Volume 248, Issue 3 p. 549-560
Feature Article

Three-dimensional GaN for semipolar light emitters

T. Wunderer,

Corresponding Author

Institute of Optoelectronics, Ulm University, 89069 Ulm, Germany

Phone: +49 731 5026454, Fax: +49 731 5026049.Search for more papers by this author
M. Feneberg,

Institute of Quantum Matter, Ulm University, 89069 Ulm, Germany

Institute of Experimental Physics, Otto-von-Guericke University, 39106 Magdeburg, Germany

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F. Lipski,

Institute of Optoelectronics, Ulm University, 89069 Ulm, Germany

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J. Wang,

Institute of Optoelectronics, Ulm University, 89069 Ulm, Germany

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R. A. R. Leute,

Institute of Optoelectronics, Ulm University, 89069 Ulm, Germany

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S. Schwaiger,

Institute of Optoelectronics, Ulm University, 89069 Ulm, Germany

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K. Thonke,

Institute of Quantum Matter, Ulm University, 89069 Ulm, Germany

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A. Chuvilin,

Central Facility of Electron Microscopy, Ulm University, 89069 Ulm, Germany

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U. Kaiser,

Central Facility of Electron Microscopy, Ulm University, 89069 Ulm, Germany

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S. Metzner,

Institute of Experimental Physics, Otto-von-Guericke University, 39106 Magdeburg, Germany

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F. Bertram,

Institute of Experimental Physics, Otto-von-Guericke University, 39106 Magdeburg, Germany

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J. Christen,

Institute of Experimental Physics, Otto-von-Guericke University, 39106 Magdeburg, Germany

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G. J. Beirne,

Institut für Halbleiteroptik und Funktionelle Grenzflächen, University of Stuttgart, 70569 Stuttgart, Germany

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M. Jetter,

Institut für Halbleiteroptik und Funktionelle Grenzflächen, University of Stuttgart, 70569 Stuttgart, Germany

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P. Michler,

Institut für Halbleiteroptik und Funktionelle Grenzflächen, University of Stuttgart, 70569 Stuttgart, Germany

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L. Schade,

Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

Fraunhofer IAF, 79108 Freiburg, Germany

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C. Vierheilig,

Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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U. T. Schwarz,

Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

Fraunhofer IAF, 79108 Freiburg, Germany

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A. D. Dräger,

Institut für Angewandte Physik, Technische Universität Braunschweig, 38106 Braunschweig, Germany

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A. Hangleiter,

Institut für Angewandte Physik, Technische Universität Braunschweig, 38106 Braunschweig, Germany

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F. Scholz,

Institute of Optoelectronics, Ulm University, 89069 Ulm, Germany

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First published: 26 October 2010
Citations: 53

Abstract

Selective-area epitaxy is used to form three-dimensional (3D) GaN structures providing semipolar crystal facets. On full 2-in. sapphire wafers we demonstrate the realization of excellent semipolar material quality by introducing inverse GaN pyramids. When depositing InGaN quantum wells on such a surface, the specific geometry influences thickness and composition of the films and can be nicely modeled by gas phase diffusion processes. Various investigation methods are used to confirm the drastically reduced piezoelectric polarization on the semipolar planes. Complete electrically driven light-emitting diode test structures emitting in the blue and blue/green spectral regions show reasonable output powers in the milliwatt regime. Finally, first results of the integration of the 3D structures into a conventional laser design are presented.

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