Volume 249, Issue 3 p. 600-603
Original Paper

Local internal quantum efficiency of a green light emitting InGaN/GaN quantum well

J. Danhof,

Corresponding Author

Fraunhofer Institute for Applied Solid State Physics IAF, Tullastraße 72, 79108 Freiburg, Germany

Albert-Ludwigs-Universität Freiburg, IMTEK, Georges-Köhler-Allee 106, 79110 Freiburg, Germany

Phone: +49 761 5159 282, Fax: +49 761 5159 71282Search for more papers by this author
U. T. Schwarz,

Fraunhofer Institute for Applied Solid State Physics IAF, Tullastraße 72, 79108 Freiburg, Germany

Albert-Ludwigs-Universität Freiburg, IMTEK, Georges-Köhler-Allee 106, 79110 Freiburg, Germany

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T. Meyer,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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C. Vierheilig,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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M. Peter,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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First published: 02 November 2011
Citations: 3

Abstract

Excitation density-dependent microphotoluminescence measurements were performed on a green light (515 nm) emitting InGaN/GaN multiquantum well sample of low threading dislocation density (5 × 107 cm−2). For the observed structure we find a different shape of the local internal quantum efficiency (IQE) curve at spots of different efficiency. Evaluation of the measured local IQE curves in terms of the standard model including Shockley–Read–Hall (SRH), radiative recombination, and a third order loss term (droop) leads to the conclusion that SRH nonradiative recombination varies spatially on a sub-micrometer length scale while both other terms remain constant.

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