-probe experiments. Simulation studies are compared with experimental data and theoretical calculations. Furthermore, the simulation capabilities for computing coherent X-ray beam properties and a comparison with basic diffraction theory are presented.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300681X" xmlns="http://purl.org/rss/1.0/"><title>Development and applications of a new neutron single-crystal diffractometer based on a two-dimensional large-area curved position-sensitive detector</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300681X</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Development and applications of a new neutron single-crystal diffractometer based on a two-dimensional large-area curved position-sensitive detector</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Chang-Hee Lee, Yukio Noda, Yoshihisa Ishikawa, Shin Ae Kim, Myungkook Moon, Hiroyuki Kimura, Masashi Watanabe, Yuki Dohi</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S002188981300681X</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S002188981300681X</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300681X</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">697</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">708</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>A new single-crystal neutron diffractometer based on a large-area curved two-dimensional position-sensitive detector (C-2DPSD) has been developed. The diffractometer commissioning is almost complete, together with development of the measurement methodology and the raw data processing software package, the <em>Reciprocal Analyzer</em>, and the instrument is now ready to be launched for users. Position decoding of the C-2DPSD is <em>via</em> a delay-line readout method with an effective angular range of 110 × 54° in the horizontal and vertical directions, respectively, with a nominal radius of curvature of 530 mm. The diffractometer is equipped with a Ge(311) mosaic monochromator and two supermirror vacuum guide paths, one before and one after the monochromator position. The commissioning incorporates corrections and calibration of the instrument using an NaCl crystal, various applications such as crystallographic and magnetic structure measurements, a crystallinity check on large crystals, and a study on the composition or dopant content of a mixed crystal of (Tm<sub><em>x</em></sub>Yb<sub>1−<em>x</em></sub>)Mn<sub>2</sub>O<sub>5</sub>. The installation of the diffractometer and the measurement method, the calibration procedure and results, the raw data treatment and visualization, and several applications using the large C-2DPSD-based diffractometer are reported.</p></div>
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A new single-crystal neutron diffractometer based on a large-area curved two-dimensional position-sensitive detector (C-2DPSD) has been developed. The diffractometer commissioning is almost complete, together with development of the measurement methodology and the raw data processing software package, the Reciprocal Analyzer, and the instrument is now ready to be launched for users. Position decoding of the C-2DPSD is via a delay-line readout method with an effective angular range of 110 × 54° in the horizontal and vertical directions, respectively, with a nominal radius of curvature of 530 mm. The diffractometer is equipped with a Ge(311) mosaic monochromator and two supermirror vacuum guide paths, one before and one after the monochromator position. The commissioning incorporates corrections and calibration of the instrument using an NaCl crystal, various applications such as crystallographic and magnetic structure measurements, a crystallinity check on large crystals, and a study on the composition or dopant content of a mixed crystal of (TmxYb1−x)Mn2O5. The installation of the diffractometer and the measurement method, the calibration procedure and results, the raw data treatment and visualization, and several applications using the large C-2DPSD-based diffractometer are reported.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008182" xmlns="http://purl.org/rss/1.0/"><title>Growth of a three-dimensional anisotropic lattice of Ge quantum dots in an amorphous alumina matrix</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008182</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Growth of a three-dimensional anisotropic lattice of Ge quantum dots in an amorphous alumina matrix</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Maja Buljan, Olga Roshchupkina, Ana Šantić, Václav Holý, Carsten Baehtz, Arndt Mücklich, Lukáš Horák, Václav Valeš, Nikola Radić, Sigrid Bernstorff, Joerg Grenzer</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813008182</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813008182</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008182</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">709</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">715</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Simple processes for the preparation of semiconductor quantum dot lattices embedded in dielectric amorphous matrices play an important role in various nanotechnology applications. Of particular interest are quantum dot lattices with properties that differ significantly in different directions parallel to the material surface. Here, a simple method is demonstrated for the fabrication of an anisotropic lattice of Ge quantum dots in an amorphous Al<sub>2</sub>O<sub>3</sub> matrix by a self-assembly process. A specific deposition geometry with an oblique incidence of the Ge and Al<sub>2</sub>O<sub>3</sub> adparticles was used during magnetron sputtering deposition to achieve the desired anisotropy. The observed Ge quantum dot ordering is explained by a combination of directional diffusion of adparticles from the Ge and Al<sub>2</sub>O<sub>3</sub> targets and a shadowing process which occurs during deposition as a result of the specific surface morphology. The prepared material shows a strong anisotropy of the electrical conductivity in different directions parallel to the sample surface.</p></div>
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Simple processes for the preparation of semiconductor quantum dot lattices embedded in dielectric amorphous matrices play an important role in various nanotechnology applications. Of particular interest are quantum dot lattices with properties that differ significantly in different directions parallel to the material surface. Here, a simple method is demonstrated for the fabrication of an anisotropic lattice of Ge quantum dots in an amorphous Al2O3 matrix by a self-assembly process. A specific deposition geometry with an oblique incidence of the Ge and Al2O3 adparticles was used during magnetron sputtering deposition to achieve the desired anisotropy. The observed Ge quantum dot ordering is explained by a combination of directional diffusion of adparticles from the Ge and Al2O3 targets and a shadowing process which occurs during deposition as a result of the specific surface morphology. The prepared material shows a strong anisotropy of the electrical conductivity in different directions parallel to the sample surface.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008522" xmlns="http://purl.org/rss/1.0/"><title>Analysis of variant selection in friction-stir-processed high-strength low-alloy steels</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008522</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Analysis of variant selection in friction-stir-processed high-strength low-alloy steels</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Majid Abbasi, Tracy W. Nelson, Carl D. Sorensen</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813008522</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813008522</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008522</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">716</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">725</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Variant selection in friction-stir-welded high-strength low-alloy steels has been studied using the electron backscatter diffraction and prior austenite (PA) reconstruction techniques described in previous papers. A hypothesis for variant selection has been proposed based on grain-boundary interfacial energy and misorientation. This study focuses on austenite 〈111〉 boundaries with a two-dimensional approach. Results indicate that variant selection is strongly dependent on misorientation. Certain PA misorientations produce combinations of variants that minimize the interfacial energies between a ferrite nucleus and a neighboring austenite grain, and between adjoining ferrite nuclei along the boundary between two PA grains. PA grains that exhibit a 60°〈111〉 misorientation between them satisfy both these conditions for a combination of variants. These PA boundaries exhibit strong variant selection. As a result, the density of these boundary types influences the overall variant selection. Additionally, variant selection is more prevalent in small PA grains (&lt;150 µm), which is probably a result of limited intragranular nucleation. Nearly all variants are present in larger PA grains.</p></div>
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Variant selection in friction-stir-welded high-strength low-alloy steels has been studied using the electron backscatter diffraction and prior austenite (PA) reconstruction techniques described in previous papers. A hypothesis for variant selection has been proposed based on grain-boundary interfacial energy and misorientation. This study focuses on austenite 〈111〉 boundaries with a two-dimensional approach. Results indicate that variant selection is strongly dependent on misorientation. Certain PA misorientations produce combinations of variants that minimize the interfacial energies between a ferrite nucleus and a neighboring austenite grain, and between adjoining ferrite nuclei along the boundary between two PA grains. PA grains that exhibit a 60°〈111〉 misorientation between them satisfy both these conditions for a combination of variants. These PA boundaries exhibit strong variant selection. As a result, the density of these boundary types influences the overall variant selection. Additionally, variant selection is more prevalent in small PA grains (&lt;150 µm), which is probably a result of limited intragranular nucleation. Nearly all variants are present in larger PA grains.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300890X" xmlns="http://purl.org/rss/1.0/"><title>Contrast enhancement of data measured with area detectors: a way to generalize the use of neutron diffraction for thin-film studies</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300890X</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Contrast enhancement of data measured with area detectors: a way to generalize the use of neutron diffraction for thin-film studies</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Alexandre M. Bataille, Vincent Auvray, Christophe Gatel, Arsen Gukasov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S002188981300890X</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S002188981300890X</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981300890X</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">726</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">735</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>A denoising method is reported for the treatment of neutron scattering data obtained with position-sensitive detectors, which enhances the information obtained from weak and very weak Bragg peaks. The core element of the method is the application of a Laplacian of Gaussian filter calculated using the parameters of the resolution of the instrument. This adaptation of well established image-processing techniques offers a very efficient way to denoise the data, as shown through the application of the reported method to a study of the magnetic Bragg peaks of a 300 nm-thick epitaxial Cr film. The procedure enhances the contrast by a factor of more than 35 and thus allows precise determination of the position of the integration mask. The large contrast enhancement also lowers the detection threshold of standard elastic neutron diffractometers down to the level usually available solely on optimized triple-axis spectrometers.</p></div>
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A denoising method is reported for the treatment of neutron scattering data obtained with position-sensitive detectors, which enhances the information obtained from weak and very weak Bragg peaks. The core element of the method is the application of a Laplacian of Gaussian filter calculated using the parameters of the resolution of the instrument. This adaptation of well established image-processing techniques offers a very efficient way to denoise the data, as shown through the application of the reported method to a study of the magnetic Bragg peaks of a 300 nm-thick epitaxial Cr film. The procedure enhances the contrast by a factor of more than 35 and thus allows precise determination of the position of the integration mask. The large contrast enhancement also lowers the detection threshold of standard elastic neutron diffractometers down to the level usually available solely on optimized triple-axis spectrometers.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005785" xmlns="http://purl.org/rss/1.0/"><title>Thermal expansion and enhanced heat transfer in high-entropy alloys</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005785</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Thermal expansion and enhanced heat transfer in high-entropy alloys</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Chieh-Lien Lu, Sheng-Yi Lu, Jien-Wei Yeh, Wen-Kuang Hsu</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813005785</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813005785</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005785</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">736</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">739</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Alloys made from equimolar mixtures of more than five elements exhibit an improved thermal diffusivity at elevated temperatures, and the improvement reaches 20% at 423 K and 50% at 573 K. This phenomenon is identified from the lengthened mean free path upon thermal expansion, and lengthening scales with lattice dilation over a wide range of temperatures.</p></div>
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Alloys made from equimolar mixtures of more than five elements exhibit an improved thermal diffusivity at elevated temperatures, and the improvement reaches 20% at 423 K and 50% at 573 K. This phenomenon is identified from the lengthened mean free path upon thermal expansion, and lengthening scales with lattice dilation over a wide range of temperatures.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301008X" xmlns="http://purl.org/rss/1.0/"><title>A geometrical approach for semi-automated crystal centering and in situ X-ray diffraction data collection</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301008X</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">A geometrical approach for semi-automated crystal centering and in situ X-ray diffraction data collection</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Mohammad Yaser Heidari Khajepour, Hugo Lebrette, Xavier Vernede, Pierrick Rogues, Jean-Luc Ferrer</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S002188981301008X</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S002188981301008X</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301008X</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">740</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">745</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>High-throughput protein crystallography projects pushed forward the development of automated crystallization platforms that are now commonly used. This created an urgent need for adapted and automated equipment for crystal analysis. However, first these crystals have to be harvested, cryo-protected and flash-cooled, operations that can fail or negatively impact on the crystal. <em>In situ</em> X-ray diffraction analysis has become a valid alternative to these operations, and a growing number of users apply it for crystal screening and to solve structures. Nevertheless, even this shortcut may require a significant amount of beam time. In this <em>in situ</em> high-throughput approach, the centering of crystals relative to the beam represents the bottleneck in the analysis process. In this article, a new method to accelerate this process, by recording accurately the local geometry coordinates for each crystal in the crystallization plate, is presented. Subsequently, the crystallization plate can be presented to the X-ray beam by an automated plate-handling device, such as a six-axis robot arm, for an automated crystal centering in the beam, <em>in situ</em> screening or data collection. Here the preliminary results of such a semi-automated pipeline are reported for two distinct test proteins.</p></div>
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High-throughput protein crystallography projects pushed forward the development of automated crystallization platforms that are now commonly used. This created an urgent need for adapted and automated equipment for crystal analysis. However, first these crystals have to be harvested, cryo-protected and flash-cooled, operations that can fail or negatively impact on the crystal. In situ X-ray diffraction analysis has become a valid alternative to these operations, and a growing number of users apply it for crystal screening and to solve structures. Nevertheless, even this shortcut may require a significant amount of beam time. In this in situ high-throughput approach, the centering of crystals relative to the beam represents the bottleneck in the analysis process. In this article, a new method to accelerate this process, by recording accurately the local geometry coordinates for each crystal in the crystallization plate, is presented. Subsequently, the crystallization plate can be presented to the X-ray beam by an automated plate-handling device, such as a six-axis robot arm, for an automated crystal centering in the beam, in situ screening or data collection. Here the preliminary results of such a semi-automated pipeline are reported for two distinct test proteins.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301025X" xmlns="http://purl.org/rss/1.0/"><title>A new technique to grow incongruent melting Ga:YIG crystals: the edge-defined film-fed growth method</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301025X</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">A new technique to grow incongruent melting Ga:YIG crystals: the edge-defined film-fed growth method</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Naifeng Zhuang, Wenbing Chen, Lijun Shi, Jianbiao Nie, Xiaolin Hu, Bin Zhao, Shukun Lin, Jianzhong Chen</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S002188981301025X</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S002188981301025X</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS002188981301025X</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">746</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">751</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Crystalline yttrium iron garnet (YIG) is an important magneto-optical material. However, this crystal is an incongruent melting compound. As is well known, compared to the crystal growth of a congruent melting compound by using the Czochralski method, the crystal growth of an incongruent melting compound is more difficult. In this work, a system for growing Ga:YIG single crystals by the edge-defined film-fed growth (EFG) method was designed and constructed, and the mechanism of crystal growth was also preliminarily studied. The Ga<sup>3+</sup> dopant concentration, the Curie temperature and the transmission spectra of as-grown crystals were investigated to evaluate their potential application in magneto-optical devices. The success of growing Ga:YIG crystals by the EFG method provides a new way to grow other incongruent melting compounds.</p></div>
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Crystalline yttrium iron garnet (YIG) is an important magneto-optical material. However, this crystal is an incongruent melting compound. As is well known, compared to the crystal growth of a congruent melting compound by using the Czochralski method, the crystal growth of an incongruent melting compound is more difficult. In this work, a system for growing Ga:YIG single crystals by the edge-defined film-fed growth (EFG) method was designed and constructed, and the mechanism of crystal growth was also preliminarily studied. The Ga3+ dopant concentration, the Curie temperature and the transmission spectra of as-grown crystals were investigated to evaluate their potential application in magneto-optical devices. The success of growing Ga:YIG crystals by the EFG method provides a new way to grow other incongruent melting compounds.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009023" xmlns="http://purl.org/rss/1.0/"><title>Advances in small-angle X-ray scattering for the study of supported catalysts</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009023</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Advances in small-angle X-ray scattering for the study of supported catalysts</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Y. V. Larichev, F. V. Tuzikov</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813009023</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813009023</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009023</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">752</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">757</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Ru particle sizes in supported ruthenium catalysts have been studied by small-angle X-ray scattering (SAXS). It has been proposed to use new masking liquids with a relatively low X-ray radiation absorption. Using these liquids it was possible to achieve practically quantitative agreement between SAXS and transmission electron microscopy data. The SAXS technique employing such masking liquids can be used as a quick analytical method for determining the particle size distributions of supported metals. Fluorocarbon liquids can eliminate the scattering signal from any support with a density of 2.5 g cm<sup>−3</sup> or less. This procedure can be very useful for selective study of separate components in complex samples consisting of carbon materials, silica materials, polymers, some hydroxides, clays <em>etc</em>.</p></div>
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Ru particle sizes in supported ruthenium catalysts have been studied by small-angle X-ray scattering (SAXS). It has been proposed to use new masking liquids with a relatively low X-ray radiation absorption. Using these liquids it was possible to achieve practically quantitative agreement between SAXS and transmission electron microscopy data. The SAXS technique employing such masking liquids can be used as a quick analytical method for determining the particle size distributions of supported metals. Fluorocarbon liquids can eliminate the scattering signal from any support with a density of 2.5 g cm−3 or less. This procedure can be very useful for selective study of separate components in complex samples consisting of carbon materials, silica materials, polymers, some hydroxides, clays etc.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010509" xmlns="http://purl.org/rss/1.0/"><title>New insight into pressure-induced phase transitions of amorphous silicon: the role of impurities</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010509</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">New insight into pressure-induced phase transitions of amorphous silicon: the role of impurities</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Bianca Haberl, Malcolm Guthrie, David J. Sprouster, Jim S. Williams, Jodie E. Bradby</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813010509</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813010509</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010509</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">758</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">768</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The pressure-induced phase transformations of a form of amorphous silicon (a-Si) with well characterized impurity levels and structure are examined at pressures up to 40 GPa using <em>in situ</em> synchrotron X-ray radiation. At ∼12 GPa crystallization commences, but it is not completed until ∼16 GPa. At higher pressures, not all the crystalline phases observed for crystalline silicon (c-Si) appear. On pressure release, none of the metastable crystalline phases observed for c-Si nucleate. Instead an amorphous phase is re-formed. This is in contrast to all previous diamond-anvil studies on a-Si. If full pressure-induced crystallization occurred, the material remained crystalline on unloading. The formation of a-Si upon unloading was only observed when a high-density amorphous phase was reported on loading. The fully characterized nature of the a-Si used in this current study allows for the interpretation of this significant diversity in terms of impurity content of the a-Si used. Namely, this suggests that `ideal' (pure, voidless, structurally relaxed) a-Si will follow the same transition pathway as observed for c-Si, while crystallization of a-Si forms with a high impurity content is retarded or even inhibited. The a-Si used here straddles both regimes and thus, although full crystallization occurs, the more complex crystalline structures fail to nucleate.</p></div>
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The pressure-induced phase transformations of a form of amorphous silicon (a-Si) with well characterized impurity levels and structure are examined at pressures up to 40 GPa using in situ synchrotron X-ray radiation. At ∼12 GPa crystallization commences, but it is not completed until ∼16 GPa. At higher pressures, not all the crystalline phases observed for crystalline silicon (c-Si) appear. On pressure release, none of the metastable crystalline phases observed for c-Si nucleate. Instead an amorphous phase is re-formed. This is in contrast to all previous diamond-anvil studies on a-Si. If full pressure-induced crystallization occurred, the material remained crystalline on unloading. The formation of a-Si upon unloading was only observed when a high-density amorphous phase was reported on loading. The fully characterized nature of the a-Si used in this current study allows for the interpretation of this significant diversity in terms of impurity content of the a-Si used. Namely, this suggests that `ideal' (pure, voidless, structurally relaxed) a-Si will follow the same transition pathway as observed for c-Si, while crystallization of a-Si forms with a high impurity content is retarded or even inhibited. The a-Si used here straddles both regimes and thus, although full crystallization occurs, the more complex crystalline structures fail to nucleate.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008923" xmlns="http://purl.org/rss/1.0/"><title>Determination of the distribution of elements with similar electron counts: a practical guide for resonant X-ray scattering</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008923</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Determination of the distribution of elements with similar electron counts: a practical guide for resonant X-ray scattering</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Simon Welzmiller, Philipp Urban, Felix Fahrnbauer, Loredana Erra, Oliver Oeckler</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813008923</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813008923</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008923</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">769</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">778</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>This article attempts to present straightforward and easy-to-understand guidelines for the determination of element distribution in compounds lacking X-ray scattering contrast because they have similar electron counts. Different sources of anomalous dispersion correction terms (especially Δ<em>f</em>′ values) are compared with respect to their suitability, reliability and quality. Values from databases are compared with Δ<em>f</em> values calculated from fluorescence spectra and those refined from single-crystal diffraction data, using both reference crystals without scattering contrast problems and crystals containing elements with similar electron counts. The number of data sets required to determine reliably the element distribution and the optimum wavelengths to be used are discussed. Joint multiple data set refinements are suitable for the refinement of multiply mixed occupancies of elements lacking scattering contrast. The most straightforward method of obtaining Δ<em>f</em>′ values depends on the complexity of the problem to be solved and the precision required.</p></div>
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This article attempts to present straightforward and easy-to-understand guidelines for the determination of element distribution in compounds lacking X-ray scattering contrast because they have similar electron counts. Different sources of anomalous dispersion correction terms (especially Δf′ values) are compared with respect to their suitability, reliability and quality. Values from databases are compared with Δf values calculated from fluorescence spectra and those refined from single-crystal diffraction data, using both reference crystals without scattering contrast problems and crystals containing elements with similar electron counts. The number of data sets required to determine reliably the element distribution and the optimum wavelengths to be used are discussed. Joint multiple data set refinements are suitable for the refinement of multiply mixed occupancies of elements lacking scattering contrast. The most straightforward method of obtaining Δf′ values depends on the complexity of the problem to be solved and the precision required.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010571" xmlns="http://purl.org/rss/1.0/"><title>The hybrid big bang–big crunch method for solving crystal structure from powder diffraction data</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010571</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">The hybrid big bang–big crunch method for solving crystal structure from powder diffraction data</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Angela Altomare, Nicola Corriero, Corrado Cuocci, Anna Moliterni, Rosanna Rizzi</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813010571</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813010571</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010571</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">779</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">787</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The big bang–big crunch method is a global optimization approach developed upon the analogy of one of the cosmological theories of the evolution of the universe. It has been suitably combined with a simulated annealing algorithm and used for solving crystal structure from powder diffraction data in direct space. When compared with the traditional simulated annealing method, it provides a significant advance: good solutions are attained in a shorter time. The new method has been implemented in the <em>EXPO</em> package. Its successful application is demonstrated with examples of already known structures.</p></div>
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The big bang–big crunch method is a global optimization approach developed upon the analogy of one of the cosmological theories of the evolution of the universe. It has been suitably combined with a simulated annealing algorithm and used for solving crystal structure from powder diffraction data in direct space. When compared with the traditional simulated annealing method, it provides a significant advance: good solutions are attained in a shorter time. The new method has been implemented in the EXPO package. Its successful application is demonstrated with examples of already known structures.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005402" xmlns="http://purl.org/rss/1.0/"><title>Autocorrelation function of the spin misalignment in magnetic small-angle neutron scattering: application to nanocrystalline metals</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005402</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Autocorrelation function of the spin misalignment in magnetic small-angle neutron scattering: application to nanocrystalline metals</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Andreas Michels, Jens-Peter Bick</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813005402</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813005402</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005402</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">788</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">790</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Real-space magnetic small-angle neutron scattering data from nanocrystalline cobalt and nickel have been analysed in terms of a recently developed micromagnetic theory for the autocorrelation function of the spin misalignment [Michels (2010). <em>Phys. Rev. B</em>, <b>82</b>, 024433]. The approach provides information on the exchange-stiffness constant and on the mean magnetic `anisotropy-field' radius.</p></div>
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Real-space magnetic small-angle neutron scattering data from nanocrystalline cobalt and nickel have been analysed in terms of a recently developed micromagnetic theory for the autocorrelation function of the spin misalignment [Michels (2010). Phys. Rev. B, 82, 024433]. The approach provides information on the exchange-stiffness constant and on the mean magnetic `anisotropy-field' radius.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005888" xmlns="http://purl.org/rss/1.0/"><title>Using a non-monochromatic microbeam for serial snapshot crystallography</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005888</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Using a non-monochromatic microbeam for serial snapshot crystallography</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Catherine Dejoie, Lynne B. McCusker, Christian Baerlocher, Rafael Abela, Bruce D. Patterson, Martin Kunz, Nobumichi Tamura</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813005888</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813005888</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005888</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">791</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">794</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The new X-ray free-electron laser source (SwissFEL) that is currently being developed at PSI will provide a broad-bandpass mode with an energy bandwidth of about 4%. By using the full energy range, a new option for structural studies of crystalline materials may become possible. The proof of concept of broad-bandpass diffraction presented here is based on Laue single-crystal microdiffraction and the experimental setup on BL12.3.2 at the Advanced Light Source in Berkeley. Diffraction patterns for 100 randomly oriented stationary crystallites of the <b>MFI</b>-type zeolite ZSM-5 were simulated assuming several bandwidths, and the statistical and structural results are discussed. With a 4% energy bandwidth, the number of reflection intensities measured in a single shot is significantly higher than with monochromatic radiation. Furthermore, the problem of partial reflection measurement, which is inherent to the monochromatic mode with stationary crystals, can be overcome.</p></div>
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The new X-ray free-electron laser source (SwissFEL) that is currently being developed at PSI will provide a broad-bandpass mode with an energy bandwidth of about 4%. By using the full energy range, a new option for structural studies of crystalline materials may become possible. The proof of concept of broad-bandpass diffraction presented here is based on Laue single-crystal microdiffraction and the experimental setup on BL12.3.2 at the Advanced Light Source in Berkeley. Diffraction patterns for 100 randomly oriented stationary crystallites of the MFI-type zeolite ZSM-5 were simulated assuming several bandwidths, and the statistical and structural results are discussed. With a 4% energy bandwidth, the number of reflection intensities measured in a single shot is significantly higher than with monochromatic radiation. Furthermore, the problem of partial reflection measurement, which is inherent to the monochromatic mode with stationary crystals, can be overcome.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008030" xmlns="http://purl.org/rss/1.0/"><title>The current approach to initial crystallization screening of proteins is under-sampled</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008030</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">The current approach to initial crystallization screening of proteins is under-sampled</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Fabrice Gorrec</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813008030</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813008030</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813008030</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">795</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">797</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>Protein crystallization conditions that resulted in crystal structures published by scientists at the MRC Laboratory of Molecular Biology (MRC-LMB, Cambridge, UK) have been analysed. It was observed that the more often a crystallization reagent had been used to formulate the initial conditions, the more often it was found in the reported conditions that yielded diffraction quality crystals. The present analysis shows that, despite the broad variety of reagents, they have the same impact overall on the yield of crystal structures. More interestingly, the correlation implies that, although the initial crystallization screen may be considered very large, it is an under-sampled combinatorial approach.</p></div>
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Protein crystallization conditions that resulted in crystal structures published by scientists at the MRC Laboratory of Molecular Biology (MRC-LMB, Cambridge, UK) have been analysed. It was observed that the more often a crystallization reagent had been used to formulate the initial conditions, the more often it was found in the reported conditions that yielded diffraction quality crystals. The present analysis shows that, despite the broad variety of reagents, they have the same impact overall on the yield of crystal structures. More interestingly, the correlation implies that, although the initial crystallization screen may be considered very large, it is an under-sampled combinatorial approach.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009126" xmlns="http://purl.org/rss/1.0/"><title>Determination of crystal symmetry for Bi4Ti3O12-based ferroelectrics by using electron diffraction</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009126</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Determination of crystal symmetry for Bi4Ti3O12-based ferroelectrics by using electron diffraction</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Wanneng Ye, Chaojing Lu, Peng You, Kun Liang, Yichun Zhou</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813009126</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813009126</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009126</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">798</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">800</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>In recent years, inconsistent space groups of monoclinic <em>B</em>1<em>a</em>1 and orthorhombic <em>B</em>2<em>cb</em> have been reported for the room-temperature ferroelectric phases of both Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub> and lanthanide-substituted Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>. In this article, the electron diffraction technique is employed to unambiguously clarify the crystal symmetries of ferroelectric Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub> and Bi<sub>3.15</sub>Nd<sub>0.85</sub>Ti<sub>3</sub>O<sub>12</sub> single crystals at room temperature. All the reflections observed from the two crystals match well with those derived from <em>B</em>1<em>a</em>1, but the observed reflections 010, 030, <img alt="inline image" src="http://onlinelibrary.wiley.com/store/10.1107/S0021889813009126/asset/equation/JCR_ks5339_mu1.gif?v=1&amp;s=1331ec4297d4ba2a3fb7fee7a88bf7bec521d972" class="inlineGraphic"/>10 and <img alt="inline image" src="http://onlinelibrary.wiley.com/store/10.1107/S0021889813009126/asset/equation/JCR_ks5339_mu1.gif?v=1&amp;s=1331ec4297d4ba2a3fb7fee7a88bf7bec521d972" class="inlineGraphic"/>30 should be forbidden in the case of <em>B</em>2<em>cb</em>. This fact indicates that both the ferroelectrics are of the space group <em>B</em>1<em>a</em>1 rather than <em>B</em>2<em>cb</em>, which is confirmed by convergent-beam electron diffraction observations. On the basis of the monoclinic space group <em>B</em>1<em>a</em>1, the lattice parameters of both the ferroelectrics were calculated by the Rietveld refinement of powder X-ray diffraction data.</p></div>
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In recent years, inconsistent space groups of monoclinic B1a1 and orthorhombic B2cb have been reported for the room-temperature ferroelectric phases of both Bi4Ti3O12 and lanthanide-substituted Bi4Ti3O12. In this article, the electron diffraction technique is employed to unambiguously clarify the crystal symmetries of ferroelectric Bi4Ti3O12 and Bi3.15Nd0.85Ti3O12 single crystals at room temperature. All the reflections observed from the two crystals match well with those derived from B1a1, but the observed reflections 010, 030, 10 and 30 should be forbidden in the case of B2cb. This fact indicates that both the ferroelectrics are of the space group B1a1 rather than B2cb, which is confirmed by convergent-beam electron diffraction observations. On the basis of the monoclinic space group B1a1, the lattice parameters of both the ferroelectrics were calculated by the Rietveld refinement of powder X-ray diffraction data.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009746" xmlns="http://purl.org/rss/1.0/"><title> Twiny: from morphology to twin element and vice versa</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009746</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/"> Twiny: from morphology to twin element and vice versa</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Massimo Nespolo, Cristian Iordache</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813009746</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813009746</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009746</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">801</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">803</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p><em>Twiny</em> is a small Fortran program for identification or confirmation of the twin element from the morphological analysis of twins. It takes as input the twin element and computes the angle between corresponding [<em>uvw</em>] directions in two individuals of the twin: the result can be used by the investigator to confirm or invalidate the supposed twin element. <em>Twiny</em> also accepts as input the angle measured on the sample and computes all possible twin elements compatible with this angle: the result helps the investigator to identify the twin element before any attempt to unravel the diffraction pattern of a twin.</p></div>
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Twiny is a small Fortran program for identification or confirmation of the twin element from the morphological analysis of twins. It takes as input the twin element and computes the angle between corresponding [uvw] directions in two individuals of the twin: the result can be used by the investigator to confirm or invalidate the supposed twin element. Twiny also accepts as input the angle measured on the sample and computes all possible twin elements compatible with this angle: the result helps the investigator to identify the twin element before any attempt to unravel the diffraction pattern of a twin.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006195" xmlns="http://purl.org/rss/1.0/"><title>Automatic processing of macromolecular crystallography X-ray diffraction data at the ESRF</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006195</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Automatic processing of macromolecular crystallography X-ray diffraction data at the ESRF</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Stéphanie Monaco, Elspeth Gordon, Matthew W. Bowler, Solange Delagenière, Matias Guijarro, Darren Spruce, Olof Svensson, Sean M. McSweeney, Andrew A. McCarthy, Gordon Leonard, Max H. Nanao</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813006195</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813006195</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006195</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">804</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">810</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The development of automated high-intensity macromolecular crystallography (MX) beamlines at synchrotron facilities has resulted in a remarkable increase in sample throughput. Developments in X-ray detector technology now mean that complete X-ray diffraction datasets can be collected in less than one minute. Such high-speed collection, and the volumes of data that it produces, often make it difficult for even the most experienced users to cope with the deluge. However, the careful reduction of data during experimental sessions is often necessary for the success of a particular project or as an aid in decision making for subsequent experiments. Automated data reduction pipelines provide a fast and reliable alternative to user-initiated processing at the beamline. In order to provide such a pipeline for the MX user community of the European Synchrotron Radiation Facility (ESRF), a system for the rapid automatic processing of MX diffraction data from single and multiple positions on a single or multiple crystals has been developed. Standard integration and data analysis programs have been incorporated into the ESRF data collection, storage and computing environment, with the final results stored and displayed in an intuitive manner in the ISPyB (information system for protein crystallography beamlines) database, from which they are also available for download. In some cases, experimental phase information can be automatically determined from the processed data. Here, the system is described in detail.</p></div>
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The development of automated high-intensity macromolecular crystallography (MX) beamlines at synchrotron facilities has resulted in a remarkable increase in sample throughput. Developments in X-ray detector technology now mean that complete X-ray diffraction datasets can be collected in less than one minute. Such high-speed collection, and the volumes of data that it produces, often make it difficult for even the most experienced users to cope with the deluge. However, the careful reduction of data during experimental sessions is often necessary for the success of a particular project or as an aid in decision making for subsequent experiments. Automated data reduction pipelines provide a fast and reliable alternative to user-initiated processing at the beamline. In order to provide such a pipeline for the MX user community of the European Synchrotron Radiation Facility (ESRF), a system for the rapid automatic processing of MX diffraction data from single and multiple positions on a single or multiple crystals has been developed. Standard integration and data analysis programs have been incorporated into the ESRF data collection, storage and computing environment, with the final results stored and displayed in an intuitive manner in the ISPyB (information system for protein crystallography beamlines) database, from which they are also available for download. In some cases, experimental phase information can be automatically determined from the processed data. Here, the system is described in detail.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005426" xmlns="http://purl.org/rss/1.0/"><title> SOWOS: an open-source program for the three-dimensional Wulff construction</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005426</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/"> SOWOS: an open-source program for the three-dimensional Wulff construction</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Daniele Scopece</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813005426</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813005426</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005426</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">811</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">816</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>A Fortran90 program for the determination of the Wulff construction, starting solely from the directions of the bounding facets (defined by the user), is presented. <em>SOWOS</em> stands for solid of Wulff open source, and the program is distributed freely with no charge to the user, being readily available to the community for immediate use. Its simple algorithm (which will be explained) allows the determination of complex solids with hundreds of facets in just seconds on any machine, requiring only a small amount of memory. It is able to determine even the smallest facets and shortest edges and to distinguish almost adjacent vertices. The output files give a complete range of information about the structure: the coordinates of the vertices and the facets common to them, the extension of the facets and bounding vertices, and the length of the edges and extreme vertices. These details enable the reconstruction of the shape in any other (commercial) software for further processing. Visualization is straightforward <em>via</em> the free program <em>gnuplot</em>. A feature for the creation of cubic crystal atomistic models of the resultant solids is included. The program may be a useful tool for crystallography, nanostructures and any other field where crystal facets are involved.</p></div>
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A Fortran90 program for the determination of the Wulff construction, starting solely from the directions of the bounding facets (defined by the user), is presented. SOWOS stands for solid of Wulff open source, and the program is distributed freely with no charge to the user, being readily available to the community for immediate use. Its simple algorithm (which will be explained) allows the determination of complex solids with hundreds of facets in just seconds on any machine, requiring only a small amount of memory. It is able to determine even the smallest facets and shortest edges and to distinguish almost adjacent vertices. The output files give a complete range of information about the structure: the coordinates of the vertices and the facets common to them, the extension of the facets and bounding vertices, and the length of the edges and extreme vertices. These details enable the reconstruction of the shape in any other (commercial) software for further processing. Visualization is straightforward via the free program gnuplot. A feature for the creation of cubic crystal atomistic models of the resultant solids is included. The program may be a useful tool for crystallography, nanostructures and any other field where crystal facets are involved.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009734" xmlns="http://purl.org/rss/1.0/"><title>Fast preparation of a desiccant array for the gradual desiccation method in protein crystallization screening</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009734</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Fast preparation of a desiccant array for the gradual desiccation method in protein crystallization screening</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Qin-Qin Lu, Xu-Zhuo Xie, Yong-Ming Liu, Hui-Meng Lu, Da Chen, Xu-Sheng Wang, Da-Chuan Yin</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813009734</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813009734</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813009734</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">817</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">822</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The gradual desiccation method (GDM) is a modification of the vapor diffusion method for protein crystallization screening. This method can dramatically increase the chances of obtaining protein crystals and is therefore potentially useful for practical protein crystallization screening. However, it is troublesome to prepare the desiccant for the GDM because each of the 96 desiccants must be of the same mass. Repeated manual weighing of the desiccant (at least 96 times for one plate) to obtain the same amount is required, and manual distribution of the weighed desiccants to the respective reservoir wells is also necessary. These procedures require a considerable amount of labor and thus lower the efficiency of the screening process. Additionally, they reduce the applicability of this method in routine protein crystallization screening. To solve this problem, a high-throughput method is proposed, which involves dispensing an aqueous solution of salts (a combination of CoCl<sub>2</sub> and AlCl<sub>3</sub>) into a droplet array (8 × 12, corresponding to the arrangement in a standard crystallization plate) on a piece of tape, then drying this array to obtain the final desiccant array. Simply covering and sealing this desiccant array over the crystallization droplets in the crystallization plate can give a perfect vapor diffusion screen. With this method, the labor and automation requirements of the GDM will be comparable to those of the conventional vapor diffusion method; furthermore, the amount of the desiccant can be easily and accurately controlled, allowing the GDM to be applied in daily protein crystallization screening.</p></div>
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The gradual desiccation method (GDM) is a modification of the vapor diffusion method for protein crystallization screening. This method can dramatically increase the chances of obtaining protein crystals and is therefore potentially useful for practical protein crystallization screening. However, it is troublesome to prepare the desiccant for the GDM because each of the 96 desiccants must be of the same mass. Repeated manual weighing of the desiccant (at least 96 times for one plate) to obtain the same amount is required, and manual distribution of the weighed desiccants to the respective reservoir wells is also necessary. These procedures require a considerable amount of labor and thus lower the efficiency of the screening process. Additionally, they reduce the applicability of this method in routine protein crystallization screening. To solve this problem, a high-throughput method is proposed, which involves dispensing an aqueous solution of salts (a combination of CoCl2 and AlCl3) into a droplet array (8 × 12, corresponding to the arrangement in a standard crystallization plate) on a piece of tape, then drying this array to obtain the final desiccant array. Simply covering and sealing this desiccant array over the crystallization droplets in the crystallization plate can give a perfect vapor diffusion screen. With this method, the labor and automation requirements of the GDM will be comparable to those of the conventional vapor diffusion method; furthermore, the amount of the desiccant can be easily and accurately controlled, allowing the GDM to be applied in daily protein crystallization screening.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005955" xmlns="http://purl.org/rss/1.0/"><title>A cautionary tale on the use of GE-7031 varnish: low-temperature thermal expansion studies of ScF3</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005955</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">A cautionary tale on the use of GE-7031 varnish: low-temperature thermal expansion studies of ScF3</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Cody R. Morelock, Matthew R. Suchomel, Angus P. Wilkinson</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813005955</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813005955</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813005955</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">823</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">825</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>GE-7031 varnish, a commonly used low-temperature adhesive and electrical insulator owing to its high thermal conductivity and mechanical strength at low temperatures, was used as a sample matrix for low-temperature powder X-ray diffraction measurements of the negative thermal expansion (NTE) material ScF<sub>3</sub>. When ScF<sub>3</sub> powder was mixed with GE-7031 varnish, an unexpected cubic to rhombohedral phase transition in the ScF<sub>3</sub> sample was observed at ∼50 K, and it exhibited smaller low-temperature unit-cell volumes than samples without the varnish matrix. Experimental observations and quantitative estimates suggest that these anomalies are the result of stress induced by a thermal expansion mismatch between the varnish matrix (large positive coefficient of thermal expansion, CTE) and ScF<sub>3</sub> (quite large negative CTE). The use of GE-7031 varnish as a sample matrix for low-temperature measurements should be approached with caution if a large thermal expansion mismatch is expected.</p></div>
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GE-7031 varnish, a commonly used low-temperature adhesive and electrical insulator owing to its high thermal conductivity and mechanical strength at low temperatures, was used as a sample matrix for low-temperature powder X-ray diffraction measurements of the negative thermal expansion (NTE) material ScF3. When ScF3 powder was mixed with GE-7031 varnish, an unexpected cubic to rhombohedral phase transition in the ScF3 sample was observed at ∼50 K, and it exhibited smaller low-temperature unit-cell volumes than samples without the varnish matrix. Experimental observations and quantitative estimates suggest that these anomalies are the result of stress induced by a thermal expansion mismatch between the varnish matrix (large positive coefficient of thermal expansion, CTE) and ScF3 (quite large negative CTE). The use of GE-7031 varnish as a sample matrix for low-temperature measurements should be approached with caution if a large thermal expansion mismatch is expected.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006912" xmlns="http://purl.org/rss/1.0/"><title>Low-temperature Debye–Scherrer powder diffraction on Beamline I11 at Diamond</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006912</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">Low-temperature Debye–Scherrer powder diffraction on Beamline I11 at Diamond</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">J. Potter, J. E. Parker, A. R. Lennie, S. P. Thompson, C. C. Tang</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813006912</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813006912</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006912</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">826</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">828</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>A bespoke capillary sample holder is described that attaches to the cold head of a commercially manufactured (PheniX) closed-cycle helium cryostat originally intended for flat-plate geometry. The new holder allows high-resolution synchrotron powder diffraction data to be collected from samples in Debye–Scherrer geometry over the temperature range 11–295 K. To demonstrate that high-quality powder data can be obtained using this new sample holder, structural refinement (Rietveld) and thermal expansion results measured from reference samples (Si and Al) are presented.</p></div>
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A bespoke capillary sample holder is described that attaches to the cold head of a commercially manufactured (PheniX) closed-cycle helium cryostat originally intended for flat-plate geometry. The new holder allows high-resolution synchrotron powder diffraction data to be collected from samples in Debye–Scherrer geometry over the temperature range 11–295 K. To demonstrate that high-quality powder data can be obtained using this new sample holder, structural refinement (Rietveld) and thermal expansion results measured from reference samples (Si and Al) are presented.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006742" xmlns="http://purl.org/rss/1.0/"><title>An efficient nanolitre-volume multi-channel device for highly viscous materials used in membrane protein crystallization</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006742</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">An efficient nanolitre-volume multi-channel device for highly viscous materials used in membrane protein crystallization</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Jinghui Luo, Raphaël Zwier, Jan Pieter Abrahams</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813006742</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813006742</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813006742</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">829</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">831</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>The crystal structures of various important membrane proteins could not have been solved without lipidic cubic phase (LCP) crystallization, and yet, compared to traditional <em>in surfo</em> crystallization, LCP crystallization is not widely used because its extreme viscosity makes the cubic phase difficult to handle. Robots that can dispense LCPs are very specialized and therefore very expensive. Here, an accurate multi-channel device is described. It dispenses LCPs onto glass plates down to volumes of 20 nl accuracy and has an accuracy of 10% when dispensing 200 nl – the lower bound of LCP volumes dispensed for crystallization trials. Because of its multi-channel tips, operation speed goes up by a factor of four compared to simpler devices. It can be operated by hand, but its design also allows it to be built into a basic dispensing robot. Thus, the device lowers the threshold for LCP crystallization of membrane proteins/peptides.</p></div>
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The crystal structures of various important membrane proteins could not have been solved without lipidic cubic phase (LCP) crystallization, and yet, compared to traditional in surfo crystallization, LCP crystallization is not widely used because its extreme viscosity makes the cubic phase difficult to handle. Robots that can dispense LCPs are very specialized and therefore very expensive. Here, an accurate multi-channel device is described. It dispenses LCPs onto glass plates down to volumes of 20 nl accuracy and has an accuracy of 10% when dispensing 200 nl – the lower bound of LCP volumes dispensed for crystallization trials. Because of its multi-channel tips, operation speed goes up by a factor of four compared to simpler devices. It can be operated by hand, but its design also allows it to be built into a basic dispensing robot. Thus, the device lowers the threshold for LCP crystallization of membrane proteins/peptides.
</description></item><item rdf:about="http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010558" xmlns="http://purl.org/rss/1.0/"><title>An electrically assisted device for protein crystallization in a vapor-diffusion setup</title><link>http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010558</link><dc:title xmlns:dc="http://purl.org/dc/elements/1.1/">An electrically assisted device for protein crystallization in a vapor-diffusion setup</dc:title><dc:creator xmlns:dc="http://purl.org/dc/elements/1.1/">Edith Flores-Hernández, Vivian Stojanoff, Roberto Arreguín-Espinosa, Abel Moreno, Nuria Sánchez-Puig</dc:creator><dc:date xmlns:dc="http://purl.org/dc/elements/1.1/">2013-05-15T08:28:48.861228-05:00</dc:date><dc:identifier xmlns:dc="http://purl.org/dc/elements/1.1/">doi:10.1107/S0021889813010558</dc:identifier><dc:rights xmlns:dc="http://purl.org/dc/elements/1.1/"/><dc:publisher xmlns:dc="http://purl.org/dc/elements/1.1/">John Wiley &amp; Sons, Inc.</dc:publisher><prism:doi xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">10.1107/S0021889813010558</prism:doi><prism:url xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">http://onlinelibrary.wiley.com/resolve/doi?DOI=10.1107%2FS0021889813010558</prism:url><prism:startingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">832</prism:startingPage><prism:endingPage xmlns:prism="http://prismstandard.org/namespaces/1.2/basic/">834</prism:endingPage><content:encoded xmlns:content="http://purl.org/rss/1.0/modules/content/"><![CDATA[
<div class="para" xmlns:ol="http://www.wiley.com/namespaces/ol/xsl-lib" xmlns="http://www.w3.org/1999/xhtml"><p>A new easy-to-use device has been designed and implemented for electric field-induced protein crystallization in a vapor-diffusion configuration. The device not only controls crystal nucleation by means of the electrical current, but also favors crystal growth owing to its vapor-diffusion setup. Crystallization was conducted in the presence of an internal electric field and direct current. The proteins investigated were lysozyme, as model protein, and 2TEL–lysozyme (a synthetic protein consisting of two tandem alpha helix motifs connected to a lysozyme moiety). Lysozyme crystals that grew attached to the cathode were larger than those grown attached to the anode or in the absence of an electric current. On the other hand, crystals of 2TEL–lysozyme qualitatively showed a better X-ray diffraction pattern when grown in the presence of an electric current.</p></div>
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A new easy-to-use device has been designed and implemented for electric field-induced protein crystallization in a vapor-diffusion configuration. The device not only controls crystal nucleation by means of the electrical current, but also favors crystal growth owing to its vapor-diffusion setup. Crystallization was conducted in the presence of an internal electric field and direct current. The proteins investigated were lysozyme, as model protein, and 2TEL–lysozyme (a synthetic protein consisting of two tandem alpha helix motifs connected to a lysozyme moiety). Lysozyme crystals that grew attached to the cathode were larger than those grown attached to the anode or in the absence of an electric current. On the other hand, crystals of 2TEL–lysozyme qualitatively showed a better X-ray diffraction pattern when grown in the presence of an electric current.
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