Volume 15, Issue 22
Communication

Epitaxial Growth of 6 in. Single‐Crystalline Graphene on a Cu/Ni (111) Film at 750 °C via Chemical Vapor Deposition

Xuefu Zhang

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

University of Chinese Academy of Sciences, Beijing, 100049 China

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Tianru Wu

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Qi Jiang

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

University of Chinese Academy of Sciences, Beijing, 100049 China

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Huishan Wang

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Hailong Zhu

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

University of Chinese Academy of Sciences, Beijing, 100049 China

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Zhiying Chen

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Ren Jiang

Department of Physics, East China Normal University, Shanghai, 200241 China

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Tianchao Niu

Herbert Gleiter Institute of Nanoscience, College of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094 China

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Zhuojun Li

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Youwei Zhang

State Key Laboratory of ASIC and System School of Information Science and Technology, Fudan University, Shanghai, 200433 China

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Zhijun Qiu

State Key Laboratory of ASIC and System School of Information Science and Technology, Fudan University, Shanghai, 200433 China

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Guanghui Yu

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Ang Li

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Shan Qiao

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Haomin Wang

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Qingkai Yu

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

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Xiaoming Xie

Corresponding Author

E-mail address: xmxie@mail.sim.ac.cn

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China

Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China

University of Chinese Academy of Sciences, Beijing, 100049 China

School of Physical Science and Technology, Shanghai Tech University, Shanghai, 200031 China

E‐mail: xmxie@mail.sim.ac.cnSearch for more papers by this author
First published: 03 April 2019
Citations: 9

Abstract

The future electronic application of graphene highly relies on the production of large‐area high‐quality single‐crystal graphene. However, the growth of single‐crystal graphene on different substrates via either single nucleation or seamless stitching is carried out at a temperature of 1000 °C or higher. The usage of this high temperature generates a variety of problems, including complexity of operation, higher contamination, metal evaporation, and wrinkles owing to the mismatch of thermal expansion coefficients between the substrate and graphene. Here, a new approach for the fabrication of ultraflat single‐crystal graphene using Cu/Ni (111)/sapphire wafers at lower temperature is reported. It is found that the temperature of epitaxial growth of graphene using Cu/Ni (111) can be reduced to 750 °C, much lower than that of earlier reports on catalytic surfaces. Devices made of graphene grown at 750 °C have a carrier mobility up to ≈9700 cm2 V−1 s−1 at room temperature. This work shines light on a way toward a much lower temperature growth of high‐quality graphene in single crystallinity, which could benefit future electronic applications.

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