Volume 202, Issue 2 p. 173-173
Cover Picture

Influence of ridge geometry on lateral mode stability of (In/Al)GaN laser diodes

Ulrich T. Schwarz,

Corresponding Author

Institut für Experimentelle und Angewandte Physik, Universität Regensburg, Universitätsstr. 31, 93040 Regensburg, Germany

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Markus Pindl,

Institut für Experimentelle und Angewandte Physik, Universität Regensburg, Universitätsstr. 31, 93040 Regensburg, Germany

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Evi Sturm,

Institut für Experimentelle und Angewandte Physik, Universität Regensburg, Universitätsstr. 31, 93040 Regensburg, Germany

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Michael Furitsch,

OSRAM Opto Semiconductors GmbH, Wernerwerkstr. 2, 93040 Regensburg, Germany

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Andreas Leber,

OSRAM Opto Semiconductors GmbH, Wernerwerkstr. 2, 93040 Regensburg, Germany

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Stephan Miller,

OSRAM Opto Semiconductors GmbH, Wernerwerkstr. 2, 93040 Regensburg, Germany

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Alfred Lell,

OSRAM Opto Semiconductors GmbH, Wernerwerkstr. 2, 93040 Regensburg, Germany

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Volker Härle,

OSRAM Opto Semiconductors GmbH, Wernerwerkstr. 2, 93040 Regensburg, Germany

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First published: 13 January 2005
Citations: 1

Abstract

As a contribution to the current intense research efforts on wide band-gap semiconductor devices which are directed towards the development of commercial blue laser diodes, in this issue's Editor's Choice the optimization of the waveguide structure, to achieve stable laser mode operation, is investigated.

The cover picture shows the near-field intensity distribution of the fundamental and first order lateral modes of a blue (Al,In)GaN laser diode together with the double longitudinal mode comb associated with these modes.

The first author, Ulrich T. Schwarz, works on optical spectroscopy, characterization, and simulation of blue laser diodes and LEDs. Apart from semiconductor optoelectronics, the focus of his scientific interest is on modern optics, covering propagation invariant Bessel beams, Ince-Gaussian beams and optical vortices.

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