Volume 206, Issue 6 p. 1211-1214
Original Paper

High power broad ridge (Al,In)GaN laser diodes: Spatial and spectral stability

Harald Braun,

Corresponding Author

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

Phone: +49-941-9432466, Fax: +49-941-9434226Search for more papers by this author
Stephan Rogowsky,

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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Bernd Schmidtke,

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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Ulrich T. Schwarz,

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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Stefanie Brüninghoff,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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Alfred Lell,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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Uwe Strauß,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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First published: 03 June 2009

Abstract

To improve the output power of (Al,In)GaN laser diodes (LDs), the ridge width has to be increased, but beam quality of GaN-based broad area lasers is still a critical point. We present a multidimensional characterization of the optical laser mode, propagating from the near-into the far-field, and show that the formation of the characteristic multi-lobed lateral far-field pattern of broad ridge (Al,In)GaN LDs is the result of interfering, phase locked filaments, that build up the laser mode. In this context we show that variation of driving current or temperature may have an significant impact on the spectral and spatial stability of the laser beam. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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