Epitaxial Growth of 6 in. Single‐Crystalline Graphene on a Cu/Ni (111) Film at 750 °C via Chemical Vapor Deposition
https://orcid.org/0000-0001-8863-7177
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorDepartment of Physics, East China Normal University, Shanghai, 200241 China
Search for more papers by this authorHerbert Gleiter Institute of Nanoscience, College of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of ASIC and System School of Information Science and Technology, Fudan University, Shanghai, 200433 China
Search for more papers by this authorState Key Laboratory of ASIC and System School of Information Science and Technology, Fudan University, Shanghai, 200433 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorCorresponding Author
E-mail address: xmxie@mail.sim.ac.cn
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
School of Physical Science and Technology, Shanghai Tech University, Shanghai, 200031 China
E‐mail: xmxie@mail.sim.ac.cnSearch for more papers by this authorhttps://orcid.org/0000-0001-8863-7177
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorDepartment of Physics, East China Normal University, Shanghai, 200241 China
Search for more papers by this authorHerbert Gleiter Institute of Nanoscience, College of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of ASIC and System School of Information Science and Technology, Fudan University, Shanghai, 200433 China
Search for more papers by this authorState Key Laboratory of ASIC and System School of Information Science and Technology, Fudan University, Shanghai, 200433 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorState Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
Search for more papers by this authorCorresponding Author
E-mail address: xmxie@mail.sim.ac.cn
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050 China
Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai, 200050 China
University of Chinese Academy of Sciences, Beijing, 100049 China
School of Physical Science and Technology, Shanghai Tech University, Shanghai, 200031 China
E‐mail: xmxie@mail.sim.ac.cnSearch for more papers by this authorAbstract
The future electronic application of graphene highly relies on the production of large‐area high‐quality single‐crystal graphene. However, the growth of single‐crystal graphene on different substrates via either single nucleation or seamless stitching is carried out at a temperature of 1000 °C or higher. The usage of this high temperature generates a variety of problems, including complexity of operation, higher contamination, metal evaporation, and wrinkles owing to the mismatch of thermal expansion coefficients between the substrate and graphene. Here, a new approach for the fabrication of ultraflat single‐crystal graphene using Cu/Ni (111)/sapphire wafers at lower temperature is reported. It is found that the temperature of epitaxial growth of graphene using Cu/Ni (111) can be reduced to 750 °C, much lower than that of earlier reports on catalytic surfaces. Devices made of graphene grown at 750 °C have a carrier mobility up to ≈9700 cm2 V−1 s−1 at room temperature. This work shines light on a way toward a much lower temperature growth of high‐quality graphene in single crystallinity, which could benefit future electronic applications.
Supporting Information
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