Volume 4, Issue 7 p. 2362-2365
Contributed Article

Lateral diffusion of photogenerated carriers in InGaN/GaN heterostructures observed by PL measurements

C. Vierheilig,

Corresponding Author

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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H. Braun,

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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U. T. Schwarz,

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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W. Wegscheider,

Institute for Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany

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E. Baur,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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U. Strauß,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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V. Härle,

Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

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First published: 01 June 2007
Citations: 3

Abstract

In this paper we present a direct observation of the lateral diffusion of photogenerated carriers in InGaN/GaN quantum wells. The spatial distribution of the photoluminescence around a small exciting laser spot is analyzed by scanning in the focal plane of our confocal microscope. The results of a blue and a green emitting sample at varying excitation densities are discussed in the context of the theoretical model of the enhanced lateral diffusion. A lateral electric field which causes an additional radial drift motion was determined by analyzing the PL spectra and by solving a drift–diffusion equation for the lateral motion in the quantum well.

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